2012 Fiscal Year Final Research Report
Nano-scale displacement measurement by fusing optical millimeter wave technology and two-photon absorption phenomenon
| Project/Area Number |
22560413
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Measurement engineering
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| Research Institution | Tokyo University of Agriculture and Technology |
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Principal Investigator |
TANAKA Yosuke 東京農工大学, 大学院・工学研究院, 順教授 (20283343)
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| Co-Investigator(Kenkyū-buntansha) |
KUROKAWA Takashi 東京農工大学, 大学院・工学研究院, 教授 (40302913)
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| Project Period (FY) |
2010 – 2012
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| Keywords | 二光子吸収 / 光ミリ波 / 変位計測 |
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| Research Abstract |
Nano-precision measurement is required for measuring sample thickness and surface roughness in the field of nano-material production process, bio technology and otheres, where the measurement range is usually limited to within several μm. In this study, we proposed a novel measurement method that uses a light called optical millimeter wave and a nonlinear phenomenon known as two-photon absorption process, and then experimentally confirmed the possibility of nano-precision measurement. Furthermore, we developed the same method into a system for measuring the reflection point of an optical fiber at several 10 km away within an error of several meters.
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