XMCD reflectivity measurement to elucidate magnetic structure in multilayer thin films

2023 Fiscal Year Final Research Report

• Project/Area Number: 21K14539
• Research Category: Grant-in-Aid for Early-Career Scientists
• Allocation Type: Multi-year Fund
• Review Section: Basic Section 29020:Thin film/surface and interfacial physical properties-related
• Research Institution: National Institutes for Quantum Science and Technology (2023); Institute for Molecular Science (2021-2022)
• Principal Investigator: Yamamoto Kohei 国立研究開発法人量子科学技術研究開発機構, 関西光量子科学研究所 放射光科学研究センター, 併任 (30844823)
• Project Period (FY): 2021-04-01 – 2024-03-31
• Keywords: 放射光X線 / 磁性体薄膜

Outline of Final Research Achievements

Magnetic thin films/multilayer films with a complex structure in the depth direction exhibit a variety of magnetic phenomena due to interactions between layers. In order to elucidate the mechanism of the development of magnetic structures in thin films, we installed a measurement device using the reflectance XMCD method using XMCD in the soft X-ray region, and conducted experiments on test samples. The measurement setup is a two-axis reflectometer, equipped with a magnetic field application mechanism using a permanent magnet that moves independently, and can apply a magnetic field in the plane and perpendicular to the sample. Similar measurements were performed across the Co L absorption edge, and XAS/XMCD spectral information and structural information based on reflectance were obtained simultaneously.

Free Research Field

磁性

Academic Significance and Societal Importance of the Research Achievements

磁性体の応用先として重要な記録媒体などにおいても多層膜構造を利用して有用な特性が実現されている。このような磁性体多層膜の磁性分布の深さ方向の直接観測による、薄膜中おける磁気構造の発現機構を解明することに寄与できる。