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2011 Fiscal Year Final Research Report

High-efficiency thermoelectric devices with Si nanostructures and their measurement techniques

Research Project

  • PDF
Project/Area Number 21360336
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Structural/Functional materials
Research InstitutionShizuoka University

Principal Investigator

IKEDA Hiroya  静岡大学, 電子工学研究所, 准教授 (00262882)

Co-Investigator(Kenkyū-buntansha) ISHIDA Akihiro  静岡大学, 工学部, 教授 (70183738)
Project Period (FY) 2009 – 2011
Keywords熱電変換材料 / シリコンナノ構造 / ゼーベック係数 / SOI基板 / KFM(表面電位顕微鏡)
Research Abstract

Our research goals are the enhancement of Si thermoelectric characteristics by nanosturcturing and the construction of a novel technique characterizing the nanostructured materials. We found that Seebeck coefficient(thermoelectromotive force at a temperature deference of 1OC) of ultrathin Si is ruled by an impurity band and that Seebeck coefficient is controllable by external bias. Moreover, We have successfully obtained the Si Seebeck coefficient by surface-potential microscopy.

  • Research Products

    (22 results)

All 2012 2011 2010 2009 Other

All Journal Article (9 results) (of which Peer Reviewed: 9 results) Presentation (12 results) Remarks (1 results)

  • [Journal Article] Theore tical study on the stability of the single electron-pump refrigerator with respect to thermal and dimensional fluctuations2012

    • Author(s)
      Hiroya Ikeda, Faiz Salleh
    • Journal Title

      IEICE Trans. Electron.

      Volume: Vol.E95-C Pages: 924-927

    • Peer Reviewed
  • [Journal Article] A theoretical study of a novel single-electron refrigerator fabricated from semiconductor materials2011

    • Author(s)
      Hiroya Ikeda, Faiz Salleh
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: Vol.50 Pages: 20-1-4

    • Peer Reviewed
  • [Journal Article] See beck coefficient of heavily P-doped Si calculated from an alteration in electronic density of states2011

    • Author(s)
      Faiz Salleh, Hiroya Ikeda
    • Journal Title

      J. Electron. Mater.

      Volume: Vol.40 Pages: 903-906

    • Peer Reviewed
  • [Journal Article] A novel refrigerator device using single-electron pump applicable to SOI wafers2011

    • Author(s)
      Hiroya Ikeda, Faiz Salleh
    • Journal Title

      Adv. Mater. Res.

      Volume: Vol.222 Pages: 66-69

    • Peer Reviewed
  • [Journal Article] In fluence of impurity band on Seebeck coefficient in heavily-doped Si2011

    • Author(s)
      Faiz Salleh, Hiroya Ikeda
    • Journal Title

      Adv. Mater. Res.

      Volume: Vol.222 Pages: 197-200

    • Peer Reviewed
  • [Journal Article] In fluence of heavy doping on Seebeck coefficient in silicon-on-insulator2010

    • Author(s)
      Hiroya Ikeda, Faiz Salleh
    • Journal Title

      Appl. Phys. Lett.

      Volume: Vol.96 Pages: 012106-1-3

    • Peer Reviewed
  • [Journal Article] Seebeck coefficient measurement by Kelvin-probe force microscopy2009

    • Author(s)
      Hiroya Ikeda, Fais Salleh
    • Journal Title

      J. Autom. Mobile Rob. Intell. Syst.

      Volume: Vol.3 Pages: 49-51

    • Peer Reviewed
  • [Journal Article] Im purity-concentration dependence of Seebeck coefficient in silicon-on-insulator layers2009

    • Author(s)
      Fais Salleh, Kiyosumi Asai, Akihiro Ishida, Hiroya Ikeda
    • Journal Title

      J. Autom. Mobile Rob. Intell. Syst.

      Volume: Vol.3 Pages: 134-136

    • Peer Reviewed
  • [Journal Article] Seebeck coefficient of ultra thin silicon-on-insulator layers2009

    • Author(s)
      Faiz Salleh, Kiyosumi Asai, Akihiro Iehida, Hiroya Ikeda
    • Journal Title

      Appl. Phys. Express

      Volume: Vol.2 Pages: 071203-1-3

    • Peer Reviewed
  • [Presentation] Seebeck coefficient of ultrathin Si layer with bias-controlled Fermi energy2011

