2010 Fiscal Year Final Research Report
Study on Secondary Electron Emission from Insulator and Construction of Database of Secondary Electron Yield
Project/Area Number |
21686005
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Research Category |
Grant-in-Aid for Young Scientists (A)
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Allocation Type | Single-year Grants |
Research Field |
Thin film/Surface and interfacial physical properties
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Research Institution | Osaka University |
Principal Investigator |
NAGATOMI Takaharu Osaka University, 工学研究科, 助教 (90314369)
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Project Period (FY) |
2009 – 2010
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Keywords | 二次電子 / 絶縁物 / エキソ電子 |
Research Abstract |
We have been developing the exoelectron detection system, and we have succeeded to develop and improve the accuracy of the measurement of the secondary electron yield from insulators by developing and modifying the pulsed-ion beam irradiation system. In addition, we developed the experimental system to measure the variations in the secondary electron yield of practical materials, which are induced by the gas absorption on the sample surface and/or heating the sample. We succeeded to develop the system to quantitatively measure the change in the secondary electron yield of practical materials. Furthermore, we established the working group for the construction of the database of the secondary electron yield in the 141st committee on Microbeam Analysis of Japan Society for the Promotion of Science, and started activities relating to the database construction with the committee members belonging to industrial companies.
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Research Products
(33 results)
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[Presentation] Band Alignment and Defect States in Amorphous Si-N Compounds on Si Substrates2010
Author(s)
S.Heo, J.G.Chung, H.I.Lee, J.C.Lee, G.S.Park, D.Tahir, S.K.Oh, H.J.Kang, T.Nagatomi, Y.Takai
Organizer
5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
Place of Presentation
Gyeongju, Korea.
Year and Date
20101003-20101007
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[Presentation] Surface Defect States of MgO Films2010
Author(s)
S.Heo, J.G.Chung, H.I.Lee, J.C.Lee, G.S. Park, D.Tahir, S.K.Oh, H.J.Kang, T.Nagatomi, Y.Takai
Organizer
5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
Place of Presentation
Gyeongju, Korea.
Year and Date
20101003-20101007
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