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2013 Fiscal Year Final Research Report

Development of electric field sensor with optically modulated scatterer

Research Project

  • PDF
Project/Area Number 23560430
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeMulti-year Fund
Section一般
Research Field Electron device/Electronic equipment
Research InstitutionAkita Research and Development Center

Principal Investigator

KUROSAWA Takahiro  秋田県産業技術センター, その他部局等, 主任研究員 (60370243)

Project Period (FY) 2011 – 2013
Keywords電界計測 / 変調散乱 / 光変調 / 誘電体 / 高周波 / 電磁環境両立性
Research Abstract

Electric field measurement sensor based on the modulated scattering technique with optically modulated scatterer had developed. A semiconductor is used as the scatterer, and illumination of the semiconductor with photons of energy larger than the band-gap energy of the scatterer, the scattering cross section can modulate. Undoped germanium
is used as the optically modulated scatterer, time response of the detection is ten times faster than the previously developed dielectric scatterer system. This sensor obtained almost the same sensitivity of optical electric field sensor with metallic dipole elements in microwave region. This sensor can measure the direction, amplitude, and phase of electric field and can change the spatial resolution with varying the diameter of illuminated light.

  • Research Products

    (11 results)

All 2014 2013 2012 2011

All Journal Article (3 results) (of which Peer Reviewed: 3 results) Presentation (7 results) Patent(Industrial Property Rights) (1 results) (of which Overseas: 1 results)

  • [Journal Article] 光学的変調散乱素子を用いた高周波電界計測システム2014

    • Author(s)
      黒澤孝裕, 駒木根隆士
    • Journal Title

      電子情報通信学会誌B

      Volume: Vol. J97-B, No.3 Pages: 279-285

    • Peer Reviewed
  • [Journal Article] Electric Field Intensity of Cylindrical Dielectric Probe in Scattering Method for EM Field Measurement2012

    • Author(s)
      T. Komakine, T. Kurosawa, H. Inoue
    • Journal Title

      2012 Proceedings of SICE Annual Conference

      Volume: Vol. 12PR0001 Pages: 412-415

    • Peer Reviewed
  • [Journal Article] Electric Field Measurement by using Cylindrical Dielectric Scatterer2012

    • Author(s)
      T. Kurosawa, T. Komakine
    • Journal Title

      2012 Proceedings of SICE Annual Conference

      Volume: Vol. 12PR0001 Pages: 407-411

    • Peer Reviewed
  • [Presentation] マイクロストリップラインの近傍界を利用した光学的変調散乱素子の空間分解能評価2013

    • Author(s)
      黒澤孝裕
    • Organizer
      電子情報通信学会2013年ソサイエティ大会
    • Place of Presentation
      福岡工業大学
    • Year and Date
      2013-09-19
  • [Presentation] 光学的変調散乱素子を用いた電界センサのGHz帯における性能評価2013

    • Author(s)
      黒澤孝裕, 駒木根隆士
    • Organizer
      電子情報通信学会2013年総合大会
    • Place of Presentation
      岐阜大学
    • Year and Date
      2013-03-20
  • [Presentation] 光学的変調散乱素子を用いた高周波電界の計測2012

    • Author(s)
      黒澤孝裕, 駒木根隆士
    • Organizer
      電子情報通信学会2012年ソサイエティ大会
    • Place of Presentation
      富山大学
    • Year and Date
      2012-09-12
  • [Presentation] Electric Field Intensity of Cylindrical Dielectric Probe in Scattering Method for EM Field Measurement2012

    • Author(s)
      T. Komakine, T. Kurosawa, H. Inoue
    • Organizer
      2012 SICE Annual Conference
    • Place of Presentation
      Akita University
    • Year and Date
      2012-08-21
  • [Presentation] Electric Field Measurement by using Cylindrical Dielectric Scatterer2012

    • Author(s)
      T. Kurosawa, T. Komakine
    • Organizer
      2012 SICE Annual Conference
    • Place of Presentation
      Akita University
    • Year and Date
      2012-08-21
  • [Presentation] 電界分布計測による放射ノイズ源の可視化およびノイズ対策事例2012

    • Author(s)
      黒澤孝裕, 駒木根隆士
    • Organizer
      電子情報通信学会2012年総合大会
    • Place of Presentation
      岡山大学
    • Year and Date
      2012-03-23
  • [Presentation] 変調散乱手法による電界計測における干渉波を用いる変調法2011

    • Author(s)
      駒木根隆士, 黒澤孝裕, 宮永和明, 井上浩
    • Organizer
      電子情報通信学会2011年ソサイエティ大会
    • Place of Presentation
      北海道大学
    • Year and Date
      2011-09-13
  • [Patent(Industrial Property Rights)] 電磁界計測システム2012

    • Inventor(s)
      黒澤 孝裕
    • Industrial Property Rights Type
      特許
    • Industrial Property Number
      特許第4915565号
    • Acquisition Date
      2012-02-03
    • Overseas

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Published: 2015-07-16  

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