2012 Fiscal Year Final Research Report
Conductance measurement at nanoscale using face to face dual tip Scanning Tunneling Microscopy
| Project/Area Number |
23760032
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Multi-year Fund |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | Kyoto University |
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Principal Investigator |
KUROKAWA Shu 京都大学, 大学院・工学研究科, 准教授 (90303859)
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| Project Period (FY) |
2011 – 2012
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| Keywords | 走査プローブ顕微鏡 |
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| Research Abstract |
Using very sharp tip of Scanning Tunneling Microscopy, one can measure the electric conductance of small objects. However, in conventional set up, we can’t measure the conductance of nanoscale-objects, because of “geometric restriction”. In this investigation, we have demonstrated that such measurement is possible by using very flat or very thin samples.
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