2011 Fiscal Year Final Research Report
High spatial-resolution crystal structure analysis using annular dark-field imaging
| Project/Area Number |
21510121
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Nanomaterials/Nanobioscience
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| Research Institution | National Institute for Materials Science |
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Principal Investigator |
KIMOTO Koji 独立行政法人物質・材料研究機構, 表界面構造・物性ユニット, ユニット長 (90354399)
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| Project Period (FY) |
2009 – 2011
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| Keywords | ナノ材料解析・評価 / 電子顕微鏡 / 結晶構造 |
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| Research Abstract |
Annular dark-field(ADF) imaging in scanning transmission electron microscopy(STEM) is an effective tool for the characterization of local crystal structure, because ADF imaging has high compositional sensitivity and intuitive interpretability. In this study, we performed high sensitivity and high precision(10pm) analyses of crystal structures using STEM imaging. We revealed the validity of incoherent imaging approximation of ADF imaging. We also achieved so-called spatially-resolved diffractometry, in which the diffraction patterns are fully acquired as a function of probe coordination to investigate the mechanism of STEM imaging.
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