2012 Fiscal Year Final Research Report
Self-Calibration, Testing, Diagnosis and Repairing Techniques ofNano-CMOS Analog Circuits
| Project/Area Number |
22560319
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Electron device/Electronic equipment
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| Research Institution | Gunma University |
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Principal Investigator |
KOBAYASHI Haruo 群馬大学, 大学院・工学研究科, 教授 (20292625)
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| Project Period (FY) |
2010 – 2012
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| Keywords | 集積回路 / ナノCMOS / アナログ / 自己校正 / LSI テスト |
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| Research Abstract |
Several techniques for self-calibration, testing, diagnosis and repairing have been developed and verified for analog/mixed-signal integrated circuits (such as pipelined ADC, cyclic ADC, SAR ADC, interleaved ADC, Time-to-Digital converter circuits) with nano-CMOS technology.
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Research Products
(14 results)
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[Presentation] Multi-bit Sigma-Delta TDC Architecture with Self-Calibration2012
Author(s)
S. Uemori, M. Ishii, H. Kobayashi, Y. Doi, Os. Kobayashi, T. Matsuura, K. Niitsu, Y. Arakawa, D. Hirabayashi, Y. Yano, T. Gake, N. Takai, T. Yamaguchi
Organizer
IEEE Asia Pacific Conference on Circuits and Systems
Place of Presentation
Kaohsiung, Taiwan
Year and Date
2012-12-05
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[Presentation] Multi-bit Sigma-Delta TDC Architecture for Digital Signal Timing Measurement2012
Author(s)
S. Uemori, M. Ishii, H. Kobayashi, Y. Doi, O. Kobayashi, T. Matsuura, K. Niitsu, F. Abe, D. Hirabayashi
Organizer
IEEE International Mixed-Signals, Sensors, and Systems Test Workshop
Place of Presentation
Taipei, Taiwan
Year and Date
2012-05-15
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[Presentation] Low-Distortion Single-Tone and Two-Tone Sinewave Generation Algorithms Using an Arbitrary Waveform Generator2011
Author(s)
K. Wakabayashi, T. Yamada, S. Uemori, O. Kobayashi, K. Kato, H. Kobayashi, K. Niitsu, H. Miyashita, S. Kishigami, K. Rikino, Y. Yano, T. Gake
Organizer
IEEE International Mixed-Signals, Sensors, and Systems Test Workshop
Place of Presentation
Santa Barbara, CA
Year and Date
2011-05-16
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