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2011 Fiscal Year Final Research Report

Development of in-situ TEM measurement system and its application to nanoelectronics

Research Project

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Project/Area Number 21560681
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field Physical properties of metals
Research InstitutionHokkaido University

Principal Investigator

ARITA Masashi  北海道大学, 大学院・情報科学研究科, 准教授 (20222755)

Co-Investigator(Kenkyū-buntansha) TAKAHASHI Yasuo  北海道大学, 大学院・情報科学研究科, 教授 (90374610)
SUEOKA Kazuhisa  北海道大学, 大学院・情報科学研究科, 教授 (60250479)
SHIBAYAMA Tamaki  北海道大学, マテリアル融合領域研究センター, 准教授 (10241564)
Project Period (FY) 2009 – 2011
Keywords電子顕微鏡 / その場計測 / 抵抗変化型メモリー / 磁気抵抗効果
Research Abstract

In recent years, development of electronic devices is energetically investigated, where geometrical and magnetic mictro-and nano-structures contribute to the electronic properties. In this work, in-situ transmission electron microscopy (i. e. in-situ TEM) was introduced to these studies, where TEM image observations and electric measurements were simultaneously performed. To realize these experiments, special TEM holders were developed. One of them was a holder with a piezo actuator (i. e. TEM-STM holder), and the other was with an electromagnet system (named as a TEM-MF holder). Using the TEM-STM holder, formation and disappearance of a conductive filament inside the resistive RAM (ReRAM) layer was clearly observed. This result supports the filament model for ReRAM switching. On the other hand, the motion of the magnetic domain caused by the applied magnetic field generated by the TEM-MF holder was confirmed. Utility of in-situ TEM method was clearly demonstrated.

  • Research Products

    (27 results)

All 2012 2011 2010 2009

All Journal Article (11 results) (of which Peer Reviewed: 11 results) Presentation (16 results)

  • [Journal Article] Resis-tance switching properties of molybdenum oxide films2012

    • Author(s)
      M. Arita, H. Kaji, T. Fujii, Y. Takahashi
    • Journal Title

      Thin Solid Films

      Volume: 520 Pages: 4762-4767

    • DOI

      DOI:10.1016/j.tsf.2011.10.174

    • Peer Reviewed
  • [Journal Article] (Invited) Analysis of resistance switching and conductive filaments inside Cu-Ge-S using in situ transmission electron microscopy2012

    • Author(s)
      T. Fujii, M. Arita, Y. Takahashi, I. Fujiwara
    • Journal Title

      J. Mater. Res.

      Volume: 27 Pages: 886-896

    • DOI

      DOI:10.1557/jmr.2011.437

    • Peer Reviewed
  • [Journal Article] In-situ TEM observation of electro-migration in Au thin wires2012

    • Author(s)
      Y. Murakami, M. Arita, K. Hamada, Y. Takahashi
    • Journal Title

      J. Nanosci. Nanotech.

    • URL

      http://www.aspbs.com/jnn/

    • Peer Reviewed
  • [Journal Article] I-V measurement of NiO nano-region during observation by transmission electron microscopy2011

    • Author(s)
      T. Fujii, M. Arita, K. Hamada, H. Kondo, H. Kaji, Y. Takahashi, M. Moniwa, I. Fujiwara, T. Yamaguchi, M. Aoki, Y. Maeno, T. Kobayashi, M. Yoshimaru
    • Journal Title

      J. Appl. Phys.

      Volume: 109 Pages: 053702-1-5

    • DOI

      DOI:10.1063/1.3553868

    • Peer Reviewed
  • [Journal Article] In situ transmission electron microscopy analysis of conductive filament during solid electrolyte resistance switching2011

    • Author(s)
      T. Fujii, M. Arita, Y. Takahashi, I. Fujiwara
    • Journal Title

      Appl. Phys. Lett.

      Volume: 98 Pages: 212104-1-3

    • DOI

      DOI:10.1063/1.3593494

    • Peer Reviewed
  • [Journal Article] The observation of conduction spot on NiO resistance RAM, Japn2011

    • Author(s)
      H. Kondo, M. Arita, T. Fujii, H. Kaji, M. Moniwa, T. Yamaguchi, I. Fujiwara, M. Yoshimaru, and Y. Takahashi
    • Journal Title

      J. Appl. Phys.

      Volume: 50 Pages: 081101-1-6

    • DOI

      DOI:10.1143/JJAP.50.081101

    • Peer Reviewed
  • [Journal Article] (Invited) In-situ transmission electron micro-scopy analysis of conductive filament in resistance random access memories2011

    • Author(s)
      Y. Takahashi, T. Fujii, M. Arita, I. Fujiwara
    • Journal Title

      ECS Trans.

      Volume: 41 Pages: 81-91

    • DOI

      DOI:10.1149/1.3633287

    • Peer Reviewed
  • [Journal Article] Effect of electrode and interface oxide on the property of ReRAM composed of Pr_<0.7>Ca_<0.3>MnO_32010

    • Author(s)
      H. Kaji, H. Kondo, T. Fujii, M. Arita, Y. Takahashi
    • Journal Title

      IOP Conf. Ser.: Mater. Sci. Eng.

      Volume: 8 Pages: 012032-1-4

    • DOI

      DOI:10.1088/1757-899X/8/1/012032

    • Peer Reviewed
  • [Journal Article] I-V hysteresis of Pr_<0.7>Ca_<0.3> MnO_3 during TEM observation2010

    • Author(s)
      T. Fujii, H. Kaji, H. Kondo, K. Hamada, M. Arita, Y. Takahashi
    • Journal Title

      IOP Conf. Ser.: Mater. Sci. Eng.