    • Author(s)
      Faiz Salleh, Hiroya Ikeda
    • Organizer
      15th Int. Conf. on Thin Films
    • Place of Presentation
      Kyoto
    • Year and Date
      20111108-11
  • [Presentation] Faiz Salleh, Construction of Seebeck-coefficinet measurement by Kelvin-probe for ce microscopy2011

    • Author(s)
      Hiroya Ikeda, Kazutoshi Miwa
    • Organizer
      9th Europ. Conf. on Thermoelectrics
    • Place of Presentation
      Tessaloniki, Greece
    • Year and Date
      20110928-30
  • [Presentation] Variation of SOI Seebeck coefficient by applying external bias2011

    • Author(s)
      Faiz Salleh, Kazutoshi Miwa, Hiroya Ikeda
    • Organizer
      10th Int. Conf. on Global Research and Education
    • Place of Presentation
      Sucevita, Romania
    • Year and Date
      20110926-29
  • [Presentation] Improvement in measurement system of Seebeck coefficient by KFM2011

    • Author(s)
      Kazutoshi Miwa, Faiz Salleh, Hiroya Ikeda
    • Organizer
      10th Int. Conf. on Global Research and Education
    • Place of Presentation
      Sucevita, Romania
    • Year and Date
      20110926-29
  • [Presentation] A novel refrigerator device using single-electron pump fabricated from semiconductor materials2011

    • Author(s)
      Hiroya Ikeda, Faiz Salleh
    • Organizer
      2011 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices
    • Place of Presentation
      Daejeon, Korea
    • Year and Date
      20110629-0701
  • [Presentation] Influence of impurity band on Seebeck coefficient in heavily-doped Si2010

    • Author(s)
      Faiz Salleh, Hiroya Ikeda
    • Organizer
      9th Int. Conf. on Global Research and Education
    • Place of Presentation
      Riga, Latvia
    • Year and Date
      20100809-12
  • [Presentation] A novel refrigerator device using single electron pump applicable to SOI wafers2010

    • Author(s)
      Hiroya Ikeda, Faiz Salleh
    • Organizer
      9th Int. Conf. on Global Research and Education
    • Place of Presentation
      Riga, Latvia
    • Year and Date
      20100809-12
  • [Presentation] Influence of heavy doping on Seebeck coefficient in silicon-on-insulator2010

    • Author(s)
      Faiz Salleh, Hiroya Ikeda
    • Organizer
      29th Int. Conf. on Thermoelectrics
    • Place of Presentation
      Shanghai, China
    • Year and Date
      20100530-0603
  • [Presentation] Seebeck coefficient measurement using a Kelvin-probe force microscopy technique2010

    • Author(s)
      Hiroya Ikeda, Faiz Salleh
    • Place of Presentation
      San Fransisco, USA
    • Year and Date
      20100405-09
  • [Presentation] Impurity-concentration dependence of Seebeck coefficient in silicon-on-insulator layers2009

    • Author(s)
      Faiz Salleh, Kiyosumi Asai, Akihiro Ishida, Hiroya Ikeda
    • Organizer
      8th Int. Conf. on Global Research and Education
    • Place of Presentation
      Kazimierz Dolny & Warsaw, Poland
    • Year and Date
      20090914-17
  • [Presentation] Seebeck coefficient measurement using a Kelvin-probe force microscope technique2009

    • Author(s)
      Hiroya Ikeda, Faiz Salleh, Kiyosumi Asai
    • Organizer
      8th Int. Conf. on Global Research and Education
    • Place of Presentation
      Kazimierz Dolny & Warsaw, Poland
    • Year and Date
      20090914-17
  • [Presentation] Seebeck coefficient of ultra thin SOI films2009

    • Author(s)
      Hiroya Ikeda, Faiz Salleh, Kiyosumi Asai
    • Organizer
      28th Int. Conf. and 7th Europ. Conf. on Thermoelectrics
    • Place of Presentation
      Freibrug, Germany
    • Year and Date
      20090726-30
  • [Remarks]

    • URL

      http://serversman.net/ikedalab/

URL: 

Published: 2013-07-31  

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