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2013 Fiscal Year Final Research Report

Equivalence Checking for System-Level Designs Having Different Input-Output Timings

Research Project

  • PDF
Project/Area Number 23700051
Research Category

Grant-in-Aid for Young Scientists (B)

Allocation TypeMulti-year Fund
Research Field Computer system/Network
Research InstitutionThe University of Tokyo

Principal Investigator

MATSUMOTO Takeshi  東京大学, 大規模集積システム設計教育研究センター, 助教 (40536140)

Project Period (FY) 2011 – 2012
Keywords等価性検証 / システムレベル設計 / 形式的検証
Research Abstract

In this work, design verification methods for embedded systems or VLSIs are studied. The purpose of design verification is to check whether a given design is correct or not and provide failing patterns if incorrect. We focus on equivalence checking of given two designs. Our target of verification is system-level design, which is a highly abstracted design level and has become widely applied recently. We proposed equivalence checking methods that can deal with different input/output timings between given two designs. In addition, we have developed a method to detect potentially equivalent internal variables in designs. The purposed of this work is to improve the ability of equivalence checking for system-level designs by those proposed methods.

  • Research Products

    (7 results)

All 2014 2013 2012

All Journal Article (1 results) (of which Peer Reviewed: 1 results) Presentation (6 results)

  • [Journal Article] SAT-based Automatic Rectification and Debugging of Combinational Circuits with LUT Insertions2014

    • Author(s)
      S. Jo, T. Matsumoto, M. Fujita
    • Journal Title

      IPSJ Transactions on System LSI Design Methodology

      Volume: Vol.7 Pages: 46-55

    • DOI

      10.2197/ipsjtsldm.7.46

    • Peer Reviewed
  • [Presentation] プログラム可能データパスとSMT ソルバーを利用した高位設計デバッグ手法2014

    • Author(s)
      松本剛史, 城怜史, 藤田昌宏
    • Organizer
      組込み技術とネットワークに関するワークショップETNET2014
    • Place of Presentation
      石垣, 沖縄
    • Year and Date
      2014-03-15
  • [Presentation] FOF : Functionally Observable Fault and its ATPG techniques2013

    • Author(s)
      M. Fujita, T. Matsumoto, S. Jo
    • Organizer
      IFIP/IEEE 21st International Conference on Very Large Scale Integration and System-on-Chip
    • Place of Presentation
      Istanbul, Turkey
    • Year and Date
      20131006-09
  • [Presentation] A debugging method for gate level circuit designs by introducing programmability2013

    • Author(s)
      K. Oshima, T. Matsumoto, M. Fujita
    • Organizer
      IFIP/IEEE 21st International Confer- ence on Very Large Scale Integration and System-on-Chip
    • Place of Presentation
      Istanbul, Turkey
    • Year and Date
      20131006-09
  • [Presentation] An Efficient Method to Localize Correct Bugs in High-Level Designs Using Counterexamples and Potential Dependence2012

    • Author(s)
      T. Matsumoto, S. Ono, M. Fujita
    • Organizer
      IEEE/IFIP 20th International Symposium on Very Large Scale Integration
    • Place of Presentation
      Santa Cruz, USA
    • Year and Date
      20121007-10
  • [Presentation] Automatic Assertion Extraction in Gate-Level Simulation Using GPGPUs2012

    • Author(s)
      S. Ono, T. Matsumoto, M. Fujita
    • Organizer
      IEEE 30th International Conference on Computer Design
    • Place of Presentation
      Montreal, Canada
    • Year and Date
      20120930-1003
  • [Presentation] 論理関数の充足不可能性に注目した論理回路デバッグ手法の検討2012

    • Author(s)
      李在城, 松本剛史, 藤田昌宏
    • Organizer
      組込み技術とネットワークに関するワークショップETNET2012
    • Place of Presentation
      松島, 宮城
    • Year and Date
      2012-03-02

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Published: 2015-06-25  

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