      Volume: 8 Pages: 012033-1-4

    • DOI

      DOI:10.1088/1757-899X/8/1/012033

    • Peer Reviewed
  • [Journal Article] The influence of annealing temperature on ReRAM characteristics of metal /NiO/metal structure2010

    • Author(s)
      H. Kondo, H. Kaji, T. Fujii, K. Hamada, M. Arita, Y. Takahashi
    • Journal Title

      IOP Conf. Ser.: Mater. Sci. Eng.

      Volume: 8 Pages: 012034-1-4

    • DOI

      DOI:10.1088/1757-899X/8/1/012034

    • Peer Reviewed
  • [Journal Article] Sur-face magnetic structure of epitaxial magnetite thin films grown on MgO(001)2009

    • Author(s)
      E. Kaji, A. Subagyo, M. Arita, K. Sueoka
    • Journal Title

      J. Appl. Phys.

      Volume: 105 Pages: 07D545-1-3

    • DOI

      DOI:10.1063/1.3089493

    • Peer Reviewed
  • [Presentation] TEM-STMを用いたReRAMスイッチング現象のその場観察2012

    • Author(s)
      有田正志
    • Organizer
      ReRAMワークショップ
    • Place of Presentation
      物材機構,つくば
    • Year and Date
      2012-03-17
  • [Presentation] 抵抗変化メモリ動作のTEMその場観察を念頭においた試料作製法の開発2012

    • Author(s)
      工藤昌輝
    • Organizer
      応用物理学会講演会
    • Place of Presentation
      早大,東京
    • Year and Date
      2012-03-16
  • [Presentation] In-situ transmission electron microscopy analysis of conductive filament in resistance random access memories2011

    • Author(s)
      Y. Takahashi
    • Organizer
      220th ECS Meeting
    • Place of Presentation
      Westin Boston Waterfront, Boston
    • Year and Date
      2011-10-11
  • [Presentation] In-situ TEM observation for formation of Au nanowires and nanogaps caused by electromigration2011

    • Author(s)
      Y. Murakami
    • Organizer
      2011 SSDM
    • Place of Presentation
      WINC AICHI , Nagoya
    • Year and Date
      2011-09-29
  • [Presentation] In-situ TEM Observation of electromigration in Au thin wires2011

    • Author(s)
      Y. Murakami
    • Organizer
      EMRS ICAM IUMRS 2011
    • Place of Presentation
      Nice
    • Year and Date
      2011-05-10
  • [Presentation] Lorentz microscopy observations of MgO/Fe-nanodot/MgO granular films2011

    • Author(s)
      M. Kudo
    • Organizer
      EMRS ICAM IUMRS 2011
    • Place of Presentation
      Congress Center, Nice
    • Year and Date
      2011-05-10
  • [Presentation] Resistance switching properties of molybdenum oxide films2011

    • Author(s)
      M. Arita
    • Organizer
      EMRS ICAM IUMRS 2011
    • Place of Presentation
      Congress Center, Nice
    • Year and Date
      2011-05-10
  • [Presentation] In-situ TEM analysis of conductive filament in a solid electrolyte resistance RAM2011

    • Author(s)
      T. Fujii
    • Organizer
      2011 MRS
    • Place of Presentation
      Moscone West Convention Center, San Fransisco
    • Year and Date
      2011-04-28
  • [Presentation] 電磁石搭載型TEMホルダーシステムの作製とパーマロイディスクへの応用2010

    • Author(s)
      有田正志
    • Organizer
      日本金属学会2010年秋期講演大会
    • Place of Presentation
      北海道大学,札幌
    • Year and Date
      2010-09-27
  • [Presentation] The observation on conduction spot in NiO resistance RAM2010

    • Author(s)
      T. Fujii
    • Organizer
      2010 SSDM
    • Place of Presentation
      Univ. Tokyo, Tokyo
    • Year and Date
      2010-09-23
  • [Presentation] 磁場印加機構を持ったローレンツ観察用TEMホルダーの開発と磁性薄膜その場観察への応用2010

    • Author(s)
      徳田良平
    • Organizer
      日本磁気学会講演会
    • Place of Presentation
      国際会議場,つくば
    • Year and Date
      2010-09-07
  • [Presentation] I-V measurement of nano-region NiO in transmission electron microscope2010

    • Author(s)
      T. Fujii
    • Organizer
      EMRS 2010
    • Place of Presentation
      Congress Center, Strasbourg
    • Year and Date
      2010-06-08
  • [Presentation] TEM holder generating in-plane magnetic field and its application on thin permalloy films2010

    • Author(s)
      R. Tokuda
    • Organizer
      EMRS 2010
    • Place of Presentation
      Congress Center, Strasbourg
    • Year and Date
      2010-06-08
  • [Presentation] TEM内電気伝導計測のための特殊ホルダー開発とその応用2009

    • Author(s)
      有田正志
    • Organizer
      顕微鏡学会北海道支部講演大会
    • Place of Presentation
      酪農大,江別
    • Year and Date
      2009-12-12
  • [Presentation] I-V hysteresis of Pr_<0.7>Ca_<0.3>MnO_3 in TEM observation2009

    • Author(s)
      T. Fujii
    • Organizer
      EMRS 2009
    • Place of Presentation
      Congress Center, Strasbourg
    • Year and Date
      2009-06-09
  • [Presentation] 磁場印加機構を持ったローレンツ観察用TEMホルダーの試作2009

    • Author(s)
      徳田良平
    • Organizer
      日本顕微鏡学会講演会
    • Place of Presentation
      仙台国際センター,仙台
    • Year and Date
      2009-05-27

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Published: 2013-07-31  

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