2011 Fiscal Year Final Research Report
Elucidation of conduction mechanism induced by edges of nanoribbon using multiple-probe scanning probe microscopes
| Project/Area Number |
22710108
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Single-year Grants |
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| Research Field |
Nanomaterials/Nanobioscience
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| Research Institution | National Institute for Materials Science |
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Principal Investigator |
KUBO Osamu 独立行政法人物質・材料研究機構, 国際ナノアーキテクトニクス研究拠点, MANA研究者 (70370301)
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| Project Period (FY) |
2010 – 2011
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| Keywords | ナノ計測 / 多探針 / 走査プローブ顕微鏡 / エッジ伝導 |
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| Research Abstract |
Electrical conduction property of graphene originated in local structures, such as the edge of ribbons, was verified using multiple-probe atomic force microscopes to promote the development of graphene devices. Increase of the resistivity by electron scattering at edges was confirmed in the ribbon of monolayer graphene exfoliated on a silicon dioxide film. Moreover, in a graphene formed on a vicinal silicon carbide surface by the sublimation method, which is expected as a template method to form large-area graphene, it turned out that the step part has more than ten times as much as conventional graphene, specifying the challenges for device application.
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