Investigation of Mechanical Manipulation of Atoms and Molecules on Insulator Surfaces with Extreme Field Atomic Force Microscopy

2012 Fiscal Year Final Research Report

• Project/Area Number: 20221004
• Research Category: Grant-in-Aid for Scientific Research (S)
• Allocation Type: Single-year Grants
• Research Field: Nanostructural science
• Research Institution: Osaka University
• Principal Investigator: SUGAWARA Yasuhiro 大阪大学, 工学研究科, 教授 (40206404)
• Project Period (FY): 2008 – 2012
• Keywords: 複合極限場 / 原子間力顕微鏡 / 絶縁体表面 / 原子分子操作 / ナノ構造体

Research Abstract

Stable and reproducible mechanical manipulation of atoms and molecules on insulator surfaces has not been realized. In the present study, by using extreme field noncontact atomic force microscopy, we investigated the control conditions and the mechanism for performing the mechanism manipulation ofatoms on insulator surfaces. We also investigated the novel physical properties of nanostructures fabricated by the atom manipulation.

Research Products

• [Journal Article] The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes (2013)
  • Author(s): Z. Ma, L. Kou, Y. Naitoh, Y. J. Li and Y. Sugawara
  • Journal Title: Nanotechnol Volume: 24 Pages: 225701(1-8)
  • DOI: DOI:10.1088/0957-4484/24/22/225701.
  • Peer Reviewed
• [Journal Article] Complex Design of Dissipation Signals in Non-Contact Atomic Force Microscopy (2012)
  • Author(s): J. Bamidele, Y. J. Li, S. Jarvis, Y. Naitoh, Y. Sugawara, and L. Kantorovich
  • Journal Title: Phys. Chem. Chem. Phys. Volume: 14 Pages: 16250-16257
  • DOI: DOI:10.1039/c2cp43121
  • Peer Reviewed
• [Journal Article] Quantification of atomic-scale elasticity on Ge(001)-c(4×2) surfaces via noncontact atomic force microscopy with a tungsten-coated ti (2012)
  • Author(s): Y. Naitoh, T. Kamijo, Y. J. Li and Y. Sugawara
  • Journal Title: Phys. Rev. Lett. Volume: 109 Pages: 215501(1-5)
  • DOI: DOI:10.1103/PhysRevLett.109.215501.
  • Peer Reviewed
• [Journal Article] Chemical tip fingerprinting in scanning probe microscopy of an oxidized Cu(110) surface (2012)
  • Author(s): J. Bamidele, Y. Kinoshita, R. Turansky, S. H. Lee, Y. N a ito h , Y. J . L I, Y. S u g a w a r a , I . S tic h , a n d L. Kantorovich
  • Journal Title: Phys. Rev. B Volume: 86 Pages: 155422(1-8)
  • DOI: DOI:10.1103/PhysRevB.86.155422.
  • Peer Reviewed
• [Journal Article] High potential sensitivity in heterodyne amplitude modulation Kelvin probe force microscopy (2012)
  • Author(s): Y. Sugawara, L. Kou, Z. Ma, T. Kamijo, Y. Naitoh, and Y. J. Li
  • Journal Title: Appl. Phys. Lett Volume: 100 Pages: 223104(1-4)
  • DOI: DOI:10.1063/1.4723697.
  • Peer Reviewed
• [Journal Article] Force Mapping on NaCl(100)/Cu(111) Surface by Atomic Force Microscopy at 78 K (2012)
  • Author(s): Y. J. Li, K. Tenjin, Y. Kinoshita, Z. Ma, L. Kou, Y. Naitoh, M. Kageshima and Y. Sugawara
  • Journal Title: Jpn. J. Appl. Phys. Volume: 51 Pages: 035201(1-5)
  • DOI: DOI:10.1143/JJAP.51.035201
  • Peer Reviewed
• [Journal Article] Fabrication of Sharp Tungsten-coated Tip for Atomic Force Microscopy by Ion-beam Sputter depositio (2011)
  • Author(s): Y. Kinoshita, Y. Naitoh, Y. J. Li, and Y. Sugawara
  • Journal Title: Rev. Sci. Instrum Volume: 82 Pages: 113707(1-5)
  • DOI: DOI:10.1143/JJAP.51.035201
  • Peer Reviewed
• [Journal Article] Switching surface polarization of atomic force microscopy probe utilizing photoisomerization of photochromic molecules (2011)
  • Author(s): Y. Aburaya, H. Nomura, M. Kageshima, Y. Naitoh, Y. J. Li and Y. Sugawara
  • Journal Title: J. Appl. Phys Volume: 109 Pages: 064308(1-8)
  • DOI: DOI:10.1063/1.3552926
  • Peer Reviewed
• [Journal Article] Simultaneous observation of surface topography and elasticity at atomic scale by multifrequency frequency modulation atomic force microscopy (2010)
  • Author(s): Y. Naitoh, Z. Ma, Y. J. Li, M. Kageshima and Y. Sugawara
  • Journal Title: J. Vac. Sci. Technol. B Volume: 28 Pages: 1210-1214
  • DOI: DOI:10.1116/1.3503611.
