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2009 Fiscal Year Annual Research Report

原子間力顕微鏡によるTiO2(110)表面の触媒反応場の制御と評価

Research Project

Project/Area Number 20760024
Research InstitutionOsaka University

Principal Investigator

杉本 宜昭  Osaka University, 工学研究科, 特任講師 (00432518)

Keywords走査型プローブ顕微鏡 / 二酸化チタン / 原子間力顕微鏡 / 原子操作
Research Abstract

・ 金属コートされたSiカンチレバーを用いて、AFMとSTMの同時測定を室温で行う技術を開発した。表面をAFMとSTM同時に高さ一定モードでイメージングし、両者が異なる物理量を測定していることを実証した。そして、原子上に探針を固定し、相互作用力とトンネル電流の距離依存性を測定し、また、同じ探針で、走査型トンネル分光測定を行い、局所状態密度を測定した。本技術により、同一探針を用いて、表面の同一原子上の相互作用力、トンネル電流、局所状態密度を測定できることを初めて示した。
・ 相互作用力とは独立の物理量である局所表面電位をAFMをベースとしたケルビンプローブ力顕微鏡法(KPFM)により原子分解能で測定した。KPFMと周波数シフトのバイアス依存性を測定することにより、探針-試料間距離が小さくなるにつれて、局所表面電位が減少することを見出した。そして、表面電位像が得られるメカニズムとして、原子の電気双極子モーメントが探針で誘起されるという現象に基づいた新しいモデルを提唱した。
・ 二酸化チタン表面で原子分解能フォーススペクトロスコピーを行った。Ti原子上、O原子上で共に引力の化学結合力が検出され、これまでのAFMの画像化機構の問題点を明らかにした。さらに、水酸基が画像化されないパターンのAFM画像が得られることを示し、画像化のモデルを示した。
・ 二酸化チタン表面上にK原子を吸着し、K原子の吸着サイトを明らかにした。また、K原子間に斥力が働いている様子を観察した。さらに、AFMの探針を用いてK原子を操作できることを示した。

  • Research Products

    (29 results)

All 2010 2009 Other

All Journal Article (3 results) (of which Peer Reviewed: 3 results) Presentation (24 results) Book (1 results) Remarks (1 results)

  • [Journal Article] New insights on atomic-resolution frequency-modulated Kelvin-probe force-microscopy imaging of semiconductors2009

    • Author(s)
      Sascha Sadewasser
    • Journal Title

      Physical Review Letters Vol.103

      Pages: 266103-1-266103-4

    • Peer Reviewed
  • [Journal Article] Simultaneous measurement of force and tunneling current at room temperature2009

    • Author(s)
      Daisuke Sawada
    • Journal Title

      Applied Physics Letters Vol.94

      Pages: 173117-1-173117-3

    • Peer Reviewed
  • [Journal Article] Simultaneous Atomic Imaging of Atomic Force Microscopy and Scanning Tunneling Microscopy Using Metal Coated Cantilevers2009

    • Author(s)
      Daisuke Sawada
    • Journal Title

      Materials Transactions Vol.50

      Pages: 940-942

    • Peer Reviewed
  • [Presentation] Site-specific force spectroscopy on TiO_2 (110) surface at low-temperature2010

    • Author(s)
      Abdi Pratama
    • Organizer
      2nd Global COE International Symposium-Electronic Devices Innovation-, Workshop on Applications of Atomic Force Microscopy
    • Place of Presentation
      Osaka, Japan (Hotel Hankyu Expo-park, Suita)
    • Year and Date
      2010-01-14
  • [Presentation] Force and Tunneling Current Measurements on the Semiconductor Surface2010

    • Author(s)
      Daisuke Sawada
    • Organizer
      2nd Global COE International Symposium-Electronic Devices Innovation-, Workshop on Applications of Atomic Force Microscopy
    • Place of Presentation
      Osaka, Japan (Hotel Hankyu Expo-park, Suita)
    • Year and Date
      2010-01-14
  • [Presentation] NC-AFM/STM measurements on the Si(111)-(7×7) surface and the Ge(111)-c(2×8) surface2009

