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2011 Fiscal Year Final Research Report

What should we do to integrate total systems of cell sorters into one chip?

Research Project

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Project/Area Number 21500415
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field Biomedical engineering/Biological material science
Research InstitutionToyo University

Principal Investigator

HANAJIRI Tatsuro  東洋大学, 理工学部, 教授 (30266994)

Co-Investigator(Kenkyū-buntansha) YOSHIMORO Tomomi  東洋大学, 理工学部, 教授 (60230819)
MIZUKI Toru  東洋大学, 理工学部, 助教 (80408997)
Co-Investigator(Renkei-kenkyūsha) KASHIWAGI Kunihiro  東洋大学, 工学部, 名誉教授 (30058094)
Project Period (FY) 2009 – 2011
Keywords生体・情報計測 / オンチップセルソーター / SOI / SOQ
Research Abstract

By combining the electrophoresis method and the conventional Coulter method, we previously proposed the Electrophoretic Coulter Method(ECM)- a technique that enables simultaneous analysis of the size and ζvalues of individual specimens. In this study, we validate ECM in ζmeasurement of biological cells by a conventional Dynamic Light Scattering(DLS) to apply ECM to the field of clinical medicine. We use sheep's red blood cells(RBCs) as biological cells. The ζof RBC is varied by adsorption of Immunogloblin G(IgG) to RBC. We are able to obtain the difference between ζs of RBCs and those of RBCs-IgG by using ECM. In addition, we demonstrate thatζs obtained using ECM show a good agreement with those obtained by the conventional DLS and our ECM can distinguish biological cells using the difference ofζs. Furthermore, we propose that SOI(Silicon On Insulator) wafers or SOQ(Silicon On Quartz) wafers should be utilized as platforms for integration of ECM systems combined with electric detectors or optical detectors and sorting systems, and we characterize fundamental characteristics of SOI wafers and SOQ wafers in detail.

  • Research Products

    (40 results)

All 2012 2011 2010 2009 Other

All Journal Article (8 results) (of which Peer Reviewed: 8 results) Presentation (22 results) Remarks (9 results) Patent(Industrial Property Rights) (1 results)

  • [Journal Article] Dispersion of single-walled carbon nanotubes modified with poly-l-tyrosine in water2011

    • Author(s)
      M. Kojima, T. Chiba, J. Niiishima, H. Higashi, F. Fukuda, Y. Nakajima, S. Kurosu, T. Hanajiri, K. Ishii, T. Maekawa, A. Inoue
    • Journal Title

      Nano Scale Research Letters

      Volume: 6 Pages: 128-134

    • Peer Reviewed
  • [Journal Article] Effects of poly-L-tyrosine molecules decoration on the surface properties and electron transport of SWCNTs compared to the effects of DNA molecules2011

    • Author(s)
      T. Higashi, Y. Nakajima, M. Kojima, K. Ishii, A. Inoue, T. Maekawa, and T. Hanajiri
    • Journal Title

      Chem. Phys. Lett.

      Volume: 501 Pages: 451-454

    • Peer Reviewed
  • [Journal Article] Local-stress induced trap states in SOI layers with different levels of roughness at SOI/BOX interfaces2011

    • Author(s)
      Y. Nakajima, Y. Watanabe, T. Hanajiri, T. Toyabe, and T. Sugano
    • Journal Title

      IEEE Electron Device Lett.

      Volume: 32 Pages: 4451-7

    • Peer Reviewed
  • [Journal Article] Regulation of PCR efficiency with magnetic nanoparticles in a rotating magnetic field2011

    • Author(s)
      T. Higashi, Y. Nagaoka, H. Minegishi, A. Echigo, R. Usami, T. Maekawa, T. Hanajiri
    • Journal Title

      Chem. Phys. Lett.

      Volume: 506 Pages: 239-242

    • Peer Reviewed
  • [Journal Article] Proposal and Experimental Validation of the Electrophoretic Coulter Method for Analyzing Microparticles and Biological Cells2011

    • Author(s)
      N. Takahashi, A. Aki, T. Ukai, Y. Nakajima, T. Maekawa, and T. Hanajiri
    • Journal Title

      Sensors and Actuators B : Chemical

      Volume: 151 Pages: 401-415

    • Peer Reviewed
  • [Journal Article] In-depth profiling of electron trap states in SOI layers and local mechanical stress near the SOI/BOX interface in SIMOX wafers2010

    • Author(s)
      Y. Nakajima, T. Toda, T. Hanajiri, T. Toyabe, and T. Sugano
    • Journal Title

