• Search Research Projects
  • Search Researchers
  • How to Use
  1. Back to project page

2012 Fiscal Year Final Research Report

Dependable system with backup mechanism based on reconfigurable architecture

Research Project

  • PDF
Project/Area Number 23700059
Research Category

Grant-in-Aid for Young Scientists (B)

Allocation TypeMulti-year Fund
Research Field Computer system/Network
Research InstitutionKochi University of Technology

Principal Investigator

MITSUYAMA Yukio  高知工科大学, 工学部, 講師 (80346189)

Project Period (FY) 2011 – 2012
Keywordsリコンフィギャラブルシステム / ディペンダブルコンピューティング
Research Abstract

This project developed a dependable system based on mixed-grained reconfigurable architecture, which can implement a dependable backup circuit of target applications dynamically. We also proposed a method for mitigating NBTI-induced performance degradation that exploits the recovery property by shifting random input through scan paths during standby time. In addition to this, we proposed a path delay testing method for predicting a timing error on a coarse-grained reconfigurable architecture. The proposed method can effectively identify the faulty component, which will cause a timing error, and a fault-free component for substitution.

  • Research Products

    (11 results)

All 2013 2012 2011 Other

All Journal Article (8 results) (of which Peer Reviewed: 8 results) Presentation (3 results)

  • [Journal Article] Pvt-Induced Timing Error Detection Through Replica Circuits and Time Redundancy in Reconfigurable Devices2013

    • Author(s)
      D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye
    • Journal Title

      IEICE Electronics Express (ELEX)

      Volume: vol. 10, no. 5

    • DOI

      DOI: 10.1587/elex.10.20130081

    • Peer Reviewed
  • [Journal Article] A Comparative Study on Static Voltage Over-Scaling and Dynamic Voltage Variation Tolerance with Replica Circuits and Time Redundancy in Reconfigurable Devices2012

    • Author(s)
      D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye
    • Journal Title

      Proc. of Int'l Conference on ReConFigurable Computing and FPGAs (ReConFig)

    • DOI

      DOI: 10.1109/ReConFig.2012.6416787

    • Peer Reviewed
  • [Journal Article] A Predictive Delay Fault Avoidance Scheme for Coarse-Grained Reconfigurable Architecture2012

    • Author(s)
      T. Kameda, H. Konoura, D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye
    • Journal Title

      Proc. of Int'l Conference on Field Programmable Logic and Applications (FPL)

    • DOI

      DOI: 10.1109/FPL.2012.6339220

    • Peer Reviewed
  • [Journal Article] Stress Probability Computation for Estimating NBTI-Induced Delay Degradation2011

    • Author(s)
      H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye
    • Journal Title

      IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences

      Volume: vol.E94-A, no.12 Pages: 2545-2553

    • DOI

      DOI: 10.1109/FPL.2011.108

    • Peer Reviewed
  • [Journal Article] NBTI Mitigation by Giving Random Scan-In Vectors during Standby Mode2011

    • Author(s)
      T. Kameda, H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye
    • Journal Title

      Proc. of Int'l Workshop on Power And Timing Modeling, Optimization and Simulation (PATMOS)

      Pages: 152-161

    • DOI

      DOI: 10.1007/978-3-642-24154-3_16

    • Peer Reviewed
  • [Journal Article] Implications of Reliability Enhancement Achieved by Fault Avoidance on Dynamically Reconfigurable Architecture2011

    • Author(s)
      H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye
    • Journal Title

      Proc. of Int'l Conference on Field Programmable Logic and Applications (FPL)

      Pages: 189-194

    • DOI

      DOI: 10.1109/FPL.2011.108

    • Peer Reviewed
  • [Journal Article] Implementing Flexible Reliability in a Coarse Grained Reconfigurable Architecture

    • Author(s)
      D. Alnajjar, H. Konoura, Y. Ko, Y. Mitsuyama, M. Hashimoto, and T. Onoye
    • Journal Title

      IEEE Trans. on VLSI Systems

      Volume: (in press)

    • Peer Reviewed
  • [Journal Article] Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices

    • Author(s)
      T. Kameda, H. Konoura, D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye
    • Journal Title

      IEICE Trans. on Information and Systems

      Volume: (in press)

    • Peer Reviewed
  • [Presentation] 動的部分再構成による故障回避に関する一考察2012

    • Author(s)
      郡浦宏明, 今川隆司, 密山幸男, 橋本昌宜, 尾上孝雄
    • Organizer
      電子情報通信学会技術研究報告
    • Place of Presentation
      福岡市
    • Year and Date
      20121100
  • [Presentation] スキャンパスを用いたNBTI 劣化抑制に関する研究2011

    • Author(s)
      亀田敏広, 郡浦宏明, 密山幸男, 橋本昌宜, 尾上孝雄
    • Organizer
      情報処理学会DA シンポジウム
    • Place of Presentation
      下呂市
    • Year and Date
      20110800
  • [Presentation] 動的再構成可能アーキテクチャによる故障回避機構の定量的信頼性評価2011

    • Author(s)
      郡浦宏明, 密山幸男, 橋本昌宜, 尾上孝雄
    • Organizer
      電子情報通信学会技術研究報告
    • Place of Presentation
      札幌市
    • Year and Date
      20110500

URL: 

Published: 2014-08-29   Modified: 2014-10-07  

Information User Guide FAQ News Terms of Use Attribution of KAKENHI

Powered by NII kakenhi