Development ofhigh-angle triple-axis specimen holders for spherical aberration-corrected electron microscopes

2012 Fiscal Year Final Research Report

• Project/Area Number: 22310068
• Research Category: Grant-in-Aid for Scientific Research (B)
• Allocation Type: Single-year Grants
• Section: 一般
• Research Field: Nanomaterials/Nanobioscience
• Research Institution: Kyushu University
• Principal Investigator: HATA Satoshi 九州大学, 総合理工学研究院, 准教授 (60264107)
• Co-Investigator(Renkei-kenkyūsha): MITSUHARA Masatoshi 九州大学, 大学院・総合理工学研究院, 助教 (10514218) ; IKEDA Ken-ichi 九州大学, 大学院・総合理工学研究院, 助教 (20335996) ; NAKASHIMA Hidaharu 九州大学, 大学院・総合理工学研究院, 教授 (80180280)
• Project Period (FY): 2010 – 2012
• Keywords: 3次元観察 / トモグラフィー / 球面収差補整 / 試料ホルダー / 電子顕微鏡

Research Abstract

A high-angle triple-axis specimen holder capable of high-resolution three-dimensional (3D) transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) has been developed. This specimen holder can align a spherical aberration-corrected lens system without exchanging specimens. This function is effective for reducing influences of thermal-drift and magnetism of magnetic samples.

