2011 Fiscal Year Final Research Report
Development of nanometer-resolution XAFS imaging method and structural evaluation of nanostructured materials
| Project/Area Number |
22651040
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Single-year Grants |
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| Research Field |
Nanomaterials/Nanobioscience
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| Research Institution | Osaka University |
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Principal Investigator |
TAKAHASHI Yukio 大阪大学, 大学院・工学研究科, 准教授 (00415217)
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| Project Period (FY) |
2010 – 2011
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| Keywords | コヒーレントX線光学 / X線顕微鏡 / X線構造解析 / 金属ナノ組織解析 |
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| Research Abstract |
In principle, X-ray absorption spectrum at the nanometer scale can be derived from the coherent X-ray diffraction imaging at the X-ray energies around the X-ray absorption edge of a specific element. In such an experiment, the dose per surface unit of X-rays illuminated onto a sample has to be determined. In this study, incident X-ray intensity monitoring system for coherent X-ray diffraction imaging was developed. By using this system, we determined the dose of X-rays illuminated onto a nanostructured sample and quantitatively derived the electron density distribution of the sample.
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