2010 Fiscal Year Final Research Report
Measurement of Volume Resistivity for Dielectric FiIm under Space Simulated Environment
| Project/Area Number |
21760655
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Single-year Grants |
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| Research Field |
Aerospace engineering
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| Research Institution | Musashi Institute of Technology |
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Principal Investigator |
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| Project Period (FY) |
2009 – 2010
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| Keywords | 構造・材料 / 宇宙環境 |
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| Research Abstract |
Volume resistivity of dielectric films under space environment is obtained with a charge storage method. Volume resistivity is calculated from a time history of surface potential where electron beam is irradiated in a vacuum chamber. Effects of experimental parameters such as irradiation energy, dose, temperature, humidity and sample thickness on volume resistivity are investigated. Experimental procedure as standard measurement method for volume resistivity is established.
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