  • Peer Reviewed
• [Journal Article] High force sensitivity in Q-controlled phase-modulation atomic force microscopy (2010)
  • Author(s): N. Kobayashi, Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara
  • Journal Title: Appl. Phys. Lett Volume: 97 Pages: 011906(1-3)
  • DOI: DOI:10.1063/1.3457431
  • Peer Reviewed
• [Journal Article] Multifrequency High-Speed Phase- Modulation Atomic Force Microscopy in Liquids (2010)
  • Author(s): Y. J. Li, K. Takahashi, N. Kobayashi, Y. Naitoh, M. Kageshima, and Y. Sugawara
  • Journal Title: Ultramicroscopy Volume: 110 Pages: 582-585
  • DOI: DOI:10.1016/j.ultramic.2010.02.014
  • Peer Reviewed
• [Journal Article] Step Response Measurement of AFM Cantilever for Analysis of Frequency-Resolved Viscoelasticity (2010)
  • Author(s): T. Ogawa, S. Kurachi, M. Kageshima, Y. Naitoh, Y. J. Li and Y. Sugawara
  • Journal Title: Ultramicroscopy Volume: 110 Pages: 612-617
  • DOI: DOI:10.1016/j.ultramic.2010.02.020
  • Peer Reviewed
• [Journal Article] Effect of Surface Stress around the SAStep of Si(001) on the Dimer Structure Induced by Noncontact Atomic Force Microscopy at 5 K (2010)
  • Author(s): Y. Naitoh, Y. J. Li, H. Nomura, M. Kageshima and Y. Sugawara
  • Journal Title: J. Phys. Soc. Jpn Volume: 79 Pages: 013601 (1-4)
  • DOI: DOI:10.1143/JPSJ.79.013601
  • Peer Reviewed
• [Journal Article] The influence of Si cantilever tip with/without tungsten coating on NC-AFM imaging of Ge(001) surface (2009)
  • Author(s): Y. Naitoh, Y. Kinoshita, Y. J. Li, M. Kageshima and Y. Sugawara
  • Journal Title: Nanotechnology Volume: 20 Pages: 264011 (1-7)
  • DOI: DOI:10.1088/0957-4484/20/26/264011
  • Peer Reviewed
• [Journal Article] Development of atomic force microscope with wide-band magnetic excitation for study of soft matter dynamics (2009)
  • Author(s): M. Kageshima, T. Chikamoto, T. Ogawa, Y. Hirata, T. Inoue, Y. Naitoh, Y. J. Li, and Y. Sugawara
  • Journal Title: Rev. Sci. Inst Volume: 80 Pages: 023705(1-7)
  • DOI: DOI:10.1063/1.3080557
  • Peer Reviewed
• [Journal Article] Atomic-Scale Imaging of B/Si(111) √3 x√3 Surface by Noncontact Atomic Force Microscopy (2008)
  • Author(s): M. Kinoshita, Y. Naitoh, Y. J. Li, M. Kageshima and Y. Sugawara
  • Journal Title: Jpn. J. Appl. Phys Volume: 47 Pages: 8218-8220
  • DOI: DOI:10.1143/JJAP.47.8218.
  • Peer Reviewed
• [Journal Article] High-speed Phase-Modulation Atomic Force Microscopy in Constant-Amplitude Mode Capable of Simultaneous Measurement of Topography and Energy Dissipation (2008)
  • Author(s): Y. J. Li, N. Kobayashi, H. Nomura, Y. Naitoh, M. Kageshima and Y. Sugawara
  • Journal Title: Jpn. J. Appl. Phys Volume: 47 Pages: 6121-6124
  • DOI: DOI:10.1143/JJAP.47.6121
  • Peer Reviewed
• [Journal Article] Study of Oxidized Cu(110) Surface Using Noncontact Atomic Force Microscopy (2008)
  • Author(s): S. Kishimoto, M. Kageshima Y. J. Li, Y. Naitoh, and Y. Sugawara
  • Journal Title: Surface Science Volume: 602 Pages: 2175-2182
  • DOI: DOI:10.1016/j.susc.2008.04.030
  • Peer Reviewed
• [Journal Article] Phase modulation atomic force microscopy in constant excitation mode capable of simultaneous imaging of topography and energy dissipation (2008)
  • Author(s): Y. J. Li, N. Kobayashi, Y. Naitoh, M. Kageshima and Y. Sugawara
  • Journal Title: Appl. Phys. Lett. Volume: 92 Pages: 121903(1-3)
  • DOI: DOI:10.1063/1.2901151
  • Peer Reviewed
• [Journal Article] Theoretical investigation on force sensitivity in Q-controlled phase modulation atomic force microscopy in constant-amplitude mode (2008)
  • Author(s): N. Kobayashi, Y. J. Li, Y. Naitoh, M. Kageshima and Y. Sugawara
  • Journal Title: J. Appl. Phys. Volume: 103, 054305 Pages: 1-4
  • DOI: DOI:10.1063/1.2890380.
