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2011 Fiscal Year Final Research Report

Function Control of Multi-atom Nanostructure with atom manipulation

Research Project

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Project/Area Number 21246010
Research Category

Grant-in-Aid for Scientific Research (A)

Allocation TypeSingle-year Grants
Section一般
Research Field Thin film/Surface and interfacial physical properties
Research InstitutionOsaka University

Principal Investigator

ABE Masayuki  大阪大学, 大学院・工学研究科, 准教授 (00362666)

Project Period (FY) 2009 – 2011
Keywords走査プローブ顕微鏡 / 非接触原子間力顕微鏡 / 原子操作 / ナノ構造
Research Abstract

We have established a method for controlling atom function by creating and performing measurements of the local state of multi-element nano-structure. More specifically, using a non-contact atomic force microscopy, we have succeeded in quantitative measurement of interaction forces that can be used to identify surface single atoms(force spectroscopy and force mapping). Results showed that we can expect to see the relation between the structure and the electronic local state in atomic level.

  • Research Products

    (17 results)

All 2012 2011 2010 2009

All Journal Article (10 results) (of which Peer Reviewed: 10 results) Presentation (7 results)

  • [Journal Article] Understanding image contrast formation in TiO2 with force spectroscopy2012

    • Author(s)
      A. Yurtsever, D. Fernandez-Torre, C. Gonzalez, P. Jelinek, P. Pou, Y. Sugimoto, M. Abe, Ruben Perez, S. Morita
    • Journal Title

      Physical Review B

      Volume: Vol.85 Pages: 125416-1/-9

    • DOI

      DOI:10.1103/PhysRevB.85.125416

    • Peer Reviewed
  • [Journal Article] Kelvin probe force microscopy characterization of TiO2(110)-supported Au clusters2011

    • Author(s)
      H. J. Chung, A. Yurtsever, Y. Sugimoto, M. Abe, and S. Morita
    • Journal Title

      Applied Physics Letters

      Volume: Vol.99 Pages: 123102-1/-3

    • DOI

      DOI:10.1063/1.3641418

    • Peer Reviewed
  • [Journal Article] Alkali-metal adsorption and manipulation on hydroxylated TiO2(110) surface using atomic force microscopy2011

    • Author(s)
      A. Yurtsever, Y. Sugimoto, M. Abe, K. Matsunaga, I. Tanaka, and S. Morita
    • Journal Title

      Physical Review B

      Volume: Vol.84 Pages: 085413-1/-7

    • DOI

      DOI:10.1103/PhysRevB.84.085413

    • Peer Reviewed
  • [Journal Article] Small-amplitude dynamic force microscopy using a quartz cantilever with an optical interferometer2010

    • Author(s)
      K. Morita, Y. Sugimoto, M. Abe, and S. Morita
    • Journal Title

      Nanotechnology

      Volume: Vol.21 Pages: 305704-1/-4

    • DOI

      DOI:10.1088/0957-4484/21/30/305704

    • Peer Reviewed
  • [Journal Article] Simultaneous AFM and STM measurements on the Si(111)-(7x7) surface2010

    • Author(s)
      Y. Sugimoto, Y. Nakajima, D. Sawada, M. Abe, and S. Morita
    • Journal Title

      Physical Review B

      Volume: Vol.81 Pages: 245322-1/-9

    • DOI

      DOI:10.1103/PhysRevB.81.245322

    • Peer Reviewed
  • [Journal Article] Simultaneous force and current mapping of the Si(111)-(7x7) surface by dynamic force microscopy2010

    • Author(s)
      Y. Sugimoto, I. Yi, M. Abe, and S. Morita
    • Journal Title

      Applied Physics Letters

      Volume: Vol.96 Pages: 263114-1/-3

    • DOI

      DOI:10.1063/1.3457997

    • Peer Reviewed
  • [Journal Article] NC-AFM imaging of the TiO2(110)-(1x1) surface at low temperature2010

    • Author(s)
      A. Yurtsever, Y. Sugimoto, M. Abe, and S. Morita
    • Journal Title