Research Products

• [Journal Article] Schryvers Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films: an electron tomography and aberration-correctedhigh-resolution ADF-STEM study (2011)
  • Author(s): H. Idrissi, S. Turner, M.Mitsuhara, B. Wang, S. Hata, M. Coulombier, J.-P. Raskin, T. Pardoen, G. Van Tendeloo, D.
  • Journal Title: Microscopy and Microanalysis Volume: Vol.17, Issue9 Pages: 983-990
  • DOI: DOI:10.1017/S143192761101213X
  • Peer Reviewed
• [Journal Article] High-angle triple-axis specimen holder for three-dimensional diffraction contrast imaging in transmission electron microscopy (2011)
  • Author(s): S. Hata, H. Miyazaki, S. Miyazaki, M. Mitsuhara, M. Tanaka, K. Kaneko, K. Higashida, K. Ikeda, H. Nakashima, S. Matsumura, J. S. Barnard, J. H. Sharp, P. A. Midgley
  • Journal Title: Ultramicroscopy Volume: Vol. 111 Pages: 1168-1175
  • DOI: DOI:10.1016/j.ultramic.2011.03.021.
  • Peer Reviewed
• [Journal Article] 電子線トモグラフィーによる転位の三次元可視化技術 (2010)
  • Author(s): 田中將己、東田賢二、金子賢治、光原昌寿、波多聰
  • Journal Title: 顕微鏡 Volume: Vo l. 45、No. 2 Pages: 103-108
  • URL: http://www.microscopy.or.jp/magazine/45_2/pdf/45-2-103.pdf
  • Peer Reviewed
• [Journal Article] 電子線トモグラフィーによる格子欠陥の3次元可視化 (2010)
  • Author(s): 波多聰、光原昌寿、田中將己、宮崎裕也、池田賢一、金子賢治、中島英治、東田賢二、松村晶
  • Journal Title: まてりあ Volume: 第49巻、第6号 Pages: 274-279
  • Peer Reviewed
• [Presentation] Electron tomography observations of dislocations near a symmetric tilt boundary in a deformed Mo bicrystal、 (2012)
  • Author(s): S. Hata, R. Akiyoshi, M. Mitsuhara, K. Ikeda, Y. Miyajima, H. Nakashima, M. Kato
  • Organizer: The 5th International Symposium on Designing, Processing and Properties of Advanced Engineering Materials (ISAEM-2012)
  • Place of Presentation: Toyohashi, Japan
  • Year and Date: 20121105-08
• [Presentation] 電子線トモグラフィーによる結晶格子欠陥の3次元観察 (2012)
  • Author(s): 波多聰
  • Organizer: 精密工学会2012年度秋季大会
  • Place of Presentation: 九州工業大学戸畑キャンパス
  • Year and Date: 2012-09-16
• [Presentation] Electron Tomography Observation of Grain Boundary/Dislocation Interactions: Technical Developments and an Application to a Mo Bicrystal (2012)
  • Author(s): S. Hata, Y. Chihara, R. Akiyoshi, M. Mitsuhara, K. Ikeda, H. Nakashima, Y. Miyajima, M. Kato
  • Organizer: International Workshop on Bulk Nanostructured Metals
  • Place of Presentation: Kyoto University, Kyoto, Japan
  • Year and Date: 2012-06-28
• [Presentation] Fitting tomography-based transmission electron microscopy (TEM) to structural material problems: toward effective 3D TEM imaging and analysis (2012)
  • Author(s): S. Hata, R. Akiyoshi, K. Ogata, M. Mitsuhara, K. Ikeda, H. Nakashima, S. Matsumura, M. Doi, M. Murayama
  • Organizer: NIMS Conference 2012, Structural Materials Science and Strategy for Sustainability -Back to the Basics-
  • Place of Presentation: Epochal Tsukuba, Tsukuba, Ibaraki, Japan
  • Year and Date: 2012-06-05
• [Presentation] Mo双結晶の圧縮変形で生じた粒界近傍の転位の3次元観察 (2011)
  • Author(s): 波多聰、千原裕基、光原昌寿、池田賢一、中島英治
  • Organizer: 日本金属学会2011年秋期(第149回)大会
  • Place of Presentation: 沖縄コンベンションセンター
  • Year and Date: 20111107-09
• [Presentation] High-angle triple-axis specimen holders developed for electron tomography (2011)
  • Author(s): S. Hata, H. Miyazaki, S. Miyazaki, M. Mitsuhara, S. Matsumura, K. Kimoto, K. Ikeda, H. Nakashima
  • Organizer: International Conference on Electron Nanoscopy & XXXII Annual Meeting of EMSI
  • Place of Presentation: Hyderabad, India
  • Year and Date: 20110706-08
• [Presentation] 鉄鋼研究におけるSTEMイメージングと3次元トモグラフィーの応用 (2011)
  • Author(s): 波多聰
  • Organizer: 日本鉄鋼協会 鉄鋼科学セミナー2010「鉄の強度、塑性と破壊:新しい要求に向けた基礎と新規アプローチ」
