2011 Fiscal Year Final Research Report
Measurement and control of charge transfer between organic ultrathin layers and substrates by means of in-situ real-time spectroscopy
| Project/Area Number |
21360020
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| Research Category |
Grant-in-Aid for Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | Yokohama National University |
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Principal Investigator |
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| Co-Investigator(Kenkyū-buntansha) |
OHNO Shin-ya 横浜国立大学, 工学研究院, 特別研究教員 (00377095)
OHNO Kaoru 横浜国立大学, 工学研究院, 教授 (40185343)
YOKOYAMA Takashi 横浜市立大学, 生命ナノシステム研究科, 教授 (80343862)
YASUDA Tetuji 産業技術総合研究所, ナノエレクトロニクス部門, 研究員(部門付) (90220152)
SUZUKI Takanori 防衛大学校, 応用物理学科, 教授 (60124369)
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| Project Period (FY) |
2009 – 2011
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| Keywords | 表面・界面物性 / 光物性 / 超薄膜 / マイクロ・ナノデバイス / 超分子化学 |
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| Research Abstract |
Physical properties of chemically modified silicon surfaces and the orientations ofα-sexithiophene molecules in the ultrathin overlayers were investigated by means of in-situ real-time surface reflectance spectroscopy and photoelectron spectroscopy. The relationship between the orientation and the charge transfer between molecules and substrates has been clarified. The charge transfer remarkably depends on the surface modification, which means the orientation of molecules can be controlled by the modification and substrate temperature.
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