2021 Fiscal Year Annual Research Report
Simultaneous measurement of liquid film thickness and temperature by fluorescent anisotropy
| Project/Area Number |
20K22400
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| Research Institution | Tokyo University of Science |
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Principal Investigator |
Jain Puneet 東京理科大学, 工学部機械工学科, 研究員 (50886215)
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| Project Period (FY) |
2020-09-11 – 2022-03-31
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| Keywords | Fluorescence anisotropy / Liquid film thickness |
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| Outline of Annual Research Achievements |
It has been found that FA has 4 components, namely, Ivv, Ivh, Ihv, and Ihh. Amongst these, Ivv depends maximum on temperature and Ihh depends least on temperature. Using Ivv componet, we can study temperature and liquid film tickness simultaneoulsy. At first microchannles of known thickness were fabricated. These thickness act as liquid film thickness. Then fluorescence anisotropy (FA) were measured using fluorescence microscope. From FA, Ivv component was extracted. This is done using python program. It has been found that:
1. As liquid film thickness increases, Ivv components increases linearly.
2. As the liquid film temperature increaes, Ivv components increases linearly.
So in brief, we can say, Ivv=f(h,T), where h is liquid film thickness and T is liquid film temperature.
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