2013 Fiscal Year Final Research Report
Structure analysis of lattice defects in near bulk specimens combining high-voltage electron microscopy and electron energy loss spectroscopy.
| Project/Area Number |
22246090
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| Research Category |
Grant-in-Aid for Scientific Research (A)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Structural/Functional materials
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| Research Institution | Kyushu University |
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Principal Investigator |
HIGASHIDA Kenji 九州大学, 工学(系)研究科(研究院), 教授 (70156561)
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| Co-Investigator(Kenkyū-buntansha) |
TANAKA Masaki (40452809)
MORIKAWA Tatsuya (00274506)
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| Co-Investigator(Renkei-kenkyūsha) |
OHASHI Tetsuya (80312445)
MATSUMURA Syo (60150520)
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| Project Period (FY) |
2010-04-01 – 2014-03-31
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| Keywords | 転位 / 破壊 / 超高圧電子顕微鏡 / 結晶塑性 |
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| Research Abstract |
The key to break though the study on fracture physics in crystalline materials is visualizing and modeling the structures of the large number of lattice defects (mainly dislocations) around the area with large stress intensified such as a crack tip. We succeeded to develop a three-dimensional TEM analysis of dislocation structures in the specimens with the thickness more than 5µm, combining high-voltage electron microscopy and electron energy loss spectroscopy. Tis work contributes to the development of micro-fracture mechanics which take into account the interaction between a crack and dislocations.
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[Journal Article] High-angle triple-axis specimen holder for three-dimensional diffraction contrast imaging in transmission electron microscopy2011
Author(s)
S. Hata, H. Miyazaki, S. Miyazaki, M. Mitsuhara, M. Tanaka, K. Kaneko, K. Higashida, K. Ikeda, H. Nakashima, S. Matsumura, J.S. Barnard, J.H. Sharp, P.A. Midgley
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Journal Title
Ultramicroscopy
Volume: 111
Pages: 1168-1175.
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[Presentation]2013
Author(s)
M. Tanaka, K. Higashida
Organizer
The International Union of Materials Research Societies -International Conference in Asia 2013 (IUMRS-ICA-2013)
Place of Presentation
Indian Institue of Science, Bangalore, India
Year and Date
20131216-20
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[Presentation]2013
Author(s)
M. Tanaka, K. Higashida
Organizer
Electron Microscopy & Multiscale Modeling 2013 (EMMM2013)
Place of Presentation
Kyoto University, Kyoto, Japan
Year and Date
20131110-13
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[Presentation]2012
Author(s)
M. Tanaka, T. Onomoto, T. Tsuchiyama, K. Higashida
Organizer
International Symposium on Materials Science and Engineering
Place of Presentation
Kyushu University, Fukuoka, Japan
Year and Date
20120607-08
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[Presentation]2012
Author(s)
M. Tanaka, ium K. Higashida
Organizer
The 3rd International Symposon Steel Science (ISSS2012)
Place of Presentation
Kansai Ceminar House, Kyoto, Japan
Year and Date
20120527-30
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[Presentation]2012
Author(s)
M. Tanaka, K. Higashida
Organizer
Workshop on the collaboration of application of electron microscopy
Place of Presentation
Universiti Teknologi Malaysia, Kuala Lumpur, Malaysia
Year and Date
20120509-10
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[Presentation]2012
Author(s)
S. Sadamatsu, H. Nakamura, S. Inoue, M. Tanaka, K. Higashida
Organizer
International Symposium on Role of Electron Microscopy in Industry ~Toward Genuine Collaboration Between Academia and Industry~
Place of Presentation
Nagoya University, Nagoya, Japan
Year and Date
20120119-20
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