Microwave field distribution measurement with optical scanning dielectric modulated scatterer

2021 Fiscal Year Final Research Report

• Project/Area Number: 19K04417
• Research Category: Grant-in-Aid for Scientific Research (C)
• Allocation Type: Multi-year Fund
• Section: 一般
• Review Section: Basic Section 21030:Measurement engineering-related
• Research Institution: Akita Industrial Technology Center
• Principal Investigator: KUROSAWA Takahiro 秋田県産業技術センター, 先端機能素子開発部, 上席研究員 (60370243)
• Project Period (FY): 2019-04-01 – 2022-03-31
• Keywords: 電界計測 / 変調散乱 / 光変調 / 光走査 / 半導体 / 高周波 / 電磁環境両立性

Outline of Final Research Achievements

Optical scanning technique is introduced to the microwave electric field measurement system based on the modulated scattering technique with optically modulated semiconductor scatterer. On near field measurements, distribution of the in-plane component on the microstrip line could be measured and the sensitivity of the feeding power was -47 dBm at the frequency of 10 GHz. The sensitivity and invasiveness were calculated from the modulation amplitude of forward scattering field with resistivity modulation of the disk scatterer and calculated from total cross section of it, respectively. Increasing the resistivity modulation amplitude and decrease the thickness of the scatterer is effective for increasing the sensitivity. Measurement of the field distribution on the commercial ethernet switching hub was demonstrated and field emission was come from the LSI chip on the circuit board.

Free Research Field

電気電子工学

Academic Significance and Societal Importance of the Research Achievements

電子機器からの不要電磁波ノイズの低減やアンテナを開発する際に重要な情報となる，電磁波源周辺の電磁界分布を高感度で低擾乱に計測する手法として提案されている完全非金属製の高周波電界センサに光走査方式を導入して，被測定物やセンサ本体を移動させることなく分布測定可能な技術を開発した．これにより高周波分布計測の高速化を達成でき，アンテナ開発や電磁波ノイズによる障害の解決に利用可能な新たな手法を提案できた．