2010 Fiscal Year Final Research Report
Development of high-sensitivity near-field fluorescence thermal nanoscopy for in-situ measurement of thermophysical properties.
Project/Area Number |
21760163
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Research Category |
Grant-in-Aid for Young Scientists (B)
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Allocation Type | Single-year Grants |
Research Field |
Thermal engineering
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Research Institution | Keio University |
Principal Investigator |
TAGUCHI Yoshihiro Keio University, 理工学部, 専任講師 (30433741)
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Project Period (FY) |
2009 – 2010
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Keywords | 近接場蛍光 / 走査プローブ顕微鏡 / マイクロ・ナノデバイス |
Research Abstract |
Real-time and in situ monitoring of local temperature and thermal properties of nano material is extremely important for the system design of nano devices. In this study, high-sensitivity near-field fluorescence thermal nanoscopy was proposed, and its validity was successfully verified.
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[Presentation] Development of Nanometer Scale Temperature Measurement Method by Polarized Near-field Light2010
Author(s)
Hosaka, S., Kasakake, T., Taguchi, Y., Saiki, T., Nagasaka, Y.
Organizer
9th Asian Thermophysical Properties Conference
Place of Presentation
Beijing, China
Year and Date
2010-10-20
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