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2021 Fiscal Year Research-status Report

Elucidation of atomic structure and dynamics of carrier trap sites

Research Project

Project/Area Number 21K18706
Research InstitutionTohoku University

Principal Investigator

長 康雄  東北大学, 電気通信研究所, 教授 (40179966)

Project Period (FY) 2021-07-09 – 2023-03-31
Keywords走査型非線形誘電率顕微鏡 / 走査型非線形誘電率常磁性共鳴顕微鏡 / 間分解 SNDM装置
Outline of Annual Research Achievements

まず走査型非線形誘電率常磁性共鳴顕微鏡(SNDMR)装置を開発を継続している,電子スピン共鳴により励起された反平行スピンを持つ電子がMOS界面の1電子界面準位に更にもう一つトラップされ,トラップされた電荷の増加による空乏層の拡張を起源とした静電容量変化信号(局所ESR信号:SNDMR信号)の検出を行う事を目的に装置の開発を行った.現状ではまだ目的とする信号を得ていないが更なる高感度化に向けて装置の調整を行っている.次に超高周波帯で動作する時間分解(Time Resolved) SNDM装置(TR-SNDM)を新規に設計・製作し,高速な静電容量変化を局所的に検出できるようにした.
磁場は360℃回転でき最大5000Gまでかけられ,温度は極低温(50K)から常温迄コントロール可能とした.
SNDM本体の感度はまだ不足気味であるが,10の-20乗オーダーである.
マイクロ波9GHz~10GHzでESRを観測できるように設計しその後ほぼ完成した。

Current Status of Research Progress
Current Status of Research Progress

2: Research has progressed on the whole more than it was originally planned.

Reason

装置の開発の骨格部分は半年の短期間に拘わらずほぼ完成している.

Strategy for Future Research Activity

まず走査型非線形誘電率常磁性共鳴顕微鏡(SNDMR)装置を開発して完成させこれを用い,電子スピン共鳴により励起された反平行スピンを持つ電子がMOS界面の1電子界面準位に更にもう一つトラップされ,トラップされた電荷の増加による空乏層の拡張を起源とした静電容量変化信号(局所ESR信号:SNDMR信号)の検出を行う.これに成功したら,超高速なキャリアの挙動を捉える事が出来るように,SNDMの動作周波数を可能な限り上昇させる.発振器の基本設計から開発まで行う.即ち現状の1GHz帯で動作するSNDMの動作周波数を上げる事により(i)高速な誘電現象が捉えられること,ii)S/N比の改善,及び(iii)分解能向上を図る.
次に上記で開発した超高周波帯で動作する時間分解(Time Resolved) SNDM装置(TR-SNDM)を新規に設計・製作し,高速な静電容量変化を局所的に検出できるようにする.そして,このTR-SNDM 及びSNDMRの確立の後これらを統合し,最終目標とする,全く前例のない超高周波帯で動作する時間分解走査型非線形誘電率常磁性共鳴顕微鏡法(TR-SNDMR)を完成させ,欠陥の種類の同定を行いつつ,キャリア捕獲・放出過程が実時間で2次元的に観測できるようにする.
この装置をまずその高い界面準位密度(Dit)の為にMOSデバイスのオン抵抗が下がらずこれを解決することが強く望まれているSiO2/SiC MOS界面に適用し,Ditの2次元分布観測のみならず原子レベルでのDitの起源を明らかにする研究を行う.

Causes of Carryover

新型コロナウイルスの影響により、予定していた研究協力者から実験に不可欠な界面欠陥の水準の異なる試料提供の協力が困難との連絡があり、年度内に装置の性能試験を行う事が困難となったため.
当初予定していた試料を入手し実験を行なう.

  • Research Products

    (20 results)

All 2022 2021 Other

All Journal Article (4 results) (of which Peer Reviewed: 4 results) Presentation (15 results) (of which Int'l Joint Research: 15 results,  Invited: 2 results) Remarks (1 results)

  • [Journal Article] Boxcar averaging scanning nonlinear dielectric microscopy2022

    • Author(s)
      Kohei Yamasue and Yasuo Cho
    • Journal Title

      Nanomaterials

      Volume: 12 Pages: 794-1-19

    • DOI

      10.3390/nano12050794

    • Peer Reviewed
  • [Journal Article] High-precision local C-V mapping for ferroelectrics using principal component analysis2021

    • Author(s)
      Yoshiomi Hiranaga, Takanori Mimura, Takao Shimizu, Hiroshi Funakubo and Yasuo Cho
    • Journal Title

      Jpn.J.Appl.Phys.

      Volume: 60 Pages: SFFB09-1-8

    • DOI

      10.35848/1347-4065/ac13d9

    • Peer Reviewed
  • [Journal Article] Flexoelectric nanodomains in rare-earth iron garnet thin films under strain gradient2021

    • Author(s)
      Hiroyasu Yamahara, Bin Feng, Munetoshi Seki, Masaki Adachi, Md Shamim Sarker, Takahito Takeda, Masaki Kobayashi, Ryo Ishikawa, Yuichi Ikuhara, Yasuo Cho & Hitoshi Tabata
    • Journal Title

      COMMUNICATIONS MATERIALS

      Volume: 2 Pages: 95

    • DOI

      10.1038/s43246-021-00199-y

    • Peer Reviewed
  • [Journal Article] Simulation of nanoscale domain growth for ferroelectric recording2021

    • Author(s)
      Kenji Fukuzawa, Yoshiomi Hiranaga and Yasuo Cho
    • Journal Title

