Study on Secondary Electron Emission from Insulator and Construction of Database of Secondary Electron Yield

2010 Fiscal Year Final Research Report

• Project/Area Number: 21686005
• Research Category: Grant-in-Aid for Young Scientists (A)
• Allocation Type: Single-year Grants
• Research Field: Thin film/Surface and interfacial physical properties
• Research Institution: Osaka University
• Principal Investigator: NAGATOMI Takaharu Osaka University, 工学研究科, 助教 (90314369)
• Project Period (FY): 2009 – 2010
• Keywords: 二次電子 / 絶縁物 / エキソ電子

Research Abstract

We have been developing the exoelectron detection system, and we have succeeded to develop and improve the accuracy of the measurement of the secondary electron yield from insulators by developing and modifying the pulsed-ion beam irradiation system. In addition, we developed the experimental system to measure the variations in the secondary electron yield of practical materials, which are induced by the gas absorption on the sample surface and/or heating the sample. We succeeded to develop the system to quantitatively measure the change in the secondary electron yield of practical materials. Furthermore, we established the working group for the construction of the database of the secondary electron yield in the 141st committee on Microbeam Analysis of Japan Society for the Promotion of Science, and started activities relating to the database construction with the committee members belonging to industrial companies.

Research Products

• [Journal Article] Improvement in Discharge Delay Time by Accumulating Positive Wall Charges on Cathode MgO Protective Layer Surface in Alternating-Current Plasma Display Panels (2011)
  • Author(s): K.Yoshino, T.Nagatomi, Y.Morita, T.Oue, N.Kosugi, M.Nishitani, M.Kitagawa, Y.Takai
  • Journal Title: Japanese Journal of Applied Physics Vol.50 Pages: 026201-1-026201-10
  • Peer Reviewed
• [Journal Article] Surface Excitations in Surface Electron Spectroscopies Studied by Reflection Electron Energy Loss Spectroscopy and Elastic Peak Electron Spectroscopy (2010)
  • Author(s): T.Nagatomi, S.Tanuma
  • Journal Title: Analytical Science Vol.26 Pages: 165-176
  • Peer Reviewed
• [Journal Article] Surface Energy Loss Processes in XPS Studied by Absolute Reflection Electron Energy Loss Spectroscopy (2010)
  • Author(s): T.Nagatomi, K.Goto
  • Journal Title: Journal of Electron Spectroscopy and Related Phenomena Vol.178-179 Pages: 178-185
  • Peer Reviewed
• [Journal Article] Photoemission Electron Spectroscopy III: Satellites by Extended Excitations (2010)
  • Author(s): J.D.Lee, T.Nagatomi, G.Mizutani, K.Endo
  • Journal Title: Journal of Surface Analysis Vol.16 Pages: 196-213
  • Peer Reviewed
• [Journal Article] In Situ Observation of Change in Surface Atomic Arrangement of Sc-O/W (100) System during Phase Transition at High Temperature (2010)
  • Author(s): T.Nagatomi, Y.Nakanishi, Y.Takai
  • Journal Title: Journal of Vacuum Science and Technology A Vol.28 Pages: 199-206
  • Peer Reviewed
• [Journal Article] Effects of Wall Charge on Firing Voltage and Statistical Delay Time in Alternating Current Plasma Display Panels (2010)
  • Author(s): K.Yoshino, T.Nagatomi, Y.Morita, T.Oue, N.Kosugi, M.Nishitani, M.Kitagawa, Y.Takai
  • Journal Title: Japanese Journal of Applied Physics Vol.49 Pages: 040212-1-040212-3
  • Peer Reviewed
• [Journal Article] Absolutely Determined Inelastic Mean Free Paths for 300-3000 eV Electrons in 10 Elemental Solids (2010)
  • Author(s): T.Nagatomi, S.Tanuma, K.Goto
  • Journal Title: Surface and Interface Analysis Vol.42 Pages: 1537-1540
  • Peer Reviewed
• [Journal Article] Members of JSPS141-WG-SEY, "Working Group Report of Database Construction of Secondary Electron Yield (JSPS141-WG-SEY) [I] Precise Measurement by Charge Amplification Method" (2010)
  • Author(s): T.Nagatomi, K.Goto, R.Shimizu
  • Journal Title: Surface amd Interface Analysis Vol.42 Pages: 1541-1543
  • Peer Reviewed