      J. Appl. Phys.

      Volume: 108 Pages: 124505

    • Peer Reviewed
  • [Journal Article] Blood Compatibility of Surface Modified Poly(ethylene terephthalate)(PET) by Plasma Polymerized Acetobromo-alpha-D-glucose2010

    • Author(s)
      DS. Kumar, BG. Nair, SH. Varghese, R. Nair, T. Hanajiri, T. Maekawa, Y. Yoshida
    • Journal Title

      Journal of Biomaterials Applications

      Volume: 24 Pages: 527-544

    • Peer Reviewed
  • [Journal Article] Sensors Based On Carbon Nanotubes and Their Applications : A Review2010

    • Author(s)
      SH. Varghese, R. Nair, BG. Nair, T. Hanajiri, T. Maekawa, Y. Yoshida, DS. Kumar
    • Journal Title

      Current Nano Science

      Volume: 4 Pages: 331-346

    • Peer Reviewed
  • [Presentation] SOI基板のSOI/BOX界面近傍における欠陥の評価(II)2012

    • Author(s)
      趙謙, 宮澤元, 中島義賢, 花尻達郎
    • Organizer
      第59回応用物理学関係連合講演会
    • Place of Presentation
      東京都、早稲田大学
    • Year and Date
      2012-03-17
  • [Presentation] SOQ基板の光・電子融合デバイスへの応用の検討2012

    • Author(s)
      宮澤元, 中島義賢, 花尻達郎
    • Organizer
      第59回応用物理学関係連合講演会
    • Place of Presentation
      東京都、早稲田大学
    • Year and Date
      2012-03-17
  • [Presentation] 電気泳動コールター法を用いた生体細胞のゼータ電位の評価2012

    • Author(s)
      尾形和平, 高橋直寛, 中島義賢, 花尻達郎
    • Organizer
      第59回応用物理学関係連合講演会
    • Place of Presentation
      東京都、早稲田大学
    • Year and Date
      2012-03-16
  • [Presentation] In-depth profiling of hole traps and defects in SOI wafers2011

    • Author(s)
      H. Miyazawa, Y. Nakajima, T. Hanajiri, and T. Sugano
    • Organizer
      6^<th> Int. Conference onMaterials for Advanced Technologies
    • Place of Presentation
      Singapore
    • Year and Date
      20110626-0701
  • [Presentation] Improvement of Accuracy and Reliability of Electrophoretic Coulter Method2011

    • Author(s)
      K. Ogata, N. Takahashi, A. Aki, Y. Nakajima, T. Hanajiri
    • Organizer
      6^<th> Int. Conference on Materials for Advanced Technologies(ICMAT2011)
    • Place of Presentation
      Singapore
    • Year and Date
      20110626-0701
  • [Presentation] SOI基板のSOI/BOX界面近傍における欠陥の評価2011

    • Author(s)
      宮澤元, 趙謙, 中島義賢, 花尻達郎, 菅野卓雄
    • Organizer
      第72回応用物理学会学術講演会
    • Place of Presentation
      山形市、山形大学
    • Year and Date
      2011-09-02
  • [Presentation] 電気泳動コールター法におけるゼータ電位のpH依存性2011

    • Author(s)
      尾形和平, 安喜敦士, 中島義賢, 花尻達郎
    • Organizer
      第23回化学とマイクロナノシステム研究会
    • Place of Presentation
      千葉市、千葉大学西千葉キャンパスけやき会館
    • Year and Date
      2011-06-11
  • [Presentation] SOI/BOX界面凹凸がSOI層中の局所応力および捕獲中心に与える影響2011

    • Author(s)
      渡邉幸俊, 中島義賢, 鳥谷部達, 花尻達郎, 菅野卓雄
    • Organizer
      第58回応用物理学関係連合講演会
    • Place of Presentation
      厚木市、神奈川工科大学
    • Year and Date
      2011-03-25
  • [Presentation] SIMOX基板のSOI層における正孔捕獲中心の評価2011

    • Author(s)
      宮澤元, 中島義賢, 花尻達郎, 菅野卓雄
    • Organizer
      第58回応用物理学関係連合講演会
    • Place of Presentation
      厚木市、神奈川工科大学
    • Year and Date
      2011-03-25
  • [Presentation] Impact of Local Stress Near SOI/BOX interface on high-density trap states in SIMOX wafers2010