    • Author(s)
      Ryousuke Takimoto
    • Organizer
      17th International Colloquium on Scanning Probe Microscopy (ICSPM17)
    • Place of Presentation
      Shizuoka, Japan (Atagawa)
    • Year and Date
      2009-12-10
  • [Presentation] Studying different type of image contrast on TiO2 (110) surface by using nc-AFM measurement2009

    • Author(s)
      Hideki Tanaka
    • Organizer
      17th International Colloquium on Scanning Probe Microscopy (ICSPM17)
    • Place of Presentation
      Shizuoka, Japan (Atagawa)
    • Year and Date
      2009-12-10
  • [Presentation] Toward Atom-by-Atom Assembly of Composite Nanostructures Based on AFM2009

    • Author(s)
      Seizo Morita
    • Organizer
      7th International Symposium on Atomic Level Characterizations for New Materials and Devices
    • Place of Presentation
      Hawaii, USA (Maui)
    • Year and Date
      2009-12-09
  • [Presentation] Understanding the Mechanism of Different Contrast Modes on TiO_2 (110)-(1×1) Surface using nc-AFM at Low Temperature-a Force Spectroscopic Measurement2009

    • Author(s)
      Abdi Pratama
    • Organizer
      2009 MRS FALL MEETING
    • Place of Presentation
      Boston, USA (The Hynes Convention Center)
    • Year and Date
      2009-12-02
  • [Presentation] AFM/STM Simultaneous Measurement on TiO_2 (110) Surface2009

    • Author(s)
      Hideki Tanaka
    • Organizer
      2009 MRS FALL MEETING
    • Place of Presentation
      Boston, USA (The Hynes Convention Center)
    • Year and Date
      2009-12-01
  • [Presentation] Force and Tunneling Current Measurements on the Semiconductor Surface2009

    • Author(s)
      Ken-ichi Morita
    • Organizer
      2009 MRS FALL MEETING
    • Place of Presentation
      Boston, USA (The Hynes Convention Center)
    • Year and Date
      2009-12-01
  • [Presentation] Simultaneous Measurement of Force and Tunneling Current with Atomic Force Microscopy2009

    • Author(s)
      Masayuki Abe
    • Organizer
      2009 MRS FALL MEETING
    • Place of Presentation
      Boston, USA (The Hynes Convention Center)
    • Year and Date
      2009-11-30
  • [Presentation] NC-AFM/STM measurements on the Si(111)-(7×7) surface and the Ge(111)-c(2×8) surface2009

    • Author(s)
      Ryousuke Takimoto
    • Organizer
      The 4th International Symposium on Atomic Technologies (ISAT-4)
    • Place of Presentation
      Hyogo, Japan (Kobe)
    • Year and Date
      2009-11-19
  • [Presentation] Atom-by-Atom Nanostructuring of Composite Nanomaterials Based on AFM2009

    • Author(s)
      Seizo Morita
    • Organizer
      The 4th International Symposium on Atomic Technologies (ISAT-4)
    • Place of Presentation
      Hyogo, Japan (Kobe)
    • Year and Date
      2009-11-18
  • [Presentation] AFMを用いた化学結合力測定に基づいた原子識別2009

    • Author(s)
      杉本宜昭
    • Organizer
      平成21年度ナノ分光部会第1回シンポジウム理化学研究所
    • Place of Presentation
      埼玉県(和光市)
    • Year and Date
      2009-11-06
  • [Presentation] 超高真空非接触原子間力顕微鏡による原子レベル物性評価2009

    • Author(s)
      阿部真之
    • Organizer
      (社) 日本表面科学会 第29回表面科学学術講演会「急速に進歩する非接触原子間力顕微鏡」
    • Place of Presentation
      タワーホール船堀(東京都江戸川区)
    • Year and Date
      2009-10-29
  • [Presentation] 超高真空原子間力顕微鏡を用いた原子分子技術2009