• [Journal Article] Change in Work Function during Phase Transition of Sc-O/W (100) System at High Temperatures (2009)
  • Author(s): Y.Nakanishi, T.Nagatomi, Y.Takai
  • Journal Title: Applied Surface Science Vol.256 Pages: 1082-1087
  • Peer Reviewed
• [Journal Article] Inelastic Mean Free Path, Surface Excitation Parameter, and Differential Surface Excitation Parameter in Au for 300 to 3000 eV Electrons (2009)
  • Author(s): T.Nagatomi, K.Goto
  • Journal Title: Applied Surface Science Vol.256 Pages: 1200-1204
  • Peer Reviewed
• [Journal Article] In Situ Measurement of Surface Potential Developed on MgO Thin Film Surface under Ion Irradiation using Ion Scattering Spectroscopy (2009)
  • Author(s): T.Nagatomi, T.Kuwayama, K.Yoshino, Y.Takai, Y.Morita, M.Nishitani, M.Kitagawa
  • Journal Title: Journal of Applied Physics Vol.106 Pages: 104912-1-104912-11
  • Peer Reviewed
• [Journal Article] Influences of Measurement Conditions on Etching Rate of GaAs/AlAs Superlattice in Auger Electron Spectroscopy Sputter Depth Profiling (2009)
  • Author(s): T.Nagatomi, T.Bungo, Y.Takai
  • Journal Title: Journal of Surface Analysis Vol.15 Pages: 329-332
  • Peer Reviewed
• [Journal Article] Photoemission Electron Spectroscopy I : Histry and Overview (2009)
  • Author(s): J.D.Lee, T.Nagatomi, G.Mizutani K.Endo
  • Journal Title: Journal of Surface Analysis Vol.16 Pages: 42-63
  • Peer Reviewed
• [Journal Article] Photoemission Electron Spectroscopy II : Satellites by Local Excitation (2009)
  • Author(s): J.D.Lee, T.Nagatomi, G.Mizutani, K.Endo
  • Journal Title: Journal of Surface Analysis Vol.16 Pages: 127-152
  • Peer Reviewed
• [Journal Article] Incident Angle and Energy Dependences of Low-Energy Ar^+ Ion Sputtering of GaAs/AlAs Multilayered System (2009)
  • Author(s): T.Nagatomi, T.Bungo, Y.Takai
  • Journal Title: Surface and Interface Analysis Vol.41 Pages: 581-589
  • Peer Reviewed
• [Journal Article] Investigation of Measurement Conditions of Metastable De-excitation Spectroscopy of MgO Thin Films Used for Plasma Display Panels
  • Author(s): K.Yoshino, Y.Morita, T.Nagatomi, M.Terauchi, T.Tsujita, T.Nakayama, Y.Yamauchi
  • Journal Title: Journal of Surface Analysis (in press)
  • Peer Reviewed
• [Presentation] Effects of Heating in Air on Metastable De-Excitation Spectroscopy Spectra of MgO and CaO Films (2010)
  • Author(s): K.Yoshino, Y.Morita, M.Nishitani, T.Nagatomi, Y.Takai, Y.Yamauchi
  • Organizer: 5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
  • Place of Presentation: Gyeongju, Korea.
  • Year and Date: 20101003-20101007
• [Presentation] High Depth Resolution Auger Depth Profiling using a 85^°-High-Angle Inclined Holder (2010)
  • Author(s): T.Ogiwara, T.Nagatomi, K.J.Kim, S.Tanuma
  • Organizer: 5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
  • Place of Presentation: Gyeongju, Korea.
  • Year and Date: 20101003-20101007
• [Presentation] Measurement of Secondary Electron Yield by Charge Amplification Method (2010)
  • Author(s): T.Miyagawa, M.Inoue, T.Iyasu, Y.Hashimoto, K.Goto, R.Shimizu, T.Nagatomi
  • Organizer: 5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
  • Place of Presentation: Gyeongju, Korea.
  • Year and Date: 20101003-20101007
• [Presentation] Band Alignment and Defect States in Amorphous Si-N Compounds on Si Substrates (2010)
  • Author(s): S.Heo, J.G.Chung, H.I.Lee, J.C.Lee, G.S.Park, D.Tahir, S.K.Oh, H.J.Kang, T.Nagatomi, Y.Takai
  • Organizer: 5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
  • Place of Presentation: Gyeongju, Korea.
  • Year and Date: 20101003-20101007
• [Presentation] Surface Defect States of MgO Films (2010)
  • Author(s): S.Heo, J.G.Chung, H.I.Lee, J.C.Lee, G.S. Park, D.Tahir, S.K.Oh, H.J.Kang, T.Nagatomi, Y.Takai
  • Organizer: 5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
  • Place of Presentation: Gyeongju, Korea.
  • Year and Date: 20101003-20101007
