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2011 Fiscal Year Final Research Report

3D characterisation of microstructure around a crack tip by combining high-voltage electron microscopy and tomography.

Research Project

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Project/Area Number 22760544
Research Category

Grant-in-Aid for Young Scientists (B)

Allocation TypeSingle-year Grants
Research Field Structural/Functional materials
Research InstitutionKyushu University

Principal Investigator

TANAKA Masaki  九州大学, 工学研究院, 助教 (40452809)

Project Period (FY) 2010 – 2011
Keywords:強度・靭性・破壊
Research Abstract

Three-dimensional structures of crack tip dislocations were observed, using electron tomography with a high-voltage electron microscope. It was calculated that the effect of elastic stress field due to the dislocations on the local stress field around the crack tip. It was elucidated that crack opening stress is applied at a part of the crack front, which becomes a new dislocation source. It was also elucidated that a certain dislocation double cross-slips ahead of the crack tip to be a Frank-Read source.

  • Research Products

    (24 results)

All 2012 2011 2010 Other

All Journal Article (6 results) (of which Peer Reviewed: 6 results) Presentation (17 results) Remarks (1 results)

  • [Journal Article] Mechanism behind brittle-to-ductile transition understood by the interaction between a crack and dislocations2012

    • Author(s)
      K. Higashida, M. Tanaka
    • Journal Title

      ISIJ Int.

      Volume: 52 Pages: 704-709

    • Peer Reviewed
  • [Journal Article] The Early Stage of Dislocation Process around a Crack Tip Observed by HVEM-Tomography in Silicon Single Crystals2011

    • Author(s)
      M. Tanaka, S. Sadamatsu, H. Nakamura, K. Hgashida
    • Journal Title

      Mater. Trans.

      Volume: 52 Pages: 352-357

    • Peer Reviewed
  • [Journal Article] Sequential multiplication of dislocation sources along acrack front reveraled by high-voltage electron mocroscopy2011

    • Author(s)
      M. Tanaka, S. Sadamatsu, G. Liu, I. M. Robertson
    • Journal Title

      J. Mater. Res.

      Volume: 26 Pages: 508-513

    • Peer Reviewed
  • [Journal Article] Transition from a punched-out dislocation to a slip dislocation revealed by electron tomography2010

    • Author(s)
      M. Tanaka, G. S. Liu, T. Kishida, K. Higashida, I. M. Robertson
    • Journal Title

      Mater. Res.

      Volume: 25 Pages: 2292-2296

    • Peer Reviewed
  • [Journal Article] 3-D structures of crack-tipdislocations and their shielding effectrevealed by electron tomography2010

    • Author(s)
      M. Tanaka, M. Honda, S. Sadamatsu, K. Higashida
    • Journal Title

      J. Electron Microsc.

      Volume: 59 Pages: 55-60

    • Peer Reviewed
  • [Journal Article] Crack tip dislocations ovserved by TEM葉omography in silicon single crsytals2010

    • Author(s)
      S. Sadamatsu, M. Tanaka, M. Honda, K. Higashida
    • Journal Title

      ournal of Physics : Conference Series

      Pages: 012142

    • Peer Reviewed
  • [Presentation] HVEMトモグラフィーによる結晶格子欠陥の三次元構造解析2012

    • Author(s)
      田中將己
    • Organizer
      産業科学ナノテクノロジーセンター「第3回若手セミナー」
    • Place of Presentation
      大阪大学産業科学研究所
    • Year and Date
      2012-02-02
  • [Presentation] Crack tip dislocations observed by using HVEMtomography and multiplication mechanism of dislocation sources at a crack tip2012

    • Author(s)
      S. Sadamatsu, H. Nakamura, S. Inoue, M. Tanaka, K. Higashida
    • Organizer
      International Symposium on Role of Electron Microscopy in Industry Toward Genuine Collaboration Between Academia and Industry
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2012-01-19
  • [Presentation] 超高圧電子線トモグラフィーによるシリコン単結品中の亀裂先端転位群の三次元構造解析2011

    • Author(s)
      定松直,中村拓人,井上誠介,田中將己,東田賢二
    • Organizer
      日本顕微鏡学会第67回学術講演会
    • Place of Presentation
      福岡国際会議場
    • Year and Date
      20110500
  • [Presentation] Si単結晶における亀裂先端近傍のHVEM一トモグラフィ観察と転位源増殖機構2011

    • Author(s)
      井上誠介,中村拓人,定松直,田中將己,東田賢二
    • Organizer
      第53回日本顕微鏡学会九州支部学術講演会
    • Place of Presentation
      熊本大学
    • Year and Date
      2011-12-03
  • [Presentation] 超高圧電子顕微鏡による転位の観察と破壊靭性2011

