2011 Fiscal Year Final Research Report
Atomic force spectroscopy of chemical bonding process with bias voltage tuning between a tip and a sample
| Project/Area Number |
20310058
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| Research Category |
Grant-in-Aid for Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Nanomaterials/Nanobioscience
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| Research Institution | Kanazawa University |
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Principal Investigator |
ARAI Toyoko 金沢大学, 数物科学系, 教授 (20250235)
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| Co-Investigator(Renkei-kenkyūsha) |
TOMITORI Masahiko 北陸先端科学技術大学院大学, マテリアルサイエンス研究科, 教授 (10188790)
MURATA Hideyuki 北陸先端科学技術大学院大学, マテリアルサイエンス研究科, 教授 (10345663)
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| Project Period (FY) |
2008 – 2011
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| Keywords | 走査プローブ顕微鏡 / 化学結合 / 結合形成過程 / ナノ表面・界面 / 顕微分光 |
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| Research Abstract |
The purpose of this study was to reveal the formation process of bonding state between an atom of a sample surface and an atom at the tip apex of atomic force microscopy(AFM) using our developing bias-voltage non-contact atomic force microscopy/spectroscopy(bias nc-AFM/S). Towards this purpose we developed a force sensor with a high sensitivity, improved our electronic control system for the bias nc-AFM/S, and performed simultaneous measurements with high sensitivities of force, electric current and energy dissipation between the sample and the nc-AFM tip. Through this study we concluded that the covalent bond formation between a Si atom and a Si atom strongly depends on their local electronic density of states(LDOS).
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[Journal Article] Adsorption State of 4, 4 Diamino-p-terphenyl through an Amino Group Bound to Si(111)-7x7 Surface Examined by X-ray Photoelectron Spectroscopy and Scanning Tunneling Microscopy2010
Author(s)
Nishimura, T., Itabashi, A., Sasahara, A., Murata, H., Arai, T., Tomitori, M.
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Journal Title
J. Phys. Chem. C
Volume: 114
Pages: 11109-11114
DOI
Peer Reviewed
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