Analysis and fabrication of nanoscale contacts and interfaces by scanning probe microscopy technology

2015 Fiscal Year Final Research Report

• Project/Area Number: 24246014
• Research Category: Grant-in-Aid for Scientific Research (A)
• Allocation Type: Single-year Grants
• Section: 一般
• Research Field: Thin film/Surface and interfacial physical properties
• Research Institution: Japan Advanced Institute of Science and Technology
• Principal Investigator: Tomitori Masahiko 北陸先端科学技術大学院大学, マテリアルサイエンス研究科, 教授 (10188790)
• Co-Investigator(Kenkyū-buntansha): TAKAMURA YUZURU 北陸先端科学技術大学院大学, マテリアルサイエンス研究科, 教授 (20290877) ; SASAHARA AKIRA 北陸先端科学技術大学院大学, マテリアルサイエンス研究科, 助教 (40321905)
• Project Period (FY): 2012-04-01 – 2016-03-31
• Keywords: 表面・界面物性 / 走査プローブ顕微鏡 / ナノコンタクト / 物性実験

Outline of Final Research Achievements

We extended the performance of scanning probe microscopy (SPM) techniques developed with our bases, such as the combined instrument of SPM and scanning electron microscopy(SEM), and bias non-contact atomic force microscopy (nc-AFM). We carried out the followings: fabrication of SPM probes of WOx nanorods on W tips by bringing the tips closer to the source of WO3 powers supported on a W filament heated by use of the SEM-SPM setup; development of retuned two-prong quartz tuning forks for a high sensitivity force sensor; measurements of energy dissipation through the interaction between a tip and a sample; nanoscale electric measurements such as electric capacitance, contact potential difference, and charge transfer using a charge sensitive amplifier installed in the nc-AFM setup. We contributed to a scientific and technological field of surfaces and interfaces on atomic scale by applying them to π-conjugated molecules, and to the films and surfaces of oxides.

Free Research Field

表面科学、ナノプローブテクノロジー