      Nanotechnology

      Volume: Vol.21 Pages: 165702-1/-7

    • Peer Reviewed
  • [Journal Article] New insights on atomic-resolution Frequency-Modulation Kelvin Probe Force Microscopy imaging on semiconductors2009

    • Author(s)
      S. Sadewasser, P. Jelinek, C.-K. Fang, O. Custance, Y. Yamada, Y. Sugimoto, M. Abe, and S. Morita
    • Journal Title

      Physical Review Letters

      Volume: Vol.103 Pages: 266103-1/ 266103-4

    • DOI

      DOI:10.1103/PhysRevLett.103.266103

    • Peer Reviewed
  • [Journal Article] Simultaneous measurement of force and tunneling current at room temperature2009

    • Author(s)
      D. Sawada, Y. Sugimoto, K. Morita, M. Abe and S. Morita
    • Journal Title

      Applied Physics Letters

      Volume: Vol.94 Pages: 173117-1/ 173117-3

    • URL

      http://dx.doi.org/10.1063/1.3127503

    • Peer Reviewed
  • [Journal Article] Mapping and imaging for rapid atom discrimination : A study of frequency modulation atomic force microscopy2009

    • Author(s)
      Y. Sugimoto, T. Namikawa, M. Abe, and S. Morita
    • Journal Title

      Applied Physics Letters

      Volume: vol.94 Pages: 023108-1/ 023108-3

    • URL

      http://dx.doi.org/10.1063/1.3046736

    • Peer Reviewed
  • [Presentation] Simultaneous scanning force/ tunneling microscopy using a quartz cantilever with a tungsten tip2011

    • Author(s)
      K. Morita and M. Abe et al.
    • Organizer
      19th International Colloquium on Scanning Probe Microscopy(ICSPM19)
    • Place of Presentation
      Hokkaido, Japan
    • Year and Date
      2011-12-20
  • [Presentation] Measurement of atom hopping probability and interaction force for atom manipulation on the Si(111)-(7x7) surface2011

    • Author(s)
      Y. Sugimoto and M. Abe et al.
    • Organizer
      19th International Colloquium on Scanning Probe Microscopy(ICSPM19)
    • Place of Presentation
      Hokkaido, Japan
    • Year and Date
      2011-12-20
  • [Presentation] Alkali-metal adsorption and manipulation on a hydroxylated TiO2(110) surface using atomic force microscopy2011

    • Author(s)
      A. Yurtsever and M. Abe et al.
    • Organizer
      19th International Colloquium on Scanning Probe Microscopy(ICSPM19)
    • Place of Presentation
      Hokkaido, Japan
    • Year and Date
      2011-12-20
  • [Presentation] Simultaneous scanning force/ tunneling microscopy using a quartz cantilever with a tungsten tip2011

    • Author(s)
      K. Morita and M. Abe et al.
    • Organizer
      3rd Global COE International Symposium Electronic Devices Innovation(EDIS2011)
    • Place of Presentation
      Osaka, Japan
    • Year and Date
      2011-12-16
  • [Presentation] Simultaneous scanning force/ tunneling microscopy using a quartz cantilever with a tungsten tip2011

    • Author(s)
      K. Morita and M. Abe et al.
    • Organizer
      International Symposium on Surface Science(ISSS-6)
    • Place of Presentation
      Tokyo, Japan
    • Year and Date
      2011-12-14
  • [Presentation] Fabrication of Quartz Cantilevers for Small-Amplitude Dynamic Force Microscopy Using an Optical Deflection Sensor2011

    • Author(s)
      Y. Miyata and M. Abe et al.
    • Organizer
      International Symposium on Surface Science(ISSS-6)
    • Place of Presentation
      Tokyo, Japan
    • Year and Date
      2011-12-14
  • [Presentation] Three dimensional force mapping and KPFM measurements on the CaF2/ Si(111) surface2011

    • Author(s)
      M. Fukumoto and M. Abe et al.
    • Organizer
      19th International Colloquium on Scanning Probe Microscopy(ICSPM19)
    • Place of Presentation
      Hokkaido, Japan
    • Year and Date
      2011-11-20

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Published: 2013-07-31  

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