2013 Fiscal Year Final Research Report
Quantitative analysis method using a total-electron-yield soft X-ray absorption spectroscopy
| Project/Area Number |
23360291
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| Research Category |
Grant-in-Aid for Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Inorganic materials/Physical properties
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| Research Institution | University of Hyogo |
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Principal Investigator |
MURAMATSU YASUJI 兵庫県立大学, 工学(系)研究科(研究院), 教授 (50343918)
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| Project Period (FY) |
2011-04-01 – 2014-03-31
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| Keywords | 量子ビーム / 解析評価 / 複合材料 / ナノ材料 / 放射光 / 分析技術 / 炭素材料 |
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| Research Abstract |
To develop the quantitative analysis technique of carbon materials using X-ray absorption spectroscopy (XAS), we have investigated the total electron yield (TEY) of sp2/sp3 carbon atoms and hetero-atoms in carbon materials. TEY ratios between sp2 and sp3 carbon atoms of various carbon materials were successfully determined. It was found that the TEY ratios strongly depend on the electric conductivity of the components. Calibration curve for quantitative analysis sp2 carbon atoms have successfully obtained from the pi*/sigma* peak height ratio in the CK region of TEY-XANES (X-ray absorption near-edge structure). TEY-XAS technique has been successfully applied to evaluate the roof tiles on the Himeji Castle and the engine oils. CK-TEY-XANES of graphitic materials can also be well simulated by the first principle method of CASTEP. It is therefore concluded that high-resolution XAS and/or XANES measurements would be a powerful tool to finely analyze carbon materials.
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