2012 Fiscal Year Final Research Report

Quantitative characterization of Nanogranular film using contrast variation between small-angle X-ray and neutron scattering

Research Project

Project/Area Number	22604003
Research Category	Grant-in-Aid for Scientific Research (C)
Allocation Type	Single-year Grants
Section	一般
Research Field	Quantum beam science
Research Institution	Kyoto University (2012) National Institute for Materials Science (2010-2011)
Principal Investigator	OBA Yojiro 京都大学, 原子炉実験所, 助教 (60566793)
Co-Investigator(Kenkyū-buntansha)	ABE Seishi 電磁材料研究所, 光材料グループ, 主席研究員 (20202666) OHNUMA Shigehiro 電磁材料研究所, 素形材開発材料グループ, 主席研究員 (50142633) OHNUMA Masato 物質・材料研究機構, 量子ビームユニット, 主席研究員 (90354208) SUZUKI Jun-ichi 総合科学研究機構, 東海事業センター, 主任研究員 (40354899)
Project Period (FY)	2010 – 2012
Keywords	中性子小角散乱 / X線小角散乱 / ナノグラニュラー / 合金コントラスト変調法
Research Abstract	Since nanostructure of nanogranular films are closely related with their physical properties, the quantitative characterization of the nanostructure is an important issue. In this study, the analysis method using small-angle neutron and X-ray scattering has been utilized. As a result, the size distribution and the dispersion states of the nanoparticles in the nanogranular films were quantitatively evaluated. In addition, the partitioning state of chemical composition between the nanoparticles and the matrix was quantitatively analyzed.