2012 Fiscal Year Final Research Report
Demonstration of negative refraction in grapheme pn junction
Project/Area Number |
23656204
|
Research Category |
Grant-in-Aid for Challenging Exploratory Research
|
Allocation Type | Multi-year Fund |
Research Field |
Electronic materials/Electric materials
|
Research Institution | Hokkaido University |
Principal Investigator |
YOH Kanji 北海道大学, 量子集積エレクトロニクス研究センター, 教授 (60220539)
|
Project Period (FY) |
2011 – 2012
|
Keywords | 負の屈折 / クライン-トンネル / グラフェン / pn 接合 |
Research Abstract |
The overall electrical measurement results indicate negative refraction overlapped with some interference pattern. The interference pattern is thought to come from multiple reflection of the injected electron waves. As a result
|
Research Products
(19 results)