• [Presentation] Change in Ion-Induced Secondary Electron Yield of MgO Film Caused by Heating in Air (2010)
  • Author(s): Y.Murasawa, J.Azargal, K.Yoshino, T.Nagatomi, Y.Takai, Y.Morita, M.Nishitani
  • Organizer: 5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
  • Place of Presentation: Gyeongju, Korea.
  • Year and Date: 20101003-20101007
• [Presentation] igh-Sensitive Depth Profiling Analyses of Delta-Doped Layers Specimens with Glancing Angle Irradiation and Detection Method (2010)
  • Author(s): H.Tanishiki, T.Ogiwara, T.Nagatomi, Y.Takai, K.J.Kim, S.Tanuma
  • Organizer: 5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
  • Place of Presentation: Gyeongju, Korea.
  • Year and Date: 20101003-20101007
• [Presentation] High Depth Resolution Auger Depth Profiling Analysis Using Inclined Holder (2010)
  • Author(s): T.Ogiwara, T.Nagatomi, S.Tanuma
  • Organizer: Microscopy & Microanalysis 2010
  • Place of Presentation: Portland, USA.
  • Year and Date: 20100801-20100805
• [Presentation] How do we determine interface width and interface position of depth profile?-Definition in ISO documents and application to practical analysis- (2010)
  • Author(s): T.Nagatomi
  • Organizer: The 1st Meeting of Korean-Chinese-Japanese Cooperative Program on "Materials Research with Emphasis on Activities Relating to VAMAS"
  • Place of Presentation: Deajeon, Korea.
  • Year and Date: 20100308-20100309
• [Presentation] Mechanism of Secondary electron Emission (2010)
  • Author(s): T.Nagatomi
  • Organizer: Korea-Japan PDP Forum 2010
  • Place of Presentation: Jeju, Korea.
  • Year and Date: 20100220-20100221
• [Presentation] Determination of IMFP, SEP and DSEP by absolute REELS analysis (2010)
  • Author(s): T.Nagatomi
  • Organizer: Hungarian-Japanese Joint Working Seminar on Studies of Fundamental Parameter Database and Atomic Processes for High Precision Quantitative Analysis using X-Ray Photoelectron Spectroscopy (in the frame of the bilateral MTA-JSPS scientific research cooperation project)
  • Place of Presentation: Debrecen, Hungary.
  • Year and Date: 2010-10-27
• [Presentation] Members of JSPS141-WG-SEY, "Working Group Report of Database Construction of Secondary Electron Yield (JSPS141-WG-SEY) [I] Precise Measurement by Charge Amplification Method" (2009)
  • Author(s): T.Nagatomi, K.Goto, R.Shimizu
  • Organizer: 7th International Symposium on Atomic Level Characterizations for New Materials and Devices '09 (ALC'09)
  • Place of Presentation: Hawaii, USA.
  • Year and Date: 20091206-20091211
• [Presentation] Absolutely Determined Inelastic Mean Free Pathes for 300-3000 eV Electrons in 10 Elemental Solids (2009)
  • Author(s): T.Nagatomi, S.Tanuma, K.Goto
  • Organizer: 7th International Symposium on Atomic Level Characterizations for New Materials and Devices '09 (ALC'09)
  • Place of Presentation: Hawaii, USA.
  • Year and Date: 20091206-20091211
• [Presentation] In Situ Measurement of Surface Potential Induced on MgO Thin Film Surface under Ion Irradiation using Ion Scattering Spectroscopy (2009)
  • Author(s): T.Nagatomi, T.Kuwayama, K.Yoshino, Y.Morita, M.Nishitani, M.Kitagawa, Y.Takai
  • Organizer: 5th International Workshop on High-Resolution Depth Profiling (HRDP-5)
  • Place of Presentation: Kyoto, Japan.
  • Year and Date: 20091115-20091119
• [Presentation] Electron Inelastic Mean Free Path and Surface Excitation Parameter in 10 Elemental Solids Determined by Absolute REELS analysis over 300-3000 eV Range (2009)
  • Author(s): T.Nagatomi, S.Tanuma, K.Goto
  • Organizer: 13th European Conference on Application of Surface and Interface Analysis (ECASIA'09)
  • Place of Presentation: Antalya, Turkey.
  • Year and Date: 20091018-20091023
• [Presentation] Influence of Wall Charges on Electron Emission from MgO Layer in AC-PDP (2009)
  • Author(s): T.Nagatomi
  • Organizer: Japan-Korea PDP Forum'09
  • Place of Presentation: Kyoto, Japan.
  • Year and Date: 2009-07-11
• [Remarks] ホームページ等
  • URL: http://www-atom.mls.eng.osaka-u.ac.jp/