    • Author(s)
      Y. Nakajima, Y. Watanabe, T. Hanajiri, T. Toyabe, and T. Sugano
    • Organizer
      ULtimate Integration on Silicon
    • Place of Presentation
      Glasgow, Scotland
    • Year and Date
      20100317-19
  • [Presentation] 電気泳動コールター法におけるチャネル壁面のゼータ電位測定2010

    • Author(s)
      尾形和平, 高橋直寛, 安喜敦士, 中島義賢, 花尻達郎
    • Organizer
      第22回化学とマイクロナノシステム研究会
    • Place of Presentation
      名古屋市、名古屋大学医学部附属病院中央診療棟3階講堂
    • Year and Date
      2010-11-18
  • [Presentation] SIMOX基板上のGOX層における捕獲中心の評価2010

    • Author(s)
      宮澤元, 中島義賢, 花尻達郎
    • Organizer
      第71回応用物理学会学術講演会
    • Place of Presentation
      長崎市、長崎大学
    • Year and Date
      2010-09-16
  • [Presentation] SIMOX基板においてSOI層中の局所応力が捕獲中心に与える影響2010

    • Author(s)
      渡邉幸俊, 中島義賢, 鳥谷部達, 花尻達郎, 菅野卓雄
    • Organizer
      第71回応用物理学会学術講演会
    • Place of Presentation
      長崎市、長崎大学
    • Year and Date
      2010-09-16
  • [Presentation] 極薄膜SOQ pinダイオードの発光特性2010

    • Author(s)
      谷村貴行, 中島義賢, 花尻達郎
    • Organizer
      第57回応用物理学関係連合講演会
    • Place of Presentation
      平塚市、東海大学湘南キャンパス
    • Year and Date
      2010-03-20
  • [Presentation] 電気的非標識免疫測定法のための生体物質の電気的検出2010

    • Author(s)
      沼田慎吉, 中島義賢, 安喜敦士, 前川透, 花尻達郎
    • Organizer
      第57回応用物理学関係連合講演会
    • Place of Presentation
      平塚市、東海大学湘南キャンパス
    • Year and Date
      2010-03-17
  • [Presentation] SOI基板のSOI/BOX界面におけるトラップ準位の起源2010

    • Author(s)
      渡邉幸俊, 中島義賢, 鳥谷部達, 花尻達郎, 菅野卓雄
    • Organizer
      第57回応用物理学関係連合講演会
    • Place of Presentation
      平塚市、東海大学湘南キャンパス
    • Year and Date
      2010-03-17
  • [Presentation] Electrophoretic mobility and resultant zeta potential of an individual cell analyzed by electrophoretic Coulter method2009

    • Author(s)
      N. Takahashi, A. Aki, T. Ukai, Y. Nakajima, T. Maekawa and T. Hanajiri
    • Organizer
      2009 Int. Semi-conductor Device Research Symposium(ISDRS 2009)
    • Place of Presentation
      Washington D. C., U. S. A.
    • Year and Date
      20091209-11
  • [Presentation] Correlation between high-density trap states and local stress near SOI/BOX interface in SIMOX wafers2009

    • Author(s)
      Y. Nakajima, Y. Watanabe, T. Hanajiri, T. Toyabe, and T. Sugano
    • Organizer
      2009 Int. Semiconductor Device Research Symposium(ISDRS2009)
    • Place of Presentation
      Washington D. C., U. S. A.
    • Year and Date
      20091209-11
  • [Presentation] Proposal of heavily doped silicon between insulators MOSFETs and confirmation of their advantages by device simulation2009

    • Author(s)
      T. Yamada, T. Miyazawa, Y. Nakajima, T. Hanajiri, T. Toyabe, and T. Sugano
    • Organizer
      2009 Int. Semiconductor Device Research Symposium(ISDRS 2009)
    • Place of Presentation
      Washington D. C., U. S. A.
    • Year and Date
      20091209-11
  • [Presentation] Electrophoretic Coulter Method for Analyzing Surface Properties of Particles Using a Micro-fluidic Device2009

    • Author(s)
      N. Takahashi, A. Aki, T. Ukai, Y. Nakajima, T. Hanajiri, T. Maekawa
    • Organizer
      5^<th> International Conference on Materials for Advanced Technologies
    • Place of Presentation
      Singapore
    • Year and Date
      20090628-0703
  • [Presentation] SIMOX基板特有の高密度トラップとSOI/BOX界面凹凸との相関2009

