2010 Fiscal Year Final Research Report
Development of bio-microwave atomic force microscopy and noninvasive measurement of cell activity
Project/Area Number |
20246028
|
Research Category |
Grant-in-Aid for Scientific Research (A)
|
Allocation Type | Single-year Grants |
Section | 一般 |
Research Field |
Materials/Mechanics of materials
|
Research Institution | Nagoya University |
Principal Investigator |
JU Yang 名古屋大学, 工学研究科, 教授 (60312609)
|
Co-Investigator(Kenkyū-buntansha) |
MURAOKA Mikio 秋田大学, 工学資源学研究科, 教授 (50190872)
KIMURA Hidehiko 名古屋大学, 工学研究科, 講師 (60345923)
HOSOI Atsushi 名古屋大学, 工学研究科, 助教 (60424800)
|
Project Period (FY) |
2008 – 2010
|
Keywords | マイクロ波 / 原子間力顕微鏡 / AFMプローブ / 電気的特性 / 細胞計測 |
Research Abstract |
A novel microscopy which is capable of investigating surface topography and electrical property of cells simultaneously on a sub-nanometer scale was developed. The microwave atomic force microscopy(M-AFM) is a combination of the principles of the scanning probe microscope and the microwave-measurement technique. The waveguide structure of the M-AFM probe allows microwave signals to propagate through the probe and emit from the tip of it. Based on the theoretical analysis and the measured amplitude and phase information of microwave signals, M-AFM can implement the quantitative characterization of the local conductivity and permittivity of cells on the sub-nanometer scale.
|
Research Products
(41 results)