2010 Fiscal Year Final Research Report
Z-polarization Raman spectroscopy and MAIR spectroscopic study of coarse surfaces
| Project/Area Number |
20350035
|
|---|
| Research Category |
Grant-in-Aid for Scientific Research (B)
|
| Allocation Type | Single-year Grants |
|---|
| Section | 一般 |
|---|
| Research Field |
Analytical chemistry
|
|---|
| Research Institution | Tokyo Institute of Technology |
|---|
Principal Investigator |
HASEGAWA Takeshi Tokyo Institute of Technology, 大学院・理工学研究科, 連携准教授 (30258123)
|
|---|
| Project Period (FY) |
2008 – 2010
|
| Keywords | MAIR分光法 / Z偏光 / ラマン分光法 / 非平滑界面 / 有機薄膜 |
|---|
| Research Abstract |
A technique of molecular orientation analysis in thin films having a coarse surface using Raman spectroscopy has been developed, so that the results would be discussed with those obtained by MAIR spectroscopy. Visible LASER light can be sharply focused on a sample, which is impervious to the surface roughness of the sample. In addition, the C=C and N≡N stretching vibration bands that are not observed by IR spectroscopy can readily be analyzed by Raman spectroscopy, which is a great benefit to reveal isomeric and anisotropic structures. In the present study, to analyze anisotropic structure quantitatively, highly accurate polarization Raman spectrometer has been built, which corresponds to measurements using the Z-polarization. An exact theory considering anisotropic LASER irradiation and light scattering processes has also been developed for drawing quantitative molecular information from the polarized Raman spectra.
|
