Element-Selective Eecognition and Control of Metal-containing Organic Molecules using SR-based STM

2013 Fiscal Year Final Research Report

• Project/Area Number: 23656033
• Research Category: Grant-in-Aid for Challenging Exploratory Research
• Allocation Type: Multi-year Fund
• Research Field: Thin film/Surface and interfacial physical properties
• Research Institution: Osaka University
• Principal Investigator: SAITO Akira 大阪大学, 工学(系)研究科(研究院), 准教授 (90294024)
• Project Period (FY): 2011 – 2013
• Keywords: 走査型トンネル顕微鏡 / 放射光 / X線 / 元素分析 / 金属 / 有機分子 / 内殻励起 / 元素選択

Research Abstract

I attempted to extend "SR-STM" that is a method of elemental-analysis having an atomic resolution. SR-STM is to analyze the elemental composition of samples by giving the inner-shell information derived from the excitation to STM that observes only the shallow electronic level. In this project, SR-STM, which has long served only to semiconductors, was applied to new systems (metal, metal-containing organic molecules (phthalocyanine: Pc)). Although there were difficulties such as measurement instability and radiation damages, after improvement of light source, the element-contrast on metals has been observed for the first time. Finally, SR-STM was applied to the analysis of metal-Pc. The clear modification of the contrast was not observed across the metal-absorption-edge of the incident X-ray energy, whereas a specific radiation effect was newly observed for a metal-Pc, which gives hope to enable the element-specific analysis and/or reaction control of molecules in future.

Research Products

• [Journal Article] Verification of Thermal Effect produced by Irradiation for Scanning Tunneling Microscope combined with Brilliant Hard X-rays from Synchrotron Radiation (2012)
  • Author(s): A.Saito, Y .T anaka, Y .Kohmura, M. AkaiKasaya, T .Ishikawa, Y .Kuwahara, M. Aono
  • Journal Title: Curr . Appl. Phys Volume: 12 Pages: S52-S56
  • DOI: 10.1016/j.cap.2012.05.006
  • Peer Reviewed
• [Journal Article] Direct observation of X-ray induced Atomic Motion using STM combined with Synchrotron Radiation (2011)
  • Author(s): A. Saito, T . Tanaka, Y . Takagi, H. Hosokawa, H.Notsu, G .Ohzeki, Y .Tanaka, Y .Kohmura, M.Akai-Kasaya, T .Ishikawa, Y .Kuwahara, S.Kikuta, and M. Aono
  • Journal Title: J. Nanosc. Nanotechnol Volume: 11 Pages: 2873-2881
  • DOI: 10.1166/jnn.2011.3916
  • Peer Reviewed
• [Presentation] Pico-imaging of Element Contrast & X-ray-Induced Atomic Motion using SR-STM (2014)
  • Author(s): Akira Saito, Y . Furudate, Y . Kusui, M. AkaiKasaya, Y . T anaka, Y . Kohmura, T . Ishikawa, Y . Kuwahara and M. Aono
  • Organizer: NSS-8 Nanoscience Conference
  • Place of Presentation: Gleacher Center , Chicago, USA
  • Year and Date: 20140728-31
  • Invited
• [Presentation] Nanoscale elemental analysis and applications using STM combined with brilliant hard X-rays (2012)
  • Author(s): Akira SAITO
  • Organizer: TNT 2012
  • Place of Presentation: Escuela T ecnica Superior de Ingenieros Industriales, Madrid, Spain
  • Year and Date: 20120910-14
  • Invited
• [Book] "Direct observation of the X-rayinduced atomic motion", in "FUNDAMENT ALS OF PICOSCIENCE"(ed. K. Sattler) (2013)
  • Author(s): Akira SAITO
  • Total Pages: 585-592
  • Publisher: TAYLOR & FRANCIS Books
• [Remarks]
  • URL: http://www-ss.prec.eng.osaka-u.ac.jp/html/member/stuff/saito.html
• [Patent(Industrial Property Rights)] 走査型トンネル顕微鏡, 観察画像表示方法 (2012)
  • Inventor(s): 齋藤彰
  • Industrial Property Rights Holder: JST
  • Industrial Property Rights Type: 特許
  • Industrial Property Number: 特願2012-221324
  • Filing Date: 2012-10-03