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2012 Fiscal Year Final Research Report

Study on nanoscale chemical reactions and reaction sites using quantum beams

Research Project

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Project/Area Number 22246128
Research Category

Grant-in-Aid for Scientific Research (A)

Allocation TypeSingle-year Grants
Section一般
Research Field Nuclear engineering
Research InstitutionOsaka University

Principal Investigator

KOZAWA Takahiro  大阪大学, 産業科学研究所, 教授 (20251374)

Co-Investigator(Kenkyū-buntansha) YANG Jinfeng  大阪大学, 産業科学研究所, 准教授 (90362631)
KOBAYASHI Kazuo  大阪大学, 産業科学研究所, 助教 (30116032)
YAMAMOTO Hiroki  大阪大学, 産業科学研究所, 助教 (00516958)
Project Period (FY) 2010 – 2012
Keywords放射線 / X 線 / 粒子線 / 半導体超微細化 / シミュレーション工学 / 計算物理
Research Abstract

In the high-volume production lines of semiconductor devices, high-resolution and high-throughput manufacturing has been achieved through the combination of expensive high-quality quantum beam and inexpensive low-quality thermal energy. In this study, nanoscale chemical reactions and reaction sites were investigated by using state-of-the-art quantum beams such as electron beam, laser, extreme ultraviolet (EUV) radiation, and X-ray. On the basis of the obtained knowledge, Monte Carlo simulation code was developed.

  • Research Products

    (21 results)

All 2013 2012 2011 2010 Other

All Journal Article (16 results) (of which Peer Reviewed: 16 results) Presentation (4 results) Remarks (1 results)

  • [Journal Article] Chemical Gradient of Contact Hole Latent Image Created in Chemically Amplified ExtremeUltraviolet Resists2013

    • Author(s)
      T. Kozawa and T. Hirayama
    • Journal Title

      Jpn. J. Appl. Phys

      Volume: 52巻 Pages: 046502

    • DOI

      DOI:10.7567/JJAP.52.046502.

    • Peer Reviewed
  • [Journal Article] Electron and Hole Transfer in Anion-Bound Chemically Amplified Resists Used in ExtremeUltraviolet Lithography2013

    • Author(s)
      Y. Komuro, H. Yamamoto, Y. Utsumi, K. Ohomori, and T. Kozawa
    • Journal Title

      Appl. Phys. Express

      Volume: 6巻 Pages: 014001

    • DOI

      DOI:10.7567/APEX.6.014001

    • Peer Reviewed
  • [Journal Article] Theoretical Study on Acid Diffusion Length in Chemically Amplified Resists Used for Extreme Ultraviolet Lithography2013

    • Author(s)
      T. Kozawa
    • Journal Title

      Jpn. J. Appl. Phys

      Volume: 52巻 Pages: 016501

    • DOI

      DOI:10.7567/JJAP.52.016501

    • Peer Reviewed
  • [Journal Article] Effect of Molecular Weight and Protection Ratio on Latent Image Fluctuation of Chemically Amplified ExtremeUltraviolet Resists2012

    • Author(s)
      T. Kozawa
    • Journal Title

      Jpn. J. Appl. Phys

      Volume: 51巻 Pages: 126501

    • DOI

      DOI:10.1143/JJAP.51.126501

    • Peer Reviewed
  • [Journal Article] Stochastic Effect of Acid Catalytic Chain Reaction in Chemically Amplified Extreme Ultraviolet Resists2012

    • Author(s)
      T. Kozawa
    • Journal Title

      Jpn. J. Appl. Phys

      Volume: 51巻 Pages: 116503

    • DOI

      DOI:10.1143/JJAP.51.116503

    • Peer Reviewed
  • [Journal Article] Resist Properties Required for 6.67nm Extreme Ultraviolet Lithography2012

    • Author(s)
      T. Kozawa and A. Erdmann
    • Journal Title

      Jpn. J. Appl. Phys

      Volume: 51巻 Pages: 106701

    • DOI

      DOI:10.1143/JJAP.51.106701

    • Peer Reviewed
  • [Journal Article] Effect of Ultrahigh-Density Ionization of Resist Films on Sensitivity Using Extreme-Ultraviolet Free-Electron Laser2012

    • Author(s)
      K. Okamoto, T. Kozawa, K. Oikawa, T. Hatsui, M. Nagasono, T. Kameshima, T. Togashi, K. Tono, M. Yabashi, H. Kimura, Y. Senba, H. Ohashi, R. Fujiyoshi, and T. Sumiyoshi
    • Journal Title

      Appl. Phys. Express

      Volume: 5巻 Pages: 096701

    • DOI

      DOI:10.1143/APEX.5.096701

    • Peer Reviewed
  • [Journal Article] Relationship between Absorption Coefficient and Line Edge Roughness of Chemically Amplified Resists Used for Extreme Ultraviolet Lithography2012

    • Author(s)
      T. Kozawa
    • Journal Title

      J. Photopolym. Sci. Technol

      Volume: 25巻 Pages: 625-631

    • Peer Reviewed
  • [Journal Article] Relationship between Stochastic Effect and Line Edge Roughness in Chemically Amplified Resists for Extreme Ultraviolet Lithography Studied by Monte Carlo Simulation2012

