2021 Fiscal Year Final Research Report
Simultaneous measurement of liquid film thickness and temperature by fluorescent anisotropy
Project/Area Number |
20K22400
|
Research Category |
Grant-in-Aid for Research Activity Start-up
|
Allocation Type | Multi-year Fund |
Review Section |
0301:Mechanics of materials, production engineering, design engineering, fluid engineering, thermal engineering, mechanical dynamics, robotics, aerospace engineering, marine and maritime engineering, and related fields
|
Research Institution | Tokyo University of Science |
Principal Investigator |
Jain Puneet 東京理科大学, 工学部機械工学科, 研究員 (50886215)
|
Project Period (FY) |
2020-09-11 – 2022-03-31
|
Keywords | Fluorescence anisotropy / Liquid film thickness / Liquid film temperature / Fluorescence microscope |
Outline of Final Research Achievements |
It has been found that FA has 4 components, namely, Ivv, Ivh, Ihv, and Ihh. Amongst these, Ivv depends maximum on temperature and Ihh depends least on temperature. Using Ivv component, we can study temperature and liquid film thickness simultaneously. At first microchannels of known thickness were fabricated. These thickness act as liquid film thickness. Then fluorescence anisotropy (FA) were measured using fluorescence microscope. From FA, Ivv component was extracted. This is done using python program. It has been found that, as liquid film thickness increases, Ivv components increases linearly, as the liquid film temperature increaes, Ivv components increases linearly. So in brief, we can say, Ivv=f(h,T), where h is liquid film thickness and T is liquid film thickness.
|
Free Research Field |
Thermoelectric
|
Academic Significance and Societal Importance of the Research Achievements |
Liquid films are defined as a very thin layer of liquid flowing on a solid surface or sandwiched between two solid surfaces.
|