Novel electronic phases at interfaces of strongly correlated materials studied by soft x-ray dichroism with multi-degrees of freedom

2014 Fiscal Year Final Research Report

• Project/Area Number: 22224005
• Research Category: Grant-in-Aid for Scientific Research (S)
• Allocation Type: Single-year Grants
• Research Field: Condensed matter physics II
• Research Institution: The University of Tokyo
• Principal Investigator: FUJIMORI Atsushi 東京大学, 大学院理学系研究科(理学部), 教授 (10209108)
• Co-Investigator(Kenkyū-buntansha): KUMIGASHIRA Hiroshi 大学共同利用機関法人高エネルギー加速器研究機構, 物質構造科学研究所, 教授 (00345092) ; KOIDE Tsuneharu 大学共同利用機関法人高エネルギー加速器研究機構, 物質構造科学研究所, 准教授 (10150012)
• Project Period (FY): 2010-04-01 – 2015-03-31
• Keywords: 遷移金属酸化物 / 界面 / 超薄膜 / 軟X線磁気円二色性 / 光電子分光 / 線Ｘ線二色性

Outline of Final Research Achievements

Interfaces, superlattices, and ultra-thin films consisting of different correlated electron materials have attracted intensive interest in recent years because of their novel physical properties that are not present in the constituent materials. However, because their volumes are tiny compared to the volumes of the samples, conventional measurements of the physical properties are difficult or impossible. On the other hand, spectroscopic measurements using synchrotron radiation in the soft x-ray region are powerful tools because of their probing depths on the nanometer scale. In the present project, we have developed a measurement system in which the light polarization and the applied magnetic field direction can be varied independently. By combining this system with our in-situ photoemission measurement system, we have successfully observed novel metal-insulator transitions, quantized levels, and magnetic anisotropies of oxide interfaces, superlattices, and ultra-thin films.

Free Research Field

数物系科学