2013 Fiscal Year Final Research Report
Development of scanning phase measurement electron microscopy and its application to the potential observation in battery
| Project/Area Number |
23560031
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Multi-year Fund |
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| Section | 一般 |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | National Institute for Materials Science |
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Principal Investigator |
TAKEGUCHI Masaki 独立行政法人物質・材料研究機構, その他部局等, 電子顕微鏡ステーション・ステーション長 (30354327)
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| Project Period (FY) |
2011 – 2013
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| Keywords | 電子線ホログラフィー / 試料走査 / 位相計測 |
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| Research Abstract |
Stage-scanning phase measurement electron microscopy was developed. One-dimensional intensity profile along interference fringes was acquired on high-sensitive CCD camera by one time stage-scanning perpendicular to the fringe direction, followed by computer processing, resulting in the high-speed reconstruction of two-dimensional phase map. Likewise a fringe-scanning method, our technique enables to obtain a super-resolution phase map that spatial resolution is much smaller than the fringe spacing.
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Research Products
(9 results)