    • Author(s)
      T. Kozawa
    • Journal Title

      Jpn. J. Appl. Phys

      Volume: 51巻 Pages: 086504

    • DOI

      DOI:10.1143/JJAP.51.086504

    • Peer Reviewed
  • [Journal Article] Lower Limit of Line Edge Roughness in High-Dose Exposure of Chemically Amplified Extreme Ultraviolet Resists2012

    • Author(s)
      T. Kozawa
    • Journal Title

      Jpn. J. Appl. Phys

      Volume: 51巻 Pages: 06FC01

    • DOI

      DOI:10.1143/JJAP.51.06FC01

    • Peer Reviewed
  • [Journal Article] Effect of Acid Generator Decomposition during Exposure on Acid Image Quality of Chemically Amplified Extreme Ultraviolet Resists2011

    • Author(s)
      T. Kozawa and S. Tagawa
    • Journal Title

      Jpn. J. Appl. Phys

      Volume: 50巻 Pages: 076505

    • DOI

      DOI:10.1143/JJAP.50.076505

    • Peer Reviewed
  • [Journal Article] Assessment and Extendibility of Chemically Amplified Resists for Extreme Ultraviolet Lithography: Consideration of Nanolithography beyond 22nm Half-Pitch2011

    • Author(s)
      T. Kozawa, H. Oizumi, T. Itani, and S. Tagawa
    • Journal Title

      Jpn. J. Appl. Phys

      Volume: 50巻 Pages: 076503

    • DOI

      DOI:10.1143/JJAP.50.076503

    • Peer Reviewed
  • [Journal Article] Analysis of Dose-Pitch Matrices of Line Width and Edge Roughness of Chemically Amplified Fullerene Resist2011

    • Author(s)
      T. Kozawa, H. Oizumi, T. Itani, and S. Tagawa
    • Journal Title

      Jpn. J. Appl. Phys

      Volume: 50巻 Pages: 126501

    • DOI

      DOI:10.1143/JJAP.50.126501

    • Peer Reviewed
  • [Journal Article] Diffusion Control Using Matrix Change during Chemical Reaction for Inducing Anisotropic Diffusion in Chemically Amplified Resists2010

    • Author(s)
      T. Kozawa, H. Oizumi, T. Itani, and S. Tagawa
    • Journal Title

      Jpn. J. Appl. Phys

      Volume: 49巻 Pages: 036506

    • DOI

      DOI:10.1143/JJAP.49.036506

    • Peer Reviewed
  • [Journal Article] Reconstruction of Latent Images from Dose-Pitch Matrices of Line Width and Edge Roughness of Chemically Amplified Resist for Extreme Ultraviolet Lithography2010

    • Author(s)
      T. Kozawa, H. Oizumi, T. Itani, and S. Tagawa
    • Journal Title

      Jpn. J. Appl. Phys

      Volume: 49巻 Pages: 066504

    • DOI

      DOI:10.1143/JJAP.49.066504

    • Peer Reviewed
  • [Journal Article] Dynamics of Radical Cation of Poly(4-hydroxystyrene)-Based Chemically Amplified Resists for Extreme-Ultraviolet and Electron Beam Lithographies2010

    • Author(s)
      K. Okamoto, M. Tanaka, T. Kozawa, and S. Tagawa
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 49巻 Pages: 106501

    • DOI

      DOI:10.1143/JJAP.49.106501

    • Peer Reviewed
  • [Presentation] Resist properties required for 6.67 nm extreme ultraviolet lithography2012

    • Author(s)
      T. Kozawa
    • Organizer
      10th Fraunhofer IISB Lithography Simulation Workshop
    • Place of Presentation
      Hersbruck, Germany
    • Year and Date
      2012-09-21
  • [Presentation] Status and Challenge of Chemically Amplified Resists for Extreme Ultraviolet Lithography2012

    • Author(s)
      T. Kozawa
    • Organizer
      2012 International Workshop on EUVL
    • Place of Presentation
      Maui, Hawaii, USA
    • Year and Date
      2012-06-06
  • [Presentation] Theoretical study of 11-nm-fabrication using 6.67-nm EUV lithography2011

    • Author(s)
      T. Kozawa, and A. Erdmann
    • Organizer
      9th Fraunhofer IISB Lithography Simulation Workshop
    • Place of Presentation
      Hersbruck, Germany
    • Year and Date
      2011-09-16
  • [Presentation] Analysis of Chemical Reactions Induced in Chemically Amplified Extreme Ultraviolet Resists2010

    • Author(s)
      T. Kozawa, H. Oizumi, T. Itani, and S. Tagawa
    • Organizer
      European Symposium of Photopolymer Science
    • Place of Presentation
      Mulhouse, France
    • Year and Date
      2010-11-30
  • [Remarks]

    • URL

      http://www.sanken.osaka-u.ac.jp/labs/bms/

URL: 

Published: 2014-08-29  

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