    • Author(s)
      杉本宜昭
    • Organizer
      平成21年度第2回関西電気化学研究会
    • Place of Presentation
      大阪大学 (吹田市)
    • Year and Date
      2009-09-26
  • [Presentation] Probing the interaction of potassium (K) atoms on TiO_2(110) surface by using non-contact atomic force microscopy (nc-AFM) at low temperature2009

    • Author(s)
      Abdi Pratama
    • Organizer
      5th Handai Nanoscience and Nanotechnology International Symposium
    • Place of Presentation
      Osaka University, Osaka, Japan (Suita)
    • Year and Date
      2009-09-02
  • [Presentation] Constant height AFM/STM imaging on TiO_2(110) surface2009

    • Author(s)
      Hideki Tanaka
    • Organizer
      5th Handai Nanoscience and Nanotechnology International Symposium
    • Place of Presentation
      Osaka University, Osaka, Japan (Suita)
    • Year and Date
      2009-09-02
  • [Presentation] NC-AFM/STM Measurements on the Si(111)-(7×7) Surface2009

    • Author(s)
      Daisuke Sawada
    • Organizer
      5th Handai Nanoscience and Nanotechnology International Symposium
    • Place of Presentation
      Osaka University, Osaka, Japan (Suita)
    • Year and Date
      2009-09-02
  • [Presentation] Atom Manipulation by Atomic Force Microscopy2009

    • Author(s)
      Yoshiaki Sugimoto
    • Organizer
      5th Handai Nanoscience and Nanotechnology International Symposium
    • Place of Presentation
      Osaka University, Osaka, Japan (Suita)
    • Year and Date
      2009-09-01
  • [Presentation] Site-specific force spectroscopy on TiO_2(110) surface at low-temperature2009

    • Author(s)
      Ayhan Yurtsever
    • Organizer
      12th International Conference on Noncontact Atomic Force Microscopy
    • Place of Presentation
      CT, USA (New Haven)
    • Year and Date
      2009-08-12
  • [Presentation] Simultaneous measurement of force and tunneling current2009

    • Author(s)
      Daisuke Sawada
    • Organizer
      12th International Conference on Noncontact Atomic Force Microscopy
    • Place of Presentation
      CT, USA (New Haven)
    • Year and Date
      2009-08-11
  • [Presentation] Force and Tunneling Current Measurements on the Semiconductor Surface2009

    • Author(s)
      Daisuke Sawada
    • Organizer
      12th International Conference on Noncontact Atomic Force Microscopy
    • Place of Presentation
      CT, USA (New Haven)
    • Year and Date
      2009-08-11
  • [Presentation] Toward Atom-by-Atom Assembly of Complex Nanostructures Based, on Atomic Force Microscopy2009

    • Author(s)
      Seizo Morita
    • Organizer
      Local meeting of Czech nanosociety (Institute of Physics, Academy of Sciences of the Czech Republic)
    • Place of Presentation
      Czech Republic (Prague)
    • Year and Date
      2009-07-16
  • [Presentation] Toward Atom-by-Atom Assembly of Complex Nanostructures Based on Atomic Force Microscopy2009

    • Author(s)
      Seizo Morita
    • Organizer
      Physikalisches Kolloquium-Weekly colloquia SS09, Physik. Universitat Regensburg, Germany
    • Place of Presentation
      Germany (Regensburg)
    • Year and Date
      2009-07-13
  • [Presentation] 超高真空SPMの半導体への応用2009

    • Author(s)
      杉本宜昭
    • Organizer
      第47回表面科学基礎講座
    • Place of Presentation
      東京大学(文京区)
    • Year and Date
      2009-07-08
  • [Book] Noncontact Atomic Force Microscopy Volume 2 (Series : NanoScience and Technology)2009

    • Author(s)
      Seizo Morita
    • Total Pages
      401
    • Publisher
      Springer-Verlag
  • [Remarks]

    • URL

      http://www.wakate.frc.eng.osaka-u.ac.jp/sugimoto/

URL: 

Published: 2011-06-16   Modified: 2016-04-21  

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