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2012 Fiscal Year Final Research Report

Mechanical fatigue test under liquid water toward bio-implantable MEMS structures with infinite lifetime

Research Project

  • PDF
Project/Area Number 23651137
Research Category

Grant-in-Aid for Challenging Exploratory Research

Allocation TypeMulti-year Fund
Research Field Microdevices/Nanodevices
Research InstitutionNagoya Institute of Technology

Principal Investigator

KAMIYA Shoji  名古屋工業大学, 工学研究科, 教授 (00204628)

Co-Investigator(Renkei-kenkyūsha) IZUMI Hayato  名古屋工業大学, 工学研究科, 助教 (90578337)
Project Period (FY) 2011 – 2012
Keywordsシリコン / MEMS / 長期信頼性 / 水 / 環境効果
Research Abstract

For those structures in medical MEMS (Microelectromechanical Systems) devices, especially the case of implantable devices, evaluation and improvement of mechanical reliability under humid environment including underwater become an issue of importance. In this study, static strength test and fatigue lifetime test were carried out under wet and humid environment aiming at the establishment of strength design scheme for those silicon MEMS structures in the presence of water molecular and restraint of degradation in living body. For this purpose, static/fatigue testing system coping with liquid water environment was developed. Using this experimental setup, the fracture behavior and mechanical properties of single crystal silicon thin film was investigated under liquid water. Crystal defects in silicon were also observed using EBIC (Electron Beam Induced Current) to survey the correlation between damage accumulation process and environment during the fatigue process. On the other hands, possible deterioration of mechanical properties with proton and hydrogen dissociated from the surface water molecular and trapped in silicon crystal was investigated by using nano-indentation technique. Based on these results, prediction models for the fatigue lifetime in various environments were also surveyed.

  • Research Products

    (13 results)

All 2013 2012 2011 Other

All Journal Article (2 results) (of which Peer Reviewed: 2 results) Presentation (10 results) Remarks (1 results)

  • [Journal Article] Effect of hydrogen on mechanical properties of single crystal surface2013

    • Author(s)
      H. Izumi, R. Mukaiyama, N. Shishido, S. Kamiya
    • Journal Title

      ASME InterPACK 2013

    • Peer Reviewed
  • [Journal Article] Electronic properties of dislocations introduced mechanically at room temperature on single crystal silicon surface2012

    • Author(s)
      M. Ogawa, S. Kamiya, H. Izumi, Y. Tokuda
    • Journal Title

      Physica B

      Volume: 407 Pages: 3034-4037

    • Peer Reviewed
  • [Presentation] Effect of hydrogen on mechanical properties of single crystal surface2013

    • Author(s)
      H. Izumi, R. Mukaiyama, N. Shishido, S. Kamiya
    • Organizer
      ASME International Technical Conference & Exhibition Packaging and Integration of Electronic and Photonic Microsystems (InterPACK 2013)
    • Place of Presentation
      Burlingame, USA
    • Year and Date
      2013-07-20
  • [Presentation] Direct observation of damage accumulation process inside silicon under mechanical fatigue loading2013

    • Author(s)
      S. Kamiya, R. Hirai, H. Izumi, N. Umehara, T. Tokoroyama
    • Organizer
      The 17th International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers 2013)
    • Place of Presentation
      Barcelona, Spain
    • Year and Date
      2013-06-20
  • [Presentation] 電子線誘起電流を用いた圧縮応力下におけるシリコンの疲労損傷の観察2013

    • Author(s)
      喜多俊文、神谷庄司、泉隼人、梅原徳次、野老山貴行、Ve Le Huy、小川将史
    • Organizer
      日本機械学会東海支部第62期総会講演会
    • Place of Presentation
      津市
    • Year and Date
      2013-03-19
  • [Presentation] 異なる疲労機構に基づくシリコン微小構造物の寿命評価モデルの比較2012

    • Author(s)
      平川創、泉隼人、生津資大、神谷庄司
    • Organizer
      日本機械学会M&M2012カンファレンス
    • Place of Presentation
      松山市
    • Year and Date
      2012-09-22
  • [Presentation] 単結晶シリコン薄膜の破壊挙動に及ぼす水と温度の影響の評価2012

    • Author(s)
      イスラムエムデイワヘドウル、泉隼人、小川将史、神谷庄司
    • Organizer
      日本機械学会2012年度年次大会
    • Place of Presentation
      金沢市
    • Year and Date
      2012-09-10
  • [Presentation] 単結晶シリコンの塑性特性における吸蔵水素の影響2012

    • Author(s)
      向山諒太、泉隼人、宍戸信之、神谷庄司
    • Organizer
      日本機械学会東海支部第62期総会講演会
    • Place of Presentation
      津市
    • Year and Date
      2012-03-19
  • [Presentation] 電子線誘起電流によるシリコンの疲労過程の微視観察2012

    • Author(s)
      平井隆太郎、神谷庄司、泉隼人、梅原徳次
    • Organizer
      日本機械学会年東海支部第61期総会講演会
    • Place of Presentation
      名古屋市
    • Year and Date
      2012-03-16
  • [Presentation] Fracture behavior of silicon thin film under liquid water2011

    • Author(s)
      H. Izumi, Y-C. Cheng, M. Ishikawa, S. Kamiya, M-T. Lin
    • Organizer
      International Conference on Electronics Materials and Packaging (EMAP)
    • Place of Presentation
      Kyoto
    • Year and Date
      2011-12-14
  • [Presentation] Evaluation and comparison of fracture behavior of silicon thin films under various environmental conditions2011

    • Author(s)
      Y-C. Cheng, H. Izumi, M. Ishikawa, S. Kamiya, M-T. Lin
    • Organizer
      The Japanese Society for Experimental Mechanics
    • Place of Presentation
      Nara
    • Year and Date
      2011-08-30
  • [Presentation] Electronic properties of dislocations introduced mechanically at room temperature on single crystal silicon surface2011

    • Author(s)
      M. Ogawa, S. Kamiya, H. Izumi, Y. Tokuda
    • Organizer
      26th International Conference on Defects in Semiconductor (ICDS)
    • Place of Presentation
      New Zealand
    • Year and Date
      2011-07-21
  • [Remarks]

    • URL

      http://microsystemreliability.web.nitech.ac.jp/

URL: 

Published: 2014-09-25  

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