  • Peer Reviewed
• [Journal Article] Viscoelasticity and Dynamics of Single Biopolymer Chain Measured with Magnetically Modulated Atomic Force Microscopy (2008)
  • Author(s): M. Kageshima, Y. Nishihara, Y. Hirata, T. Inoue, Y. Naitoh and Y. Sugawara
  • Journal Title: AIP Conference Proceedings Volume: 982 Pages: 504-507
  • Peer Reviewed
• [Journal Article] Development of Noncontact Atomic force Microscopy Operating at Low Temperatures (2008)
  • Author(s): Y. Sugawara, Y. Naitoh, M. Kageshima and Y. J. Li
  • Journal Title: J. Vac. Soc. Jpn Volume: 51 Pages: 789-795
  • Peer Reviewed
• [Presentation] Atom Manipulation and Force Spectroscopy on Cu(110)-O Surface with Low-Temperature AFM (2012)
  • Author(s): Y. Sugawara and Y. J. Li
  • Organizer: Li, Annual Meeting of The Chinese Vacuum Society (CVS-2012)
  • Place of Presentation: Lanzhou, China
  • Year and Date: 20120921-24
• [Presentation] Investigation of TiO2Surface by Using Atomic Force Microscopy/Spectroscopy (2012)
  • Author(s): Y. Sugawara
  • Organizer: The 3rd Annual World Congress of Catalytic Asymmetric Synthesis (WCCAS-2012)
  • Place of Presentation: Beijing, China.
  • Year and Date: 20120512-14
• [Presentation] 走査型プローブ顕微鏡(SPM (2012)
  • Author(s): 菅原康弘
  • Organizer: 第54回表面科学基礎講座 表面・界面分析の基礎と応用
  • Place of Presentation: 大阪大学・コンベンションセンター
  • Year and Date: 2012-10-16
• [Presentation] 学・コンベンションセンター 2)"原子間力顕微鏡による原子操作と力学分光 (2012)
  • Author(s): 菅原康
  • Organizer: 日本表面科学会 平成 23年度関西支部セミナー
  • Place of Presentation: 京都大学宇治キャンパス
  • Year and Date: 2012-03-07
• [Presentation] フォース顕微鏡における最先端計測技術 (2011)
  • Author(s): 菅原康弘
  • Organizer: 日本顕微鏡学会走査型プローブ顕微鏡分科会平成 23 年度オープン研究会
  • Place of Presentation: 物質・材料研究機構
  • Year and Date: 2011-12-02
• [Presentation] 走査型プローブ顕微鏡(SPM) (2011)
  • Author(s): 菅原康弘
  • Organizer: 第52回表面科学基礎講座 表面・界面分析の基礎と応用
  • Place of Presentation: 大阪大学・コンベンションセンター
  • Year and Date: 2011-09-14
• [Presentation] Atomic Manipulation and Force Spectroscopy by Atomic Force Microscopy (2011)
  • Author(s): Y. Sugawara
  • Organizer: 1st International Conference on Small Science
  • Place of Presentation: Sydney, Australia
  • Year and Date: 2011-08-15
• [Presentation] 菅原康弘 (2011)
  • Author(s): SPM を用いた元素分析の可能性について
  • Organizer: 第1回「顕微表面分析」セミナー
  • Place of Presentation: 島津製作所関西支社マルチホール
  • Year and Date: 2011-07-29
• [Presentation] Atom Manipulation and Force Spectroscopy on Cu(110)-O Surface with Low Temperature AFM (2010)
  • Author(s): Y. Sugawara
  • Organizer: The 15th International Conference on Solid Films and Surfaces (ICSFS-15)
  • Place of Presentation: Beijing, China.