    • Author(s)
      田中將己,東田賢二
    • Organizer
      日本鉄鋼協会高温プロセス部会若手フォーラム
    • Place of Presentation
      京都工芸繊維大学
    • Year and Date
      2011-11-11
  • [Presentation] Si単結晶における亀裂先端近傍のHVEM一トモグラフィ観察と転位発生プロセス2011

    • Author(s)
      井上誠介,中村拓人,定松直,田中將己,東田賢二
    • Organizer
      日本金属学会2011年秋期大会(第149回)
    • Place of Presentation
      沖縄コンベンションセンター
    • Year and Date
      2011-11-07
  • [Presentation] 超高圧電子顕微鏡を用いた転位群の三次元構造解析2011

    • Author(s)
      田中將己,東田賢二
    • Organizer
      日本顕微鏡学会第55回シンポジウム
    • Place of Presentation
      かがわ国際会議場
    • Year and Date
      2011-10-01
  • [Presentation] 超高圧電子線トモグラフィーによる亀裂先端転位群の三次元構造解析2011

    • Author(s)
      田中將己,東田賢二,定松直,中村拓人,井上誠介
    • Organizer
      日本顕微鏡学会第27回分析電子顕微鏡討論会
    • Place of Presentation
      幕張メッセ
    • Year and Date
      2011-09-07
  • [Presentation] Si単結晶における亀裂先端近傍のHVEM一トモグラフィ観察と転位源増殖メカニズム2011

    • Author(s)
      井上誠介,定松直,中村拓人,田中將己,東田賢二
    • Organizer
      平成23年度日本鉄鋼協会・日本金属学会・軽金属学会九州支部合同学術講演大会
    • Place of Presentation
      九州大学筑紫キャンパス
    • Year and Date
      2011-06-11
  • [Presentation] 電子線トモグラフィによる格子欠陥の三次元構造解析2011

    • Author(s)
      田中將己,定松直,中村拓人,井上誠介,東田賢二
    • Organizer
      日本顕微鏡学会第67回学術講演会
    • Place of Presentation
      福岡国際会議場
    • Year and Date
      2011-05-16
  • [Presentation] Crack Tip Dislocations and the Sequential Multiplication Process of Dislocation Sources along the Crack front Revealed by HVEMTomography2011

    • Author(s)
      M. Tanaka, S. Sadamatsu, G. S. Linu, H. Nakamura, K. Higashida, I. M. Robertson
    • Organizer
      140th TMS Annual Meeting & Exhibition
    • Place of Presentation
      San Diego, U. S. A.
    • Year and Date
      2011-03-02
  • [Presentation] Crack tip dislocations and their multiplication process revealed by HVEMtomography2011

    • Author(s)
      M. Tanaka, S. Sadamatsu, H. Nakamura, S. Inoue, K. Higashida
    • Organizer
      5th Meeting of the International Union of Microbeam Analysis Societies(IUMAS-V)
    • Year and Date
      2011-01-25
  • [Presentation] HVEMTomographyによる亀裂先端転位の初期発生プロセス及び増殖機構の解明2010

    • Author(s)
      中村拓人,定松直,井上誠介,田中將己,東田賢二
    • Organizer
      第52回日本顕微鏡学会九州支部学術講演会
    • Place of Presentation
      九州大学
    • Year and Date
      2010-12-04
  • [Presentation] Crack tip dislocations observed by electron tomography in single crystal silicon2010

    • Author(s)
      M. Tanaka, K. Higashida, S. Sadamatsu, H. Nakamura
    • Organizer
      31st Rise International Symposium on Materials Science : Challenges in materials science and possibilities in 3D and 4D characterization techniques
    • Place of Presentation
      Roskilde, Denmark
    • Year and Date
      2010-09-08
  • [Presentation] HVEMTomographyによる亀裂先端転位の発生・増殖機構解明2010

    • Author(s)
      中村拓人,定松直,本田雅幹,田中將己,東田賢二
    • Organizer
      平成22年度日本鉄鋼協会・日本金属学会・軽金属学会九州支部合同学術講演大会
    • Place of Presentation
      熊本大学
    • Year and Date
      2010-06-05
  • [Presentation] HVEM連続傾斜観察による亀裂先端転位源の増殖初期過程の研究¥2010

    • Author(s)
      田中將己,東田賢二,定松直,中村拓人,本田雅幹
    • Organizer
      日本顕微鏡学会第66回学術講演会
    • Place of Presentation
      名古屋国際会議場
    • Year and Date
      2010-05-25
  • [Presentation] 亀裂先端転位群のHVEM-Tomography解析と脆性一延性遷移温度挙動2010

    • Author(s)
      田中將己,東田賢二,本田雅幹,定松直
    • Organizer
      日本金属学会146回春季大会
    • Place of Presentation
      筑波大学
    • Year and Date
      2010-03-29
  • [Remarks]

    • URL

      http://www.kyudai洋se.org/

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Published: 2013-07-31  

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