In-house-made AXS single crystal diffraction measurement for occupancy analysis

2020 Fiscal Year Final Research Report

• Project/Area Number: 20K20363
• Project/Area Number (Other): 18H05347 (2018-2019)
• Research Category: Grant-in-Aid for Challenging Research (Pioneering)
• Allocation Type: Multi-year Fund (2020); Single-year Grants (2018-2019)
• Review Section: Medium-sized Section 30:Applied physics and engineering and related fields
• Research Institution: Tohoku University
• Principal Investigator: Simura Rayko 東北大学, 多元物質科学研究所, 准教授 (90420009)
• Project Period (FY): 2018-06-29 – 2021-03-31
• Keywords: 異常散乱X線 / 実験室系白色X線

Outline of Final Research Achievements

TemporaryA laboratory system (LAB-AXS) was developed for measuring anomalous scattering X-ray diffraction (AXS-XRD), which is usually performed using a wavelength selectable X-ray source in synchrotron radiation, by combining low intensity white X-rays generated in a laboratory system with a high efficiency energy dispersive detector. This method enables site-selective X-ray diffraction measurements, and the AXS-XRD method is particularly useful for identifying neighboring elements in crystal structure analysis. From this point of view, new compounds were discovered by exploring the system with a combination of neighboring elements.

Free Research Field

結晶材料化学

Academic Significance and Societal Importance of the Research Achievements

本研究により従来放射光で行われてきた異常散乱X線回折測定を、実験室系で容易に行うためのシステムが実現した。放射光は測定機器がマシンタイムで分配されており、経済的・時間的制約の大きい巨大施設である。本研究でいつでもアクセスできる実験室系での測定と解析が可能となり、より頻繁で迅速な元素選択型の構造解析が可能となった。これにより、解析内容の材料作製現場へのフィードバックが効率化されるため、材料開発のスキームの改善につながる成果であると考える。