2010 Fiscal Year Final Research Report
A microscopic technique for direct analysis of local spin arrangement at ferromagnetic interfaces
| Project/Area Number |
21760243
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Single-year Grants |
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| Research Field |
Electronic materials/Electric materials
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| Research Institution | National Institute of Advanced Industrial Science and Technology |
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Principal Investigator |
KONOTO Makoto National Institute of Advanced Industrial Science and Technology, エレクトロニクス研究部門, 研究員 (80425735)
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| Project Period (FY) |
2009 – 2010
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| Keywords | 電子・電気材料 / スピンエレクトロニクス / 表面・界面物性 / 電子顕微鏡 |
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| Research Abstract |
Various types of spintronic devices based on magnetic functions at thin film interfaces have been extensively studied. Direct measurement of interface spin is crucial to realize such applications, because the device function is governed by local spin orientations at the interface. In this study we have developed a high-resolution microscopic technique capable of quantitative analysis of interface spin arrangement at nanometric resolution.
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