Development of a new soft-ionization method of organic molecules on surfaces for imaging mass spectrometry

2012 Fiscal Year Final Research Report

• Project/Area Number: 22550091
• Research Category: Grant-in-Aid for Scientific Research (C)
• Allocation Type: Single-year Grants
• Section: 一般
• Research Field: Analytical chemistry
• Research Institution: National Institute of Advanced Industrial Science and Technology
• Principal Investigator: FUJIWARA Yukio 独立行政法人産業技術総合研究所, 計測フロンティア研究部門, 主任研究員 (60415742)
• Project Period (FY): 2010 – 2012
• Keywords: 表面分析 / 質量分析 / ソフトイオン化

Research Abstract

Secondary ion mass spectrometry (SIMS) is a powerful technique for characterizing surfaces. In the present study, we fabricated an apparatus for producing a beam of multiply-charged droplets that contain hydrogen and hydrocarbon, thereby investigating siz

Research Products

• [Journal Article] Emission characteristics of a charged-droplet beam source using vacuum electrospray of an ionic liquid (2013)
  • Author(s): Yukio Fujiwara, Naoaki Saito, Hidehiko Nonaka, Shingo Ichimura
  • Journal Title: Surface and Interface Analysis Volume: 45巻 Pages: 517-521
  • DOI: DOI: 10.1002/sia.5071
  • Peer Reviewed
• [Presentation] Charged-droplet beam source using vacuum electrospray of an ionic liquid for secondary ion mass spectrometry (SIMS) (2012)
  • Author(s): 藤原幸雄
  • Organizer: 19th International Mass Spectrometry Conference (IMSC 2012)
  • Place of Presentation: 国立京都国際会館(京都市)
  • Year and Date: 2012-09-17
• [Presentation] Development of an ion beam source for Cluster SIMS using vacuum electrospray of an ionic liquid (2011)
  • Author(s): 藤原幸雄
  • Organizer: 18th International Conference on Secondary Ion Mass Spectrometry
  • Place of Presentation: トレント市(伊国)
  • Year and Date: 2011-09-21
• [Presentation] Application of an electrospray technique to Secondary Ion Mass Spectrometry (SIMS) (2010)
  • Author(s): 藤原幸雄
  • Organizer: American Vacuum Society 57th International Symposium
  • Place of Presentation: アルバカーキ市(米国)
  • Year and Date: 2010-10-19