  • Place of Presentation: コープビル、東京
  • Year and Date: 2011-12-07
• [Presentation] Quantitative microstructural analysis in metallic materials using electron tomography (2011)
  • Author(s): S. Hata, S. Matsumura, N. Kuwano
  • Organizer: 12th KIM/JIM Joint Symposium, Electron Microscopy for Materials Science -The next generation of electron microscopy in the field of materials science-、
  • Place of Presentation: Okinawa Convention Center, Ginowan, Okinawa, Japan
  • Year and Date: 2011-11-06
• [Presentation] 電子顕微鏡による結晶内部ナノ構造の3次元可視化技術、 (2011)
  • Author(s): 波多聰
  • Organizer: 九州大学 総理工セミナー
  • Place of Presentation: 千里阪急ホテル 大阪府豊中市
  • Year and Date: 2011-09-16
• [Presentation] 先端電子顕微鏡解析法の可能性 (2011)
  • Author(s): 波多聰
  • Organizer: 日本金属学会セミナー「バルクナノメタル 構造用金属材料の新たな可能性」
  • Place of Presentation: 神田エッサム こだまホール 東京都千代田区
  • Year and Date: 2011-09-14
• [Presentation] Effectiveness of modern conventional electron microscopy for materials research (2011)
  • Author(s): S. Hata
  • Organizer: National Seminar and Workshop, Applied Chemistry Indonesia, "Applied Chemistry Research for Supporting Sciences-based Innovation Development"
  • Place of Presentation: Serpong, Indonesia
  • Year and Date: 2011-05-24
• [Presentation] Ni基合金のHVEM-EELSトモグラフィー観察の試み (2011)
  • Author(s): 波多聰、緒方啓丞、大尾岳史、松村晶、池田賢一、中島英治、安田和弘、土井稔
  • Organizer: 日本顕微鏡学会第67回学術講演会
  • Place of Presentation: 福岡国際会議場
  • Year and Date: 2011-05-16
• [Presentation] TEMによる転位の3次元分布観察 (2011)
  • Author(s): 波多聰
  • Organizer: PF研究会「X線トポグラフィーの現状と展望」
  • Place of Presentation: つくば市
  • Year and Date: 2011-01-11
• [Presentation] Development of 3D TEM imaging techniques using diffraction contrast (2010)
  • Author(s): S. Hata, M. Mitsuhara, M. Tanaka, K. Kaneko, K. Higashida, K. Ikeda, H. Nakashima, T. Daio, S. Matsumura
  • Organizer: The 17th International Microscopy Congress (IMC17)
  • Place of Presentation: Rio de Janeiro, Brazil
  • Year and Date: 20100919-24
• [Presentation] Dislocation electron tomography of boundaries in deformed aluminum (2010)
  • Author(s): A. Ramar, S. Hata, X. Huang, R. E. Dunin-Borkowski, G. Winther
  • Organizer: 31st Riso International Symposium on Materials Science: Challenges in materials science and possibilities in 3D and 4D characterization techniques、
  • Place of Presentation: Riso, DTU, Denmark
  • Year and Date: 20100906-10
• [Presentation] 金属材料のTEMトモグラフィー観察における進展 (2010)
  • Author(s): 波多聰
  • Organizer: 平成22年度日本顕微鏡学会北海道支部学術講演会
  • Place of Presentation: 酪農学園大学、北海道江別市
  • Year and Date: 2010-12-11
• [Presentation] Three-dimensional microstructural observation in crystalline materials by transmission electron microscopy (2010)
  • Author(s): S. Hata, M. Mitsuhara, T. Kawai, K. Ogata, K. Ikeda, H. Nakashima, M. Nishida, S. Matsumura, T. Daio, M. Doi, H. Miyazaki
  • Organizer: MRS Fall Meeting 2010
  • Place of Presentation: Boston, USA
  • Year and Date: 2010-12-02
• [Presentation] TEM-CTの分解能における課題:材料系の立場から (2010)
  • Author(s): 波多聰、光原昌寿、緒方啓丞、池田賢一、中島英治、吉永憲人、松村晶
  • Organizer: 日本鉄鋼協会第160回秋季講演大会材料の組織と特性部会 階層的3D4D解析に基づく材料信頼性向上フォーラムシンポジウム3D/4Dイメージングの現状と展望:共通基盤技術の形成に向けて、
  • Place of Presentation: 北海道大学
  • Year and Date: 2010-09-27
• [Presentation] TEMトモグラフィーによる金属材料評価 (2010)
  • Author(s): 波多聰、光原昌寿、池田賢一、中島英治、松村晶、宮崎裕也
  • Organizer: 第71回応用物理学会学術講演会 シンポジウム「材料分野における量子ビーム応用の進展」
  • Place of Presentation: 長崎大学、長崎県
  • Year and Date: 2010-09-13
• [Presentation] 高傾斜3軸試料ホルダーとその応用 (2010)
  • Author(s): 波多聰、光原昌寿、緒方啓丞、池田賢一、中島英治、宮崎裕也
  • Organizer: 日本顕微鏡学会第66回学術講演会
  • Place of Presentation: 名古屋国際会議場
  • Year and Date: 2010-05-24
• [Remarks]
  • URL: http://melbuild.com/