2010 Fiscal Year Final Research Report
Understanding and design of ceramic interfaces by advanced electron microscopy
Project/Area Number |
20686042
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Research Category |
Grant-in-Aid for Young Scientists (A)
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Allocation Type | Single-year Grants |
Research Field |
Physical properties of metals
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Research Institution | The University of Tokyo |
Principal Investigator |
SHIBATA Naoya The University of Tokyo, 大学院・工学系研究科, 助教 (10376501)
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Project Period (FY) |
2008 – 2010
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Keywords | セラミックス / 界面 / STEM / 原子・電子構造 |
Research Abstract |
In this study, we used advanced electron microscopy technique to understand the origin of unique interface properties in ceramic materials. We found dopant segregation can be used to control ceramic interfaces from the atomic-scale. In addition, we develop a method to directly characterize atomic-scale structures of buried interfaces by scanning transmission electron microscopy.
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