2011 Fiscal Year Final Research Report
Supply Current Testable Design of DACs in SoCs
| Project/Area Number |
22650009
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Single-year Grants |
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| Research Field |
Computer system/Network
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| Research Institution | The University of Tokushima |
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Principal Investigator |
HASHIZUME Masaki 徳島大学, 大学院・ソシオテクノサイエンス研究部, 教授 (40164777)
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| Project Period (FY) |
2010 – 2011
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| Keywords | SoC / DA変換器 / 電流テスト / 検査容易化設計 |
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| Research Abstract |
We developed a test method and its testable design methods for digital to analog convertors(DACs) implemented in SoCs(System-on-Chips) by measuring supply current. Also, we evaluated the testability of the test method and area overhead of the testable design methods. The results show us that a DAC in an SoC can be tested with a smaller number of test vectors by our supply current test method than a functional test one and the area overhead is not so large.
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