    • Author(s)
      渡邉幸俊、中島義賢、鳥谷部達、花尻達郎、菅野卓雄
    • Organizer
      第70回応用物理学会学術講演会
    • Place of Presentation
      富山市、富山大学
    • Year and Date
      2009-09-10
  • [Presentation] コールター法を用いたマイクロチャネル電気泳動法の提案および実験的検証2009

    • Author(s)
      高橋直寛、安喜敦士、鵜飼智文、中島義賢、前川透、花尻達郎
    • Organizer
      第70回応用物理学会学術講演会
    • Place of Presentation
      富山市、富山大学
    • Year and Date
      2009-09-09
  • [Remarks] (国際シンポジウム(審査なし))(1) Y. Nakajima, K. Ogata, H. Miyazawa, N. Takahashi, A. Aki, T. Hanajiri, and T. Sugano,"Devolopment of high-resolution bio-nano analytical systems embedded in SOQ warers", 9^<th> Int. Symp. on Bioscience and Nanotechnology(2011), p. 15(10 Dec. 2011, Toyo Univ., Japan)

  • [Remarks] (2) K. Ogata, N. Takahashi, A. Aki, Y. Nakajima, and T. Hanajiri, "The Validation of Zeta Potential of Biological Cells Estimated by Electrophoresis Coulter Method", 9^<th> Int. Symp. on Bioscience and Nanotechnology(2011), p. 38(10 Dec. 2011, Toyo Univ., Japan)

  • [Remarks] (3) Q. Zhao, H. Miyazawa, Y. Nakajima, T. Hanajiri, and T. Sugano, "Characterization of defects near SOI/BOX interface of SOI wafere", 9^<th> Int. Symp. on Bio-science and Nanotechnology(2011) p. 39(10 Dec. 2011, Toyo Univ., Japan).

  • [Remarks] (4) Y. Watanabe, Y. Nakajima, T. Toyabe, T. Hanajiri, and T. Sugano, "Influence of local stress on traps in SOI layers of SOI wafers", 8^<th> Int. Symp. on Bioscience and Nanotechnology., p. 64(2010)(17-18 Nov. 2010, Toyo Univ., Japan)

  • [Remarks] (5) K. Ogata, N. Takahashi, A. Aki, Y. Nakajima, and T. Hanajiri, "Extraction of Zeta Potential on Channel Walls for Electrophoretic Coulter Method Accuracy Improvement", 8^<th> Int. Symp. on Bioscience and Nanotechnology(2010), p. 65(17-18 Nov. 2010, Toyo Univ., Japan)

  • [Remarks] (6) H. Miyazawa, Y. Nakajima, T. Sugano, and T. Hanajiri, "Characterization of distribution of traps in SOI layers of SIMOX wafers", 8^<th> Int. Symp. on Bioscience and Nanotechnology(2010) p. 66(17-18 Dec. 2010, Toyo Univ., Japan).

  • [Remarks] (7) Y. Watanabe, Y. Nakajima, T. Toyabe, T. Hanajiri, and T. Sugano,"Correlation between high-density trap stated and roughness at SOI/BOX interface in SIMOX wafers", 7^<th> Int. Symp. on Bioscience and Nanotechnology(2009) P. 45(20-21 Nov. 2009, Toyo Univ., Japan).

  • [Remarks] (8) T. Tanimura, Y. Nakajima, and T. Hanajiri,"Photoluminescence study of Silicon-On-Quartz wafers for high performance Light-Emitting Transistors", 7^<th> Int. Symp. on Bio-science and Nanotechnology(2009) P. 48(20-21 Nov. 2009, Toyo Univ., Japan).

  • [Remarks] (9) N. Takahashi, A. Aki, T. Ukai, Y. Nakajima, T. Maekawa and T. Hanajiri,"Electrophpretic Coulter Method for Simultaneous Measurement of Zeta Potential and distribution of Micro-particles Including Biological Cells in a Micro-channel", 7^<th> Int. Symp.on Bioscience and Nanotechnology(2009) P. 48(20-21 Nov. 2009, Toyo Univ., Japan).

  • [Patent(Industrial Property Rights)] ゼータ電位測定装置及びゼータ電位測定方法2009

    • Inventor(s)
      安喜敦士、高橋直寛、前川透、花尻達郎、鵜飼智文
    • Industrial Property Rights Holder
      安喜敦士、高橋直寛、前川透、花尻達郎、鵜飼智文
    • Industrial Property Number
      特許、出願番号:特願2009-260937、公開番号:特開2011-106915
    • Filing Date
      2009-11-16

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Published: 2013-07-31  

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