2011 Fiscal Year Final Research Report
Fabrication of controlled nanodefects for flux pinning studies of YBCO thin films
| Project/Area Number |
22760504
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Single-year Grants |
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| Research Field |
Physical properties of metals
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| Research Institution | National Institute of Advanced Industrial Science and Technology |
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Principal Investigator |
BAGARINAO Katherine 独立行政法人産業技術総合研究所, エネルギー技術研究部門, 研究員 (00357758)
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| Co-Investigator(Renkei-kenkyūsha) |
MATSUI Hiroaki 独立行政法人産業技術総合研究所, 先進製造プロセス研究部門, 研究員 (50431490)
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| Research Collaborator |
JUDITH Macmanus-dris ケンブリッジ大学, 材料冶金部門, 教授
STUART Wimbush インダストリアル, リサーチリミテッド, 主任研究員
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| Project Period (FY) |
2010 – 2011
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| Keywords | 高温超電導 / YBCO薄膜 / ナノポーラス陽極酸化アルミナ自立膜 / アルゴンイオンミリング / 欠陥 / 磁束ピン止め / 臨界電流密度 |
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| Research Abstract |
This study explores a top-to-bottom, straightforward method for introducing controlled nanoscale defects into already grown superconducting YBa_2Cu_3O_<7-δ>(YBCO) thin films. Nanoporous anodic aluminum oxide free-standing membranes having columnar pores～ 100 nm in diameter were utilized as etching masks in conjunction with conventional argon ion milling to introduce the nanodefects in the YBCO films. Significant enhancements in the critical current density and flux pinning properties of the YBCO thin films were achieved through the introduction of the nanodefects.
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