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2010 Fiscal Year Final Research Report

Proposal of test data reduction method for scan design facilitating delay fault testing

Research Project

  • PDF
Project/Area Number 21700053
Research Category

Grant-in-Aid for Young Scientists (B)

Allocation TypeSingle-year Grants
Research Field Computer system/Network
Research InstitutionChiba University

Principal Investigator

NAMBA Kazuteru  Chiba University, 大学院・融合科学研究科, 助教 (60359594)

Project Period (FY) 2009 – 2010
Keywordsディペンダブルコンピューティング
Research Abstract

In production of VLSI, manufacturing testing is essential to detect faults. This work targets Chiba scan testing, a class of delay fault testing. This work provided two methods reducing test data volume and test application time for Chiba scan testing to reduce testing cost. One method reduces idling time of scan output. The other reorders scan FF.

  • Research Products

    (4 results)

All 2010 Other

All Journal Article (2 results) (of which Peer Reviewed: 2 results) Presentation (2 results)

  • [Journal Article] Chiba Scan Delay Fault Testing with Short Test Application Time2010

    • Author(s)
      K.Namba, H.Ito
    • Journal Title

      J.Electronic Test. : Theory & Appl. Vol.26, No.

      Pages: 6667-677

    • Peer Reviewed
  • [Journal Article] Scan FF Reordering for Test Volume Reduction in Chiba-Scan Architecture

    • Author(s)
      K.Matsumoto, K.Namba, H.Ito
    • Journal Title

      IPSJ Trans.Syst.LSI Des.Method 掲載予定

    • Peer Reviewed
  • [Presentation] Test Vector Reduction by Reordering Flip-flops for Scan Architecture with Delay Fault Testability, Proc.2010

    • Author(s)
      K.Matsumoto, K.Namba, H.Ito
    • Organizer
      11th IEEE Workshop RTL & High Level Test.pp.111-116
    • Place of Presentation
      Shanghai SHERATON Hotel,中華人民共和国
    • Year and Date
      2010-12-06
  • [Presentation] 千葉大スキャンの接続順序変更によるテストパターン削減手法2010

    • Author(s)
      松本清紀, 難波一輝, 伊藤秀男
    • Organizer
      FTC研究会
    • Place of Presentation
      サンロード吉備路,岡山県
    • Year and Date
      2010-01-22

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Published: 2012-02-13   Modified: 2016-04-21  

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