2011 Fiscal Year Final Research Report
Development of new X-ray diffraction system for quantitative analysis of nanoscale defects in alloys
| Project/Area Number |
22760572
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Single-year Grants |
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| Research Field |
Metal making engineering
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| Research Institution | Tohoku University |
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Principal Investigator |
SATO Shigeo 東北大学, 金属材料研究所, 准教授 (40509056)
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| Project Period (FY) |
2010 – 2011
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| Keywords | X線回折 / 転位 / ラインプロファイル解析 / 双晶変形 / 時効析出 / 積層欠陥エネルギー |
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| Research Abstract |
Dislocations in plastic-deformed metals induce crystal strain, and domains developed by the arrays of the dislocations. When these crystal strain and domain structures are observed by X-ray diffraction, peculiar shapes depending on the diffraction order appear in the line profiles of the X-ray diffraction. In this study, we have developed an X-ray diffraction apparatus optimized for the line profile analysis and have analyzed microstructures of deformed metallic alloys such as iron-based and copper-based alloys by using a recent theory on the line profiles. We have successfully analyzed the correlation between dislocations and twinning induced plasticity, and the effects of dislocations on aging precipitation.
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