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2012 Fiscal Year Final Research Report

Nanofabrication and Strengthening of Silicon Single Crystal by UsingSPM

Research Project

  • PDF
Project/Area Number 22560124
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field Production engineering/Processing studies
Research InstitutionAichi Institute of Technology

Principal Investigator

TAKAGI Makoto  愛知工業大学, 工学部, 教授 (40288428)

Co-Investigator(Kenkyū-buntansha) MATSUMURO Akihito  愛知工業大学, 工学部, 教授 (80173889)
Project Period (FY) 2010 – 2012
KeywordsMEMS / シリコン / ナノ加工 / SPM / 機械的性質
Research Abstract

Change in microstructure and mechanical properties of a Si surface after scanning-scratching tests under a very small loading force in an AFM was investigated by cross-sectional TEM observations and nano-indentation test. Amorphous Si phase and dislocations were generated by scratching, and amorphous Si phase was removed during scanning-scratching. The scratched sub-surface got harder.

  • Research Products

    (10 results)

All 2012 2011 2010

All Journal Article (3 results) (of which Peer Reviewed: 3 results) Presentation (7 results)

  • [Journal Article] Nanostructures of Low-Resistivity SiliconWafer with High-Aspect-RatioUsing CarbonNanotube Probe of Scanning Tunneling Microscope2012

    • Author(s)
      A. Matsumuro, M. Takagi, Fabrication of
    • Journal Title

      Proceedings of 2012 MRS FallMeeting

    • Peer Reviewed
  • [Journal Article] High-Aspect-Ratio Nanofabrication of Carbon Materials Using CNT Probe and TEM in-situ Observations of Their Process2011

    • Author(s)
      A.Matsumuro, M.Takagi
    • Journal Title

      Proc. The 11th euspen International Conference

      Pages: 451-454

    • Peer Reviewed
  • [Journal Article] High-Aspect-RatioNanofabrication Using Carbon NanotubeProbe in Scanning Tunneling Microscope2010

    • Author(s)
      A.Matsumuro, M.Takagi
    • Journal Title

      Proceedings of the 10th euspen InternationalConference

      Pages: 282-285.

    • Peer Reviewed
  • [Presentation] AFM を用いた Si 単結晶のナノトライボロ ジーに及ぼす環境の影響2012

    • Author(s)
      櫻井淳平、高木 誠、松室昭仁、岩田博之
    • Organizer
      精密工学会秋 季大会講演論文集
    • Place of Presentation
      北九州.
    • Year and Date
      2012-09-14
  • [Presentation] A. Matsumuro, H. Iwata, H. Saka, Microstructural Change and Work-hardening of Sub-surface of Silicon Single Crystal Scratched under a Very Small Loading Forceby AFM2012

    • Author(s)
      M. Takagi
    • Organizer
      Abstract of International Symposium on Role of Electron Microscopy in Industry, p2
    • Place of Presentation
      名古屋
    • Year and Date
      2012-01-19
  • [Presentation] M. Takagi, Y. Tokuda, Increasing Method of Hydrogen Exfoliation Area on The Surface of Silicon2012

    • Author(s)
      H. Iwata
    • Organizer
      Abstract of International Symposium on Role of Electron Microscopy in Industry, p12
    • Place of Presentation
      名古屋
    • Year and Date
      2012-01-19
  • [Presentation] 真空加熱下における AFM による Si 単結晶のナノ加工2011

    • Author(s)
      若山大輔、高木 誠、松室昭仁、岩田博之
    • Organizer
      精密工学会秋季大会 講演論文集
    • Place of Presentation
      金沢
    • Year and Date
      2011-09-20
  • [Presentation] 電圧印加に伴うナノスケール現象の TEM 内その場観察2010

    • Author(s)
      江間弘崇、高木誠、松室昭仁、岩田博之
    • Organizer
      日本機械学会第2回マイクロ・ナノ工学シンポジウム講演論文集
    • Place of Presentation
      松江
    • Year and Date
      2010-10-15
  • [Presentation] CNT 探針を 用いた STM によるカーボン材料の高アス ペクト比ナノスケール加工2010

    • Author(s)
      岩見裕介、高木誠、松室昭仁
    • Organizer
      日本機械学 会第2回マイクロ・ナノ工学シンポジウ ム講演論文集、pp181-182
    • Place of Presentation
      松江
    • Year and Date
      2010-10-15
  • [Presentation] CNT を用いた STM による低抵抗 Si のナノ 加工と原理の解明2010

    • Author(s)
      神戸健吾、松室昭仁、高木 誠、岩田博之
    • Organizer
      精密工学会秋季大会 講演論文集
    • Place of Presentation
      北九州
    • Year and Date
      2010-09-14

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Published: 2014-08-29  

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