素子特性ばらつきの統計性に基づく微弱信号検出の線形性改善方法とその実現方式の探究

Products Report

• Project/Area Number: 23360155
• Research Category: Grant-in-Aid for Scientific Research (B)
• Allocation Type: Single-year Grants
• Section: 一般
• Research Field: Electron device/Electronic equipment
• Research Institution: Osaka University
• Principal Investigator: MATSUOKA TOSHIMASA 大阪大学, 工学(系)研究科(研究院), 准教授 (80324820)
• Project Period (FY): 2011-04-01 – 2014-03-31

Research Products

• [Journal Article] An offset distribution modification technique of stochastic flash ADC (2016)
  • Author(s): T. Asano, Y. Hirai, S. Tani, S. Yano, I. Jo, and T. Matsuoka
  • Journal Title: IEICE Electronics Express Volume: 13 Pages: 20160115
  • DOI: 10.1587/elex.13.20160115
  • Peer Reviewed
• [Journal Article] A Delta-Sigma ADC with Stochastic Quantization (2015)
  • Author(s): Y. Hirai, S. Yano, and T. Matsuoka
  • Journal Title: IPSJ Trans. System LSI Design Methodology Volume: 8 Pages: 123-130
  • DOI: 10.2197/ipsjtsldm.8.123
  • Peer Reviewed
• [Presentation] 並列型確率的A/D変換器の線形性向上手法に関する研究 (2015)
  • Author(s): 浅野智大, 平井雄作, 谷貞宏, 矢野新也, 趙益均, 松岡俊匡
  • Organizer: 平成27年電気関係学会関西連合大会
  • Place of Presentation: 摂南大学(大阪)
  • Year and Date: 2015-11-14 – 2015-11-15
• [Presentation] Extra Loop Delay Compensation for Hybrid Delta-Sigma Modulators (2014)
  • Author(s): Y. Hirai, K. Ohara, and T. Matsuoka
  • Organizer: IEEE International Symposium on Circuits and Systems
  • Place of Presentation: Melbourne(Australia)
  • Year and Date: 2014-06-01 – 2014-06-05
• [Patent(Industrial Property Rights)] Δ∑A/D変換装置 (2013)
  • Inventor(s): 松岡俊匡, 平井雄作
  • Industrial Property Rights Holder: 株式会社半導体理工学研究センター
  • Industrial Property Rights Type: 特許
  • Industrial Property Number: 特許第5758434号
  • Filing Date: 2013-05-08
  • Acquisition Date: 2015-06-12