  • Year and Date: 20101005-10
• [Presentation] Atom Manipulation and Force Spectroscopy on Cu(110)-O Surface with Low Temperature Noncontact AFM (2010)
  • Author(s): Y. Sugawara
  • Organizer: The 4th AEARU Advanced Materials Science Workshop on Artificial and Self-Organized Nanostructure Sciences and Nano-Technologies for the Sustainable World
  • Place of Presentation: Tsukuba, Japan.
  • Year and Date: 20100829-0903
• [Presentation] Atom manipulation and force spectroscopy on Cu(110)-O surface with low temperature noncontact AFM (2010)
  • Author(s): Y. Sugawara
  • Organizer: The 18th International Vacuum Congress (IVC-18)
  • Place of Presentation: Beijing, China
  • Year and Date: 20100823-27
• [Presentation] Atom manipulation and force spectroscopy on Cu(110)-O surface with low temperature noncontact AFM (2010)
  • Author(s): Y. Sugawara
  • Organizer: The 6th Nanoscience and Nanotechnology Conference (NANOTR-VI)
  • Place of Presentation: Izmir, Turkey.
  • Year and Date: 20100615-18
• [Presentation] 走査型プローブ顕微鏡(SPM) (2010)
  • Author(s): 菅原康弘
  • Organizer: 第50回表面科学基礎講座 表面・界面分析の基礎と応用
  • Place of Presentation: 大阪大学・コンベンションセンター
  • Year and Date: 2010-10-20
• [Presentation] 原子間力顕微鏡の現状と展望 (2010)
  • Author(s): 菅原康弘
  • Organizer: 第2回けいはんな物質科学フォーラム
  • Place of Presentation: 奈良先端科学技術大学院大学
  • Year and Date: 2010-05-15
• [Presentation] 力学的な原子分子操作と分光計測 (2010)
  • Author(s): 菅原康弘
  • Organizer: 第4回ナノ理工学情報交流会
  • Place of Presentation: 大阪大学
  • Year and Date: 2010-01-28
• [Presentation] "Atom Manipulation on Cu(110)-O Surface with Low Temperature Noncontact AFM (2009)
  • Author(s): Y. Sugawara
  • Organizer: The International Conference on Nanoscience and Technology, China 2009 (ChinaNANO 2009)
  • Place of Presentation: Beijing, China
  • Year and Date: 20090901-03
• [Presentation] 原子間力顕微鏡の高感度化・高速化・多機能化 (2009)
  • Author(s): 菅原康弘
  • Organizer: 2009年秋季第70回応用物理学会学術講演会 シンポジウム「非接触原子間力顕微鏡で拓くナノテク最前線」
  • Place of Presentation: 富山大学
  • Year and Date: 2009-09-08
• [Presentation] 液中AFMの基礎と応用 (2009)
  • Author(s): 菅原康弘
  • Organizer: 有機バイオSPM研究会(応用物理学会・有機分子バイオエレクトロニクス分科会主催)
  • Place of Presentation: 幕張メッセ国際展示場
  • Year and Date: 2009-09-04
• [Presentation] Phase Modulation Atomic Force Microscopy in Constant Amplitude Mode (2009)
  • Author(s): Y. Sugawara
  • Organizer: The XI International Scanning Probe Microscopy Conference 2009
  • Place of Presentation: Madrid, Spain.
  • Year and Date: 2009-06-18
• [Presentation] SPMの現状概観とロードマップ点検(AFM) (2008)
  • Author(s): 菅原康弘
  • Organizer: 日本学術振興会振167委員会 第55回研究会
  • Place of Presentation: 桐生地域地場産業振興センター
  • Year and Date: 2008-07-23
• [Presentation] 非接触原子間力顕微鏡による金属酸化物表面での原子種識別と原子操作 (2008)
  • Author(s): 菅原康弘
  • Organizer: 第27回マイクロ化学談話会ポジウム
  • Place of Presentation: 京都大学
  • Year and Date: 2008-06-20
• [Book] 新アクチュエータ開発の最前線 プローブ顕微鏡用高速アクチュエータの開発 (2011)
  • Author(s): 菅原康弘、李艶君、内藤賀公
  • Total Pages: 131-135
  • Publisher: エヌ・ティー・エヌ
• [Book] Development of High-Speed Actuator for Scanning Probe Microscopy (2010)
  • Author(s): Y. Sugawara, Y. J. Li, Y. Naitoh and M. Kageshima
  • Total Pages: 45-54
  • Publisher: Springer, Next Generation Actuators Leading Breakthroughs
• [Book] 走査プローブ顕微鏡を用いたナノイメージング (2008)
  • Author(s): 菅原康弘
  • Total Pages: 60-70
  • Publisher: ナノイメージング(エヌ・ティー・エヌ)
• [Remarks]
  • URL: http://nanophysics.ap.eng.osaka-u.ac.jp/