2012 Fiscal Year Final Research Report
Structure analysis of adsorbed molecules or ions at liquid-liquid interface by total-reflection X-ray absorption spectroscopy
| Project/Area Number |
21350047
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| Research Category |
Grant-in-Aid for Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Analytical chemistry
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| Research Institution | Tokyo Institute of Technology (2010-2012)
Japan Synchrotron Radiation Research Institute (2009) |
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Principal Investigator |
HARADA Makoto 東京工業大学, 大学院・理工学研究科, 助教 (60313326)
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| Co-Investigator(Kenkyū-buntansha) |
TAKIUE Takatomo 九州大学, 理学(系)研究科(研究院), 准教授 (40271100)
NAGATANI Hirohisa 金沢大学, 物質化学系, 准教授 (90346297)
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| Project Period (FY) |
2009 – 2012
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| Keywords | XAFS / 液液界面 / 全反射 / 反射率測定 / 電位規制界面 |
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| Research Abstract |
XAFS (X-ray absorption fine structure) technique has been applied to the local structure analysis of solvated ions or molecules. Total-reflection fluorescence-XAFS (TR-XAFS) method has been developed and improved for the observations of their structures in situ at the liquid-liquid interface.The amount of adsorbed bromide ions at DTAB aqueous solution-hexane interface has been estimated from XAFS jump height at Br K edge using this TR-XAFS apparatus. It was clear that the adsorption behavior of bromide ions at water-hexane interface was different from that at the aqueous solution surface.The molecular orientation of hydrophobic ZnTPP at heptane-water interface was studied byTR-XAFS method taken horizontal and vertical polarizations of synchrotron radiation.
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