      AIP Advances

      Volume: 11 Pages: 115117-1-8

    • DOI

      10.1063/5.0074004

    • Peer Reviewed
  • [Presentation] Local Capacitance-Voltage Profiling on MoS2/SiO2 and MoS2/h-BN/SiO2 by Scanning Nonlinear Dielectric Microscopy Assisted with an Insulating Tip2022

    • Author(s)
      Taiyo Ishizuka, Kohei Yamasue, and Yasuo Cho
    • Organizer
      EDTM 2022
    • Int'l Joint Research
  • [Presentation] Carrier Profile Mapping in a 3D Flash Memory Cell using Scanning Nonlinear Dielectric Microscopy2022

    • Author(s)
      Jun Hirota, Ken Hoshino, Kohei Yamasue, and Yasuo Cho.
    • Organizer
      EDTM 2022
    • Int'l Joint Research / Invited
  • [Presentation] Local Capacitance-Voltage Profiling and Deep Level Transient Spectroscopy of SiO2/SiC Interfaces by Scanning Nonlinear Dielectric Microscopy2021

    • Author(s)
      Kohei Yamasue, Yasuo Cho
    • Organizer
      IPFA2021
    • Int'l Joint Research
  • [Presentation] Local capacitance-voltage profiling and high voltage stress effect study of SiO2/SiC structures by time-resolved scanning nonlinear dielectric microscopy2021

    • Author(s)
      Kohei Yamasue, Koharu Suzuki, Yasuo Cho
    • Organizer
      ESREF2021
    • Int'l Joint Research
  • [Presentation] Nanoscale capacitance-voltage profiling of DC bias induced stress on a high-κ/SiO2/Si gate stack2021

    • Author(s)
      Koharu Suzuki, Kohei Yamasue, Yasuo Cho
    • Organizer
      ESREF2021
    • Int'l Joint Research
  • [Presentation] Nanoscale characterization techniques for ultra-thin van der Waals semiconductors based on scanning nonlinear dielectric microscopy2021

    • Author(s)
      Kohei Yamasue, Yasuo Cho
    • Organizer
      The 5th international symposium on“Elucidation of Next Generation Functional Materials・Surface and Interface Properties”
    • Int'l Joint Research
  • [Presentation] Nanoscale evaluation of Al2O3/diamond MOS interfaces using time-resolved scanning nonlinear dielectric microscopy2021

    • Author(s)
      Y. OGATA, K. YAMASUE, X. ZHANG, T. MATSUMOTO, N. TOKUDA, Y. CHO
    • Organizer
      ECSCRM 2021
    • Int'l Joint Research
  • [Presentation] Surface potential fluctuations of SiO2/SiC interfaces investigated by local capacitance-voltage profiling based on time-resolved scanning nonlinear dielectric microscopy2021

    • Author(s)
      K. YAMASUE, Y. CHO
    • Organizer
      ECSCRM 2021
    • Int'l Joint Research
  • [Presentation] Simultaneous interface defect density and differential capacitance imaging by time-resolved scanning nonlinear dielectric microscopy2021

    • Author(s)
      Kohei Yamasue and Yasuo Cho
    • Organizer
      ISTFA 2021
    • Int'l Joint Research
  • [Presentation] A Scanning Nonlinear Dielectric Microscopic Investigation of Al2O3/Diamond MOS Interfaces2021

    • Author(s)
      Yasuo Cho, Yu Ogata, Kohei Yamasue, Xufang Zhang, Tsubasa Matsumoto, Norio Tokuda
    • Organizer
      2021 MRS Fall Meeting & Exhibit
    • Int'l Joint Research
  • [Presentation] Microscopic Carrier Distribution Imaging of Atomically-Thin van der Waals Semiconductors by Scanning Nonlinear Dielectric Microscopy2021

    • Author(s)
      Yasuo Cho, Kohei Yamasue
    • Organizer
      Microscopic Carrier Distribution Imaging of Atomically-Thin van der Waals Semiconductors by Scanning Nonlinear Dielectric Microscopy
    • Int'l Joint Research
  • [Presentation] Scanning Nonlinear Dielectric Microscopic Investigation of Active Dopant Density Distribution in Black Silicon Solar Cell2021

    • Author(s)
      Yasuo Cho, Beniamino Iandolo, Ole Hansen
    • Organizer
      2021 MRS Fall Meeting & Exhibit
    • Int'l Joint Research
  • [Presentation] Nanoscale study on surface potential fluctuations of SiO2/SiC interfaces by time-resolved scanning nonlinear dielectric microscopy2021

    • Author(s)
      Kohei Yamasue, and Yasuo Cho
    • Organizer
      52th IEEE Semiconductor Interface Specialists Conference
    • Int'l Joint Research
  • [Presentation] Nanoscale Domain Dynamics Characterization Using Local C-V Mapping2021

    • Author(s)
      Yoshiomi Hiranaga and Yasuo Cho
    • Organizer
      The Sixth International Symposium on Dielectric Materials and Applications
    • Int'l Joint Research / Invited
  • [Presentation] Recording Medium Design Aiming at Realizing Ferroelectric Probe Data Storage2021

    • Author(s)
      Yoshiomi Hiranaga and Yasuo Cho
    • Organizer
      The Sixth International Symposium on Dielectric Materials and Applications
    • Int'l Joint Research
  • [Remarks] 誘電ナノデバイス研究室

    • URL

      http://www.d-nanodev.riec.tohoku.ac.jp/

URL: 

Published